Gas concentration sensors and systems

US10571430B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-10571430-B2
Application numberUS-201715455678-A
CountryUS
Kind codeB2
Filing dateMar 10, 2017
Priority dateMar 14, 2016
Publication dateFeb 25, 2020
Grant dateFeb 25, 2020

How to read this patent

A practical reading order for non-experts. Skip the full description unless you need deep technical detail.

  1. Title

    What the patent document calls the invention.

  2. Abstract

    A short plain-language summary of the technical disclosure.

  3. Assignees and inventors

    Who owns or filed the patent and who is credited as inventor.

  4. Key dates

    Filing, priority, publication, and grant dates set the timeline.

  5. First independent claim

    The legal scope of protection — read this for what is actually claimed.

  6. CPC / IPC classifications

    Technology tags used to group this patent with similar filings.

  7. Citations and related patents

    Prior art links and similar publications in this corpus.

Abstract

Official abstract text for this publication.

A chemical vapor deposition or atomic layer deposition system includes a gas concentration sensor for determining the quantity of precursor gases admitted thereto. The gas concentration sensor can include a transmitter and a receiver for transmitting an acoustic signal across a chamber. In embodiments, the transmitter and receiver are designed to increase transmitted signal while reducing transmitted noise, facilitating use of the gas concentration sensor at low pressure and high temperature.

First claim

Opening claim text (preview).

What is claimed is: 1. An apparatus for determining gas concentration comprising: an acoustic cell defining a chamber; a transmitter comprising: a first transducer configured to transmit an acoustic signal; a first dampener arranged between the acoustic cell and the first transducer; and a first transformer arranged between the chamber and the first transducer, the first transformer coupled to the first transducer with a metallic material, wherein the metallic material is configured to inhibit separation of the first transducer from the first transformer when subjected to temperatures greater than 150° C. the metallic material having a coefficient of thermal expansion between a coefficient of thermal expansion of the first transformer and a coefficient of thermal expansion of the first transducer; and a receiver comprising: a second transducer configured to receive the acoustic signal; a second dampener arranged between the acoustic cell and the second transducer; and a second transformer arranged between the chamber and the second transducer, the second transformer coupled to the second transducer with the metallic material, wherein the metallic material is configured to inhibit separation of the second transducer from the second transformer when subjected to temperatures greater than 100° C., the metallic material having a coefficient of thermal expansion between a coefficient of thermal expansion of the second transformer and a coefficient of thermal expansion of the second transducer. 2. The apparatus of claim 1 , wherein the metallic material is a solder. 3. The apparatus of claim 1 , wherein the first transducer includes a piezoelectric element. 4. The apparatus of claim 3 , wherein the first transducer includes a stack of piezoelectric elements, and wherein the stack of piezoelectric elements are coupled to one another by the metallic material. 5. The apparatus of claim 4 , wherein the second transducer comprises a second stack of piezoelectric elements, and wherein the second stack of piezoelectric elements are coupled to one another by the metallic material. 6. The apparatus of claim 1 , wherein a precursor gas inlet is configured to route a precursor gas through the apparatus during operation of a chemical vapor deposition or atomic layer deposition system. 7. The apparatus of claim 1 , wherein the apparatus is configured to operate at pressures of less than 100 Torr. 8. The apparatus of claim 7 , wherein the apparatus is configured to operate at pressures of less than 20 Torr. 9. The apparatus of claim 1 , wherein the metallic material has a thickness of between about 25-50 μm. 10. The apparatus of claim 1 , wherein the coefficient of thermal expansion of the metallic material is about 2.2×10-5/deg-C.

Assignees

Inventors

Classifications

Patent family

Related publications grouped by family.

External sources

Frequently asked questions

Answers are generated from the same data shown on this page.

What does patent US10571430B2 cover?
A chemical vapor deposition or atomic layer deposition system includes a gas concentration sensor for determining the quantity of precursor gases admitted thereto. The gas concentration sensor can include a transmitter and a receiver for transmitting an acoustic signal across a chamber. In embodiments, the transmitter and receiver are designed to increase transmitted signal while reducing trans…
Who is the assignee on this patent?
Veeco Instr Inc
What technology area does this patent fall under?
Primary CPC classification G01N29/024. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Feb 25 2020 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 1 related publication on this page (citations in our corpus or others sharing the same primary CPC).