Thermography process for converting signal to temperature in a thermal imaging system

Patent metadata

Field	Value
Publication number	US-10605668-B2
Application number	US-201715843667-A
Country	US
Kind code	B2
Filing date	Dec 15, 2017
Priority date	Dec 20, 2016
Publication date	Mar 31, 2020
Grant date	Mar 31, 2020

Abstract

A thermography process for thermal imaging systems produced in quantity, including an imaging sensor and an ambient temperature sensor, that includes operations at three different places in the manufacture and actual use of the system. A temperature calibration may be performed on all units of a given design at a small number of controlled scene temperatures at one ambient temperature to produce a function that relates sensor signal to scene temperature. The function is determined for each individual unit and may be unique for each unit. Selected calibrated units may be subjected to a qualification test where they are exposed to larger number of controlled scene temperatures at a plurality of controlled ambient temperatures and the errors between the calibration derived function and the observed results and/or the actual scene temperatures at the various scene/ambient temperature combinations may be derived and put into a table that is loaded into all production units. In actual use of the imaging system, for any given actual observed signal and temperature sensor values, the corresponding scene temperature and/or error may be derived from the table and used to modify the temperature value from the calibration function.

First claim

What is claimed is:

1. A process for converting signal to temperature for a set of production thermal imaging systems, each thermal imaging system of the set of thermal imaging systems including an array of photodetectors each configured to output a signal S x,y corresponding to a temperature of a portion of an imaged scene, and an ambient temperature sensor, the process comprising:
performing a scene temperature calibration on all thermal imaging systems of the set of thermal imaging systems, the calibration comprising:
exposing each thermal imaging system, at a calibration ambient temperature, to n known temperature scenes, each known temperature scene having a unique scene temperature T si , from T s1 to T sn , wherein n is at least 2;
developing, based on the signal S x,y , a unit-specific function F(S x,y ) i =T si that fits the signal to the known scene temperatures for each thermal imaging system; and
storing an ambient temperature sensor value T sen corresponding to the calibration ambient temperature;

performing a scene temperature/ambient temperature qualification test on a subset of previously calibrated thermal imaging systems of the set of thermal imaging systems, the qualification test comprising:
exposing each thermal imaging system of the subset to a plurality of known ambient temperatures and, at each ambient temperature, exposing the unit to a plurality of known temperature scenes at different known scene temperatures, obtaining a function F(S x,y ) for each combination of ambient temperature and scene temperature;
correlating the ambient temperature sensor output to the known ambient temperatures; and
creating a two-dimensional table of at least one of an error ΔT between F(S x,y ) and the known scene temperature for each known scene at each ambient temperature, or a known scene temperature T act ; and

for individual thermal imaging systems of the set of thermal imaging systems, adjusting F(S x,y ) during subsequent operational use by extracting at least one of actual scene temperature or error information from the two-dimensional table based on S x,y and the ambient temperature sensor value.

2. The process of claim 1 , wherein the known temperature scenes for both the calibration and qualification are blackbodies set at predetermined temperatures.

3. The process of claim 1 , wherein the plurality of ambient temperatures is produced by placing the thermal imaging system in a temperature chamber and changing a chamber temperature of the temperature chamber in a predetermined manner.

4. The process of claim 1 , wherein F(S x,y )=G(S x,y )+O, wherein G is a gain term and O is an offset term.

5. The process of claim 1 , wherein the calibration ambient temperature is room temperature, and the temperature sensor value is T sen .

6. The process of claim 5 , wherein the correlation to the chamber temperatures is developed for ΔTherm=T sens −T sensrt .

7. The process of claim 6 , wherein the temperature associated with the photodetector signal during operation is at least one of T x,y =G(S x,y )+O+ΔT or T x x,y =T actx,y .

8. The process of claim 6 , wherein a first axis of the two-dimensional table comprises the values of F(S x,y ) corresponding to each blackbody temperature and wherein a second axis of the two-dimensional table comprises ΔTherm values corresponding to each chamber temperature.

9. The process of claim 8 , wherein the table developed is stored as a look-up table for each thermal imaging system of the set of thermal imaging systems, and wherein inputs to the look-up table are actual signal F(S x,y ) and ΔTherm.

10. The process of claim 9 , wherein, during operational use, if any given F(S x,y ) and ΔTherm are not exactly equal to the table axis values, the error value ΔT used is determined by at least one of a 3 step linear interpolation, a bi-linear interpretation, or a bi-cubic interpolation of the table error values.

Assignees

• Seek Thermal Inc

Inventors

• Williams Ross E
• Parrish William
• Wolfe Jason

Classifications

• G01J5/20

  using resistors, thermistors or semiconductors sensitive to radiation, e.g. photoconductive devices · CPC title

• G01J2005/0077

  Imaging · CPC title

• G01J5/10

  using electric radiation detectors · CPC title

• G01J5/0834 Primary

  Physics · mapped topic

• G01J2005/0081

  Physics · mapped topic