Method for forming pattern, method for manufacturing ornament, method for manufacturing belt for wristwatch, method for manufacturing structure for mounting wiring, method for manufacturing semiconductor device, and method for manufacturing printed circuit board

US10604859B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-10604859-B2
Application numberUS-201715696732-A
CountryUS
Kind codeB2
Filing dateSep 6, 2017
Priority dateSep 27, 2016
Publication dateMar 31, 2020
Grant dateMar 31, 2020

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

A method for forming a pattern in which a plating layer is selectively formed on a base material using a resin layer as a mask, includes resin layer-forming in which the resin layer is formed on the base material; and patterning in which the resin layer is selectively removed, in which in the patterning, a part of the resin layer is sublimed by heating to be removed.

First claim

Opening claim text (preview).

What is claimed is: 1. A method for forming a pattern in which a plating layer is selectively formed on a base material using a resin layer as a mask, the method comprising: forming a primer layer on the base material; forming the resin layer on the primer layer; patterning the resin layer by selectively removing a part by of the resin layer, wherein the part of the resin layer is sublimed by heating to be removed; and inspecting the patterned resin layer based on a fluorescence of the patterned resin layer, wherein the primer layer includes a π bond (pi bond); wherein the resin layer comprises at least one of anthracene or naphthacene; and wherein the primer layer comprises at least one of phenyltrimethoxysilane or vinyltrimethoxysilane. 2. The method for forming a pattern according to claim 1 , further comprising partially heating the resin layer with an infrared ray to pattern the resin layer. 3. The method for forming a pattern according to claim 2 , wherein the infrared ray is a laser beam. 4. The method for forming a pattern according to claim 1 , wherein the resin layer is configured to fluoresce when irradiated with an inspection irradiation. 5. The method for forming a pattern according to claim 4 , wherein the resin layer is an acene having a molecular weight of 150 or more and 300 or less. 6. The method for forming a pattern according to claim 5 , further comprising: wherein the primer layer having a π bond enhances an adhesion between the base material and the resin layer on the base material, before forming the resin layer. 7. The method for forming a pattern according to claim 1 , further comprising: plating a part of the base material from which the resin has been removed to form the plating layer, after the resin layer. 8. A method for manufacturing an ornament to which the method for forming a pattern according to claim 1 is applied. 9. A method for manufacturing an ornament to which the method for forming a pattern according to claim 2 is applied. 10. A method for manufacturing an ornament to which the method for forming a pattern according to claim 3 is applied. 11. A method for manufacturing an ornament to which the method for forming a pattern according to claim 4 is applied. 12. A method for manufacturing an ornament to which the method for forming a pattern according to claim 5 is applied. 13. A method for manufacturing an ornament to which the method for forming a pattern according to claim 6 is applied. 14. A method for manufacturing an ornament to which the method for forming a pattern according to claim 7 is applied. 15. A method for manufacturing a belt for a wristwatch to which the method for forming a pattern according to claim 1 is applied. 16. A method for manufacturing a structure for mounting wiring to which the method for forming a pattern according to claim 1 is applied. 17. A method for manufacturing a semiconductor device to which the method for forming a pattern according to claim 1 is applied. 18. A method for manufacturing a printed circuit board to which the method for forming a pattern according to claim 1 is applied.

Assignees

Inventors

Classifications

  • C25D5/022Primary

    using masking means · CPC title

  • Arrangements for fixing to a bracelet (building watches into bracelets (montre marquise) G04B37/12; arrangements for hanging pocket- or other watches on chains G04B37/1446) · CPC title

  • bonding and adhesion · CPC title

  • wet etching · CPC title

  • After-treatment of electroplated surfaces · CPC title

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Frequently asked questions

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What does patent US10604859B2 cover?
A method for forming a pattern in which a plating layer is selectively formed on a base material using a resin layer as a mask, includes resin layer-forming in which the resin layer is formed on the base material; and patterning in which the resin layer is selectively removed, in which in the patterning, a part of the resin layer is sublimed by heating to be removed.
Who is the assignee on this patent?
Seiko Epson Corp
What technology area does this patent fall under?
Primary CPC classification C25D5/022. Mapped technology areas include Chemistry & Metallurgy.
When was this patent published?
Publication date Tue Mar 31 2020 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 1 related publication on this page (citations in our corpus or others sharing the same primary CPC).