Method for in-situ markers for thermal mechanical structural health monitoring

US10598556B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-10598556-B2
Application numberUS-201415112127-A
CountryUS
Kind codeB2
Filing dateAug 8, 2014
Priority dateAug 21, 2013
Publication dateMar 24, 2020
Grant dateMar 24, 2020

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

A method of monitoring the residual stress in surface and near surface regions of a component includes identifying predetermined locations on the surface of a component that are expected to experience high stress during normal operating conditions of the component. Marker particles are introduced into the component during additive manufacture of the component at the predetermined locations. Then, the residual stress of the component is measured at a location corresponding with the marker material using x-ray techniques.

First claim

Opening claim text (preview).

The invention claimed is: 1. A method of monitoring residual stress of a component of a base alloy formed by additive manufacturing, the method comprising: identifying a location of the component that experiences stress during operating conditions of the component; introducing during additive manufacturing marker particles in surface and near surface regions to create a marker associated with the identified high stress location of the component; and measuring a residual stress of the component at the marker. 2. The method of claim 1 , further comprising measuring the residual stress at the marker with x-ray diffraction. 3. The method of claim 2 , wherein the x-ray diffraction is used to measure an interplanar spacing of the marker in at least one of the surface and near surface pre-determined locations. 4. The method of claim 3 , wherein a local strain at the marker is determined from the measured interplanar spacing. 5. The method of claim 3 , wherein the x-ray diffraction measurement is performed with an x-ray diffractometer. 6. The method of claim 3 , further comprising performing the x-ray diffraction with x-ray beams of about 1 mm to 2 mm in diameter focused on a surface of the component. 7. The method of claim 1 , wherein the additive manufacturing comprises direct metal deposition, direct laser melting or direct laser deposition. 8. The method of claim 1 , wherein the marker is insoluble in the base alloy. 9. The method of claim 1 wherein the base alloy comprises a titanium alloy and the marker comprises cerium.

Assignees

Inventors

Classifications

  • Titanium or alloys thereof · CPC title

  • Arrangements for testing or measuring (for measuring vibrations G01H) · CPC title

  • of turbine blades · CPC title

  • by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials · CPC title

  • Processes of additive manufacturing · CPC title

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What does patent US10598556B2 cover?
A method of monitoring the residual stress in surface and near surface regions of a component includes identifying predetermined locations on the surface of a component that are expected to experience high stress during normal operating conditions of the component. Marker particles are introduced into the component during additive manufacture of the component at the predetermined locations. The…
Who is the assignee on this patent?
United Technologies Corp
What technology area does this patent fall under?
Primary CPC classification G01L1/25. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Mar 24 2020 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 1 related publication on this page (citations in our corpus or others sharing the same primary CPC).