Security inspection apparatus and method

US10585052B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-10585052-B2
Application numberUS-201715609012-A
CountryUS
Kind codeB2
Filing dateMay 31, 2017
Priority dateAug 5, 2016
Publication dateMar 10, 2020
Grant dateMar 10, 2020

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  1. Title

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  2. Abstract

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  5. First independent claim

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

The present disclosure proposes a security inspection apparatus and method, relates to the technical field of radiation, wherein the security inspection apparatus of the disclosure includes: radiation emitting device, back-scatter detector, size-distance detecting device, orientation adjusting device; the back-scatter detector located between the radiation emitting device and an inspected object; the size-distance detecting device located between the radiation emitting device and the inspected object, for detecting a size of the inspected object and/or a distance between the inspected object and the size-distance detecting device; and the orientation adjusting device adjusts orientation of the radiation emitting device according to the size of the inspected object and/or the distance from the inspected object.

First claim

Opening claim text (preview).

The invention claimed is: 1. A security inspection apparatus comprising: a radiation emitting device, a back-scatter detector located between the radiation emitting device and an inspected object, a size-distance detecting device located between the radiation emitting device and the inspected object, for detecting a height of the inspected object and a distance from the inspected object, and an orientation adjusting device for adjusting an orientation of the radiation emitting device according to the height of the inspected object and the distance between the inspected object and the size-distance detecting device. 2. The apparatus according to claim 1 , wherein the orientation adjusting device further adjusts an angle of the back-scatter detector according to the orientation of the radiation emitting device. 3. The apparatus according to claim 2 , wherein the orientation adjusting device adjusts an angle of the back-scatter detector, according to a height and an emission angle of the radiation emitting device, or determines an ideal angle of the back-scatter detector from the height and the emission angle of the radiation emitting device, and adjusts the angle of the back-scatter detector according to the ideal angle. 4. The apparatus according to claim 2 , wherein the back-scatter detector is arc-shaped. 5. The apparatus according to claim 1 , wherein the size-distance detecting device comprises a plurality of sensors for determining the height of the inspected object by judging a height of an obstacle in front of the sensors. 6. The apparatus according to claim 5 , wherein the size-distance detecting device further comprises a camera located on a perpendicular bisector of the security inspection apparatus and the inspected object in a horizontal plane, and shoots in the direction of the perpendicular bisector; a calculating device acquires an image height of the inspected object and an image distance between the inspected object and the size-distance detecting device in a video image shot by the camera, and determines a distance between the inspected object and the size-distance detecting device from a ratio of the image distance to the image height and the height of the inspected object detected by the sensors. 7. The apparatus according to claim 1 , wherein the orientation adjusting device adjusts a height and an emission angle of the radiation emitting device, according to the height of the inspected object and/or the distance between the inspected object and the size-distance detecting device; and/or the orientation adjusting device adjusts a distance between the radiation emitting device and the inspected object, according to the height of the inspected object and/or the distance between the inspected object and the size-distance detecting device. 8. The apparatus according to claim 1 , wherein the orientation adjusting device determines an ideal height and an ideal emission angle of the radiation emitting device based on a predetermined strategy, from the height of the inspected object and/or the distance between the inspected object and the size-distance detecting device, and adjusts the height and the emission angle of the radiation emitting device according to the ideal height and the ideal emission angle; and/or the orientation adjusting device determines an ideal distance between the radiation emitting device and the inspected object based on a predetermined strategy, from the height of the inspected object and/or the distance between the inspected object and the size-distance detecting device, and adjusts the distance between the radiation emitting device and the inspected object according to the ideal distance. 9. The apparatus according to claim 1 , wherein the radiation emitting device comprises: a ray source located in a center of the radiation emitting device; and a spatial modulator located between the ray source and the back-scatter detector, comprising a fixed shielding plate and a rotating shielding plate which is located between the inspected object and the fixed shielding plate, and comprises more than one hole. 10. The apparatus according to claim 1 , further comprising a transportation facility for carrying and moving the security inspection apparatus; a control device for manually controlling the orientation adjusting device to perform the adjusting operation according to detection needs; and/or, a processor for receiving detection signals from the back-scatter detector. 11. A security inspection method comprising: acquiring a height of an inspected object and a distance between the inspected object and a size-distance detecting device by the size-distance detecting device; adjusting an orientation of a radiation emitting device according to the height of the inspected object and the distance between the inspected object and the size-distance detecting device; emitting X-rays towards the inspected object, and acquiring backscatter detection data by a back-scatter detector; and acquiring a detection result based on the backscatter detection data. 12. The method according to claim 11 , further comprising: adjusting an angle of the back-scatter detector according to the orientation of the radiation emitting device. 13. The method according to claim 12 , wherein adjusting an angle of the back-scatter detector according to the orientation of the radiation emitting device further comprises: adjusting the angle of the back-scatter detector according to a height and an emission angle of the radiation emitting device; or determining an ideal angle of the back-scatter detector from the height and the emission angle of the radiation emitting device, and adjusting the angle of the back-scatter detector according to the ideal angle. 14. The method according to claim 12 , further comprising: manually adjusting the orientation of the radiation emitting device and/or the angle of the back-scatter detector according to detection needs. 15. The method according to claim 14 , wherein manually adjusting the orientation of the radiation emitting device and/or the angle of the back-scatter detector according to detection needs comprises: manually adjusting the orientation of the radiation emitting device and/or the angle of the back-scatter detector for many times according to detection needs; acquiring backscatter detection data by a back-scatter detector comprises acquiring backscatter detection data after each time adjusting the orientation of the radiation emitting device and the angle of the back-scatter detector; and acquiring a detection result based on the backscatter detection data comprises: making a comprehensive analysis of the backscatter detection data acquired each time to determine the detection result. 16. The method according to claim 11 , wherein acquiring a height of an inspected object comprises: the height of the inspected object is acquired by using a plurality of sensors to determine a height of an obstacle in front of the sensors. 17. The method according to claim 16 , wherein acquiring a distance between the inspected object and the size-distance detecting device comprises: a video image is acquired by using a camera located on a perpendicular bisector of a security inspection apparatus and the inspected object in a horizontal plane, and shooting in the direction of the perpendicular bisector; acquiring an image height of the inspected object and an image distance between the inspected object and the size-distance detecting device in the video image, and determining a distance between the inspected object

Assignees

Inventors

Classifications

  • G01N23/203Primary

    Measuring back scattering · CPC title

  • Physics · mapped topic

  • G01V5/222Primary

    measuring scattered radiation · CPC title

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What does patent US10585052B2 cover?
The present disclosure proposes a security inspection apparatus and method, relates to the technical field of radiation, wherein the security inspection apparatus of the disclosure includes: radiation emitting device, back-scatter detector, size-distance detecting device, orientation adjusting device; the back-scatter detector located between the radiation emitting device and an inspected objec…
Who is the assignee on this patent?
Nuctech Co Ltd
What technology area does this patent fall under?
Primary CPC classification G01N23/203. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Mar 10 2020 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).