Measurement apparatus of vectorial optical fields

US10587345B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-10587345-B2
Application numberUS-201916396618-A
CountryUS
Kind codeB2
Filing dateApr 26, 2019
Priority dateJun 26, 2018
Publication dateMar 10, 2020
Grant dateMar 10, 2020

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Abstract

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An apparatus measures the transverse profile of vectorial optical field beams, including at least the directional intensity complex amplitude, the phase and the polarization spatial profile. The apparatus contains a polarization separation module, a weak perturbation module, and a detection module. Characterizing the transverse profile of vector fields provides an optical metrology tool for both fundamental studies of vectorial optical fields and a wide spectrum of applications, including microscopy, surveillance, imaging, communication, material processing, and laser trapping.

First claim

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What is claimed is: 1. A computerized method of transmitting information via an optical vector beam, the method comprising: encoding the data onto a primary optical beam to form the optical vector beam, wherein the encoding comprises differential spatial phase shift keying (DSPSK) in which the data is represented by physical changes in the optical vector beam across spatially separated portions of the optical vector beam; decoding the data by identifying respective directional complex intensity amplitudes, polarization states and respective phase measurements for the spatially separated portions of the optical vector beam by: (i) selecting, from the spatially separated portions of the optical vector beam, at least two orthogonally polarized portions of the optical vector beam; and (ii) identifying the data in the optical vector beam by tracking differences between the respective directional intensity complex amplitudes for the at least two orthogonally polarized of the optical vector beam. 2. The computerized method of claim 1 , wherein encoding the data onto the primary optical beam comprises: directing the primary optical beam to at least one of a first spatial light modulator, a second spatial light modulator, and a third spatial light modulator. 3. The computerized method of claim 2 , wherein encoding the data onto the primary optical beam comprises encoding with a single selected input mode having a selected directional intensity complex amplitude. 4. The computerized method of claim 3 , wherein encoding the data onto the primary optical beam comprises encoding with a multi-dimensional input mode.

Assignees

Inventors

Classifications

  • H04B10/70Primary

    Photonic quantum communication · CPC title

  • H04B10/556Primary

    Digital modulation, e.g. differential phase shift keying [DPSK] or frequency shift keying [FSK] · CPC title

  • Details of coding or modulation · CPC title

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What does patent US10587345B2 cover?
An apparatus measures the transverse profile of vectorial optical field beams, including at least the directional intensity complex amplitude, the phase and the polarization spatial profile. The apparatus contains a polarization separation module, a weak perturbation module, and a detection module. Characterizing the transverse profile of vector fields provides an optical metrology tool for bot…
Who is the assignee on this patent?
Univ South Florida
What technology area does this patent fall under?
Primary CPC classification H04B10/70. Mapped technology areas include Electricity.
When was this patent published?
Publication date Tue Mar 10 2020 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 6 related publications on this page (citations in our corpus or others sharing the same primary CPC).