Polyurethane CMP pads having a high modulus ratio

US10562149B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-10562149-B2
Application numberUS-201615273855-A
CountryUS
Kind codeB2
Filing dateSep 23, 2016
Priority dateSep 25, 2015
Publication dateFeb 18, 2020
Grant dateFeb 18, 2020

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

A chemical-mechanical polishing pad comprising a polyurethane polishing layer having a high storage modulus at low temperatures and a low storage modulus at high temperatures is disclosed. For example, the disclosed pad embodiments may be fabricated from a thermoplastic polyurethane having a ratio of storage modulus at 25 degrees C. to storage modulus at 80 degrees C. of 50 or more. The thermoplastic polyurethane polishing layer may further optionally have a Shore D hardness of 70 or more, a tensile elongation of 320 percent or less, a storage modulus at 25 degrees C. of 1200 MPa or more, and/or a storage modulus at 80 degrees C. of 15 MPa or less.

First claim

Opening claim text (preview).

The invention claimed is: 1. A chemical-mechanical polishing pad comprising a thermoplastic polyurethane polishing layer having a ratio of storage modulus at 25 degrees C. to storage modulus at 80 degrees C. of 50 or more. 2. The pad of claim 1 , wherein the ratio is 100 or more. 3. The pad of claim 1 , wherein the thermoplastic polyurethane polishing layer also has a ratio of storage modulus at 40 degrees C. to storage modulus at 80 degrees C. of 50 or more. 4. The pad of claim 1 , wherein the thermoplastic polyurethane polishing layer has a Shore D hardness of 70 or more. 5. The pad of claim 1 , wherein the thermoplastic polyurethane polishing layer has a tensile elongation of 320 percent or less. 6. The pad of claim 1 , wherein the thermoplastic polyurethane polishing layer has a storage modulus at 25 degrees C. of 1000 MPa or more. 7. The pad of claim 1 , wherein the thermoplastic polyurethane polishing layer has a storage modulus at 80 degrees C. of 15 MPa or less. 8. The pad of claim 1 , wherein the pad is non-porous. 9. The pad of claim 1 , wherein the thermoplastic polyurethane has a molecular weight of less than about 100,000 g/mol. 10. The pad of claim 1 , wherein the pad has a density in a range from about 1.1 to about 1.2 g/cm3. 11. A method of chemical mechanical polishing a substrate, the method comprising: (a) contacting the substrate with the pad of claim 1 ; (b) moving the pad relative to the substrate; and (c) abrading the substrate to remove a portion of at least one layer from the substrate and thereby polish the substrate. 12. A method for fabricating the pad of claim 1 , the method comprising: (a) blending a thermoplastic polyurethane polymer resin mixture; (b) extruding the mixture to form a solid thermoplastic polyurethane sheet; (c) forming the polishing pad from the thermoplastic polyurethane sheet. 13. A method of chemical mechanical polishing a substrate; the method comprising: (a) contacting the substrate with the pad of claim 1 ; (b) moving the pad relative to the substrate; and (c) abrading the substrate to remove a portion of at least one layer from the substrate and thereby polish the substrate. 14. A chemical-mechanical polishing pad comprising a thermoplastic polyurethane polishing layer having a storage modulus at 25 degrees C. of 1200 MPa or more and a tensile elongation of 320 percent or less. 15. A chemical-mechanical polishing pad comprising a thermoplastic polyurethane polishing layer having a Shore D hardness of 70 or more, a tensile elongation of 320 percent or less, a storage modulus at 25 degrees C. of 1000 MPa or more, and a storage modulus at 80 degrees C. of 20 MPa or less. 16. A chemical-mechanical polishing pad comprising a non-porous thermoplastic polyurethane polishing layer having an average molecular weight of 100,000 g/mol or less, a Shore D hardness of 70 or more, a tensile elongation of 320 percent or less, a storage modulus at 25 degrees C. of 1200 MPa or more, and a storage modulus at 80 degrees C. of 15 MPa or less.

Assignees

Inventors

Classifications

  • Polyurethanes · CPC title

  • operating processes therefor · CPC title

  • characterised by a multi-layered structure · CPC title

  • Constructional features of flexible abrasive materials; Special features in the manufacture of such materials · CPC title

  • Manufacture of films or sheets · CPC title

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Frequently asked questions

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What does patent US10562149B2 cover?
A chemical-mechanical polishing pad comprising a polyurethane polishing layer having a high storage modulus at low temperatures and a low storage modulus at high temperatures is disclosed. For example, the disclosed pad embodiments may be fabricated from a thermoplastic polyurethane having a ratio of storage modulus at 25 degrees C. to storage modulus at 80 degrees C. of 50 or more. The thermop…
Who is the assignee on this patent?
Cabot Microelectronics Corp
What technology area does this patent fall under?
Primary CPC classification B24B37/24. Mapped technology areas include Operations & Transport.
When was this patent published?
Publication date Tue Feb 18 2020 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 4 related publications on this page (citations in our corpus or others sharing the same primary CPC).