Sensor subsystems for non-contact voltage measurement devices

Patent metadata

Field	Value
Publication number	US-10605832-B2
Application number	US-201715695998-A
Country	US
Kind code	B2
Filing date	Sep 5, 2017
Priority date	Nov 11, 2016
Publication date	Mar 31, 2020
Grant date	Mar 31, 2020

Abstract

Systems and methods for measuring alternating current (AC) voltage of an insulated conductor are provided, without requiring a galvanic connection between the conductor and a test electrode. A non-galvanic contact voltage measurement device includes a conductive sensor, an internal ground guard, and a reference shield. A reference voltage source is electrically coupleable between the guard and the reference shield to generate an AC reference voltage which causes a reference current to pass through the conductive sensor. Sensor subsystems may be arranged in layers (e.g., stacked layers, nested layers, or components) of conductors and insulators. The sensor subsystems may be packaged as formed sheets, flexible circuits, integrated circuit (IC) chips, nested components, printed circuit boards (PCBs), etc. The sensor subsystems may be electrically coupled to suitable processing or control circuitry of a non-contact voltage measurement device to allow for measurement of voltages in insulated conductors.

First claim

The invention claimed is:

1. A sensor subsystem for a voltage measurement device operative to measure alternating current (AC) voltage in an insulated conductor, the sensor subsystem comprising:
a conductive sensor disposed within a housing of the voltage measurement device, the conductive sensor selectively positionable proximate the insulated conductor without galvanically contacting the conductor, wherein the conductive sensor capacitively couples with the insulated conductor;
a conductive internal ground guard disposed within the housing, wherein the internal ground guard at least partially surrounds the conductive sensor and is galvanically isolated from the conductive sensor, the internal ground guard sized and dimensioned to shield the conductive sensor from stray currents;
a conductive reference shield which surrounds at least a portion of the housing and is galvanically insulated from the internal ground guard, the conductive reference shield sized and dimensioned to reduce currents between the internal ground guard and an external ground; and
a common mode reference voltage source which, in operation, generates an alternating current (AC) reference voltage having a reference frequency, wherein the conductive internal ground guard and the conductive reference shield are electrically coupled to the common mode reference voltage source.

2. The sensor subsystem of claim 1 , further comprising signal conditioning circuitry for conditioning a signal received from the conductive sensor, the conductive reference shield being electrically coupled to an input of the signal conditioning circuitry.

3. The sensor subsystem of claim 1 wherein the conductive sensor and the conductive internal ground guard are disposed in layers of a multi-layered circuit.

4. The sensor subsystem of claim 1 wherein the conductive sensor and the conductive internal ground guard are disposed in a single layer of a multi-layered circuit.

5. The sensor subsystem of claim 1 wherein the conductive sensor, the conductive internal ground guard, and the conductive reference shield are disposed in layers of a multi-layered flexible circuit.

6. The sensor subsystem of claim 1 wherein at least one of the conductive sensor, the conductive internal ground, or the conductive reference shield comprises conductive tape, a conductive sheet, a conductive plate, or a cured liquid.

7. The sensor subsystem of claim 1 , further comprising:
an insulation layer disposed between the conductive sensor and the conductive internal ground guard.

8. The sensor subsystem of claim 7 wherein the insulation layer comprises plastic, silicon, or ceramic.

9. The sensor subsystem of claim 1 , further comprising a high permittivity material disposed above the conductive sensor.

10. The sensor subsystem of claim 1 wherein the conductive reference shield is molded into at least a portion of the housing of the voltage measurement device.

11. The sensor subsystem of claim 1 wherein the conductive sensor and the internal ground guard are arranged as one of stacked layers or nested components.

12. The sensor subsystem of claim 1 wherein at least a portion of the sensor subsystem comprises formed sheets, a flexible circuit, an integrated circuit chip, nested components, or a printed circuit board.

13. The sensor subsystem of claim 1 , further comprising at least one of a non-contact current sensor, an infrared sensor, an indicator, or an illumination source.

14. A sensor subsystem for a voltage measurement device operative to measure alternating current (AC) voltage in an insulated conductor, the sensor subsystem comprising:
a multi-layered flexible circuit, comprising:
a sensor and guard layer comprising a conductive sensor portion and a guard portion galvanically isolated from the conductive sensor portion; and

a reference shield layer that is galvanically isolated from the sensor and guard layer; and
a common mode reference voltage source which, in operation, generates an alternating current (AC) reference voltage having a reference frequency, wherein the guard portion and the reference shield layer are electrically coupleable to the common mode reference voltage source.

15. The sensor subsystem of claim 14 wherein the multi-layered flexible circuit is foldable into a custom shape and, when in the custom shape, the multi-layered flexible circuit is positionable within a housing of a voltage measurement device.

16. The sensor subsystem of claim 14 , further comprising at least one of a non-contact current sensor, an infrared sensor, an indicator, or an illumination source coupled to the multi-layered flexible circuit.

17. The sensor subsystem of claim 14 , further comprising at least one of a Rogowski coil, a fluxgate sensor, or a Hall Effect sensor coupled to the multi-layered flexible circuit.

18. The sensor subsystem of claim 14 , further comprising:
a shielding layer disposed above the sensor and guard layer, the shielding layer having an opening therein that is aligned with the conductive sensor portion, wherein the shielding layer is galvanically isolated from any conductive components of the sensor subsystem.

19. A sensor subsystem for a voltage measurement device operative to measure alternating current (AC) voltage in an insulated conductor, the sensor subsystem comprising:
a housing comprising an opening that defines a first interior volume;
a guard insulator disposed within the first interior volume of the housing, the guard insulator comprising an opening that defines a second interior volume;
a conductive guard disposed within the second interior volume of the guard insulator, the conductive guard comprising an opening that defines a third interior volume;
a sensor insulator disposed within the third interior volume of the conductive guard, the sensor insulator comprising an opening that defines a fourth interior volume;
a conductive sensor disposed within the fourth interior volume of the sensor insulator;
a reference shield molded into the housing; and
a common mode reference voltage source which, in operation, generates an alternating current (AC) reference voltage having a reference frequency, wherein the conductive guard and the reference shield are electrically coupled to the common mode reference voltage source.

20. The sensor subsystem of claim 19 , further comprising a printed circuit assembly electrically coupled to the conductive guard and the conductive sensor.

Assignees

• Fluke Corp

Inventors

• Epperson David L
• Steuer Ronald
• Worones Jeffrey
• Hunter Patrick Scott
• Rodriguez Ricardo

Classifications

• G01R15/16 Primary

  using capacitive devices · CPC title

• G01R15/142

  Arrangements for simultaneous measurements of several parameters employing techniques covered by groups G01R15/14 - G01R15/26 · CPC title

• G01R19/28

  adapted for measuring in circuits having distributed constants · CPC title

• G01R15/20

  using galvano-magnetic devices, e.g. Hall-effect devices {, i.e. measuring a magnetic field via the interaction between a current and a magnetic field, e.g. magneto resistive or Hall effect devices} · CPC title

• G01R19/2503 Primary

  for measuring voltage only, e.g. digital volt meters (DVM's) (G01R19/2506 - G01R19/257 take precedence) · CPC title