Wide range compensation of low frequency response passive probe

Patent metadata

Field	Value
Publication number	US-10585118-B2
Application number	US-201715721604-A
Country	US
Kind code	B2
Filing date	Sep 29, 2017
Priority date	May 10, 2017
Publication date	Mar 10, 2020
Grant date	Mar 10, 2020

Abstract

Disclosed is a test and measurement probe. The test and measurement probe includes a probe tip to connect to a Device Under Test (DUT). The probe tip includes a Resistor Capacitor (RC) probe tip network coupled to a test signal channel. The test and measurement probe also includes at least one variable resistor coupled to the test signal channel. The at least one variable resistor is set to provide an adjustable resistance to compensate for frequency variation in the RC probe tip network.

First claim

We claim:

1. A test and measurement probe comprising:
a probe tip to connect to a Device Under Test (DUT), the probe tip including a Resistor Capacitor (RC) probe tip network coupled to a test signal channel; and
at least one variable resistor coupled to the test signal channel, the at least one variable resistor to provide an adjustable resistance to compensate for frequency response variation in the RC probe tip network, wherein the at least one variable resistor is included in an RC compensation network, and the RC compensation network accomplishes frequency compensation independent of a variable capacitor.

2. The test and measurement probe of claim 1 , wherein the RC compensation network is included in a compensation box coupled to the probe tip.

3. The test and measurement probe of claim 1 , wherein the test signal channel is a differential channel including a reference channel and a signal channel, and the at least one variable resistor includes a reference channel variable resistor coupled to the reference channel and a signal channel variable resistor coupled to the signal channel.

4. The test and measurement probe of claim 1 , wherein the at least one variable resistor includes at least two variable resistors, one variable resistor having a coarser adjustment than another variable resistor.

5. The test and measurement probe of claim 1 , wherein the at least one variable resistor includes at least one variable resistor in the RC probe tip network and at least one variable resistor in a compensation box.

6. The test and measurement probe of claim 1 , wherein the at least one variable resistor is a digital potentiometer.

7. The test and measurement probe of claim 1 , wherein the at least one variable resistor is a mechanical resistor.

8. The test and measurement probe of claim 1 , further comprising a memory module to store a voltage change caused by the at least one variable resistor, and provide the voltage change to a controller coupled with an adjustable amplifier included in the test signal channel to enable adjustment of a gain of a test signal in the test signal channel to compensate for the voltage change.

9. The test and measurement probe of claim 1 , further comprising an adjustable amplifier to adjust a gain of a test signal in the test signal channel to compensate for a voltage change caused by the at least one variable resistor.

10. The test and measurement probe of claim 1 , wherein the at least one variable resistor compensates for low frequency response variation in the RC network of the probe tip.

11. A test and measurement system comprising:
a probe tip including a test signal channel and a Resistor Capacitor (RC) probe tip network coupled to the test signal channel; and
a compensation box coupled to the probe tip via the test signal channel, the compensation box including an RC compensation network, the RC compensation network including a static capacitor coupled to the test signal channel and at least one variable resistor coupled to the test signal channel, the at least one variable resistor set to provide a resistance to compensate for frequency variation in the RC probe tip network, wherein the compensation box accomplishes frequency compensation independent of a variable capacitor.

12. The test and measurement system of claim 11 , further comprising a controller coupled to the compensation box via the test signal channel, the controller including an adjustable amplifier, the controller to control the adjustable amplifier to adjust a gain of a test signal in the test signal channel to compensate for a voltage change caused by the at least one variable resistor.

13. The test and measurement system of claim 12 , wherein the compensation box further includes a memory module to store a value of a voltage change caused by the at least one variable resistor, and the controller is configured to read the memory module and adjust the gain of the test signal via the adjustable amplifier based on the value of the voltage change read from the memory module.

14. The test and measurement system of claim 11 , wherein the at least one variable resistor includes at least one variable resistor having a coarser adjustment than at least one other variable resistor.

15. The test and measurement system of claim 11 , wherein the test signal channel is a differential channel including a reference channel and a signal channel, and the at least one variable resistor includes a reference channel variable resistor coupled to the reference channel and a signal channel variable resistor coupled to the signal channel.

16. The test and measurement system of claim 11 , wherein the probe tip further includes at least one variable resistor coupled to the test signal channel, the at least one variable resistor set to provide a resistance to compensate for frequency variation in the RC probe tip network.

17. The test and measurement system of claim 11 , wherein the compensation box further includes an adjustable amplifier set to adjust a gain of a test signal in the test signal channel to compensate for a voltage change caused by the at least one variable resistor.

18. The test and measurement system of claim 11 , wherein the at least one variable resistor compensates for low frequency response variation in the RC network of the probe tip.

Assignees

• Tektronix Inc

Inventors

• Mende Michael J
• Booman Richard A
• Wilburn Wayne M

Classifications

• G01R1/06766 Primary

  Input circuits therefor · CPC title

• H03H1/02

  RC networks, e.g. filters · CPC title

• G01R1/06772

  High frequency probes · CPC title

• G01R31/31905

  Interface with the device under test [DUT], e.g. arrangements between the test head and the DUT, mechanical aspects, fixture · CPC title

• G01R1/07328

  for testing printed circuit boards · CPC title