Virtual autocalibration of sensors

US10545784B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-10545784-B2
Application numberUS-201816182569-A
CountryUS
Kind codeB2
Filing dateNov 6, 2018
Priority dateNov 6, 2017
Publication dateJan 28, 2020
Grant dateJan 28, 2020

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  5. First independent claim

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Abstract

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The present disclosure describes methods and systems for virtually calibrating geometric sensors with overlapping fields of view. In some embodiments, a geometric sensor may be virtually calibrated by applying a correction value to profile data obtained by the geometric sensor to generate adjusted profile data. The correction factor may be determined based at least in part on X-Y offsets and/or rotational offsets of prior profile data obtained by the geometric sensor relative to corresponding profile data obtained by a reference geometric sensor, and may be recalculated or updated as new sets of profile data are obtained. The adjusted profile data may be used in place of the original profile data in various data processing operations to functionally offset a positional error of the geometric sensor.

First claim

Opening claim text (preview).

What is claimed is: 1. A method of automatically offsetting geometric sensor misalignment in a scanning system configured to scan workpieces along a workpiece processing line, the method comprising: receiving a first set of profile data obtained by one or more first geometric sensors of the scanning system, and a reference set of profile data obtained by one or more second geometric sensors of the scanning system, for a first workpiece, wherein the first set of profile data includes profile data for a first portion of the first workpiece and the reference set of profile data includes profile data for said first portion of the first workpiece, such that the sets of profile data include overlapping profile data; determining a first one or more offset values that represents a translational difference of the first set of profile data, or portions thereof, relative to the reference set of profile data; receiving a second set of profile data obtained by the one or more first geometric sensors for a second workpiece; generating an adjusted set of profile data for the second workpiece based at least on the second set of profile data and the first one or more offset values to thereby offset a positional error of the one or more first geometric sensors relative to the one or more reference geometric sensors; and automatically sending one or more control signals to a cutting or positioning device of the workpiece processing line to cut or reposition the second workpiece based at least in part on the adjusted set of profile data. 2. The method of claim 1 , wherein the one or more first geometric sensors is a single first geometric sensor, and the first one or more offset values is a first offset value, and wherein determining the first one or more offset values includes aligning the first set of profile data to the reference set of profile data based at least in part on the overlapping profile data, determining an offset of the first set of profile data relative to the reference set of profile data based on the alignment, wherein the offset includes an X-Y offset and/or a rotational offset, and storing the determined offset in a first buffer as the first offset value. 3. The method of claim 2 , wherein generating the adjusted set of profile data includes determining a correction value based at least on the first offset value, and applying the one or more correction values to the second set of profile data to thereby generate the adjusted set of profile data. 4. The method of claim 3 , wherein determining the correction value includes determining an average of a plurality of offset values stored in the first buffer, and the plurality of offset values includes the first offset value. 5. The method of claim 4 , wherein the plurality of offset values is a predetermined number of the most recent offset values stored in the first buffer, and the correction value is the determined average of said plurality of offset values. 6. The method of claim 3 , wherein the single first geometric sensor is positioned to scan the workpieces in a first scan zone, and the one or more second geometric sensors is positioned to scan the workpieces in a second scan zone that is spaced apart from the first scan zone along a flow path. 7. The method of claim 3 , wherein the single first geometric sensor and the one or more second geometric sensors are positioned to scan the workpieces in a first scan zone. 8. The method of claim 3 , further including generating an alert based at least in part on the first offset value. 9. The method of claim 8 , wherein generating the alert includes comparing the correction value to a threshold value, determining, based on the comparison, whether the correction value exceeds the threshold value, and in response to determining that the correction value exceeds the threshold value, sending a command to an output device to generate an alert message to thereby alert an operator of a misalignment of the first geometric sensor relative to the second geometric sensor. 10. The method of claim 1 , wherein the one or more first geometric sensors is a plurality of first geometric sensors positioned to scan the workpieces in a first scan zone, each of said portions of the first set of profile data is a portion of profile data obtained by a corresponding one of the first geometric sensors, and the first one or more offset values is a plurality of first offset values, wherein determining the one or more first offset values includes aligning the first set of profile data to the reference set of profile data, aligning the portions of profile data to the reference set of profile data, determining an offset of each said portion of profile data relative to the reference set of profile data based on the alignment, wherein each of the offsets includes an X-Y offset and/or a rotational offset, and storing the determined offsets in a corresponding plurality of buffers as the offset values, such that each of the buffers includes the first offset value for a corresponding one of the first geometric sensors. 11. The method of claim 10 , wherein generating the adjusted set of profile data includes determining a plurality of correction values based at least on the first offset values, and applying the correction values to the second set of profile data to thereby generate the adjusted set of profile data. 12. The method of claim 11 , wherein determining the correction values includes determining an average of at least some of the offset values stored in each of the buffers, and wherein the determined averages are the correction values for the respective first geometric sensors. 13. The method of claim 12 , wherein determining the correction values includes determining an average of a desired number of the most recent offset values stored in each of the buffers. 14. The method of claim 11 , wherein the one or more second geometric sensors is positioned to scan the workpieces in a second scan zone that is spaced apart from the first scan zone along a flow path. 15. The method of claim 11 , wherein the one or more second geometric sensors is positioned to scan the workpieces in the first scan zone. 16. The method of claim 11 , further including generating an alert based at least in part on one of the first offset values. 17. The method of claim 16 , wherein generating the alert includes comparing the correction values to a threshold value, determining, based on the comparison, whether the correction value exceeds the threshold value, and in response to determining that the correction value exceeds the threshold value, sending a command to an output device to generate an alert message to thereby alert an operator of a misalignment of a corresponding one of the first geometric sensors relative to the one or more second geometric sensors. 18. The method of claim 1 , wherein the workpieces are pieces of wood. 19. The method of claim 1 , wherein the workpieces are logs, the one or more first geometric sensors is a plurality of geometric sensors positioned to scan the logs in a first scan zone located near a log turner, and the one or more second geometric sensors is a plurality of geometric sensors positioned to scan the logs in a second scan zone located upstream of the first scan zone, the method further including: comparing the adjusted set of scan data to the reference set of scan data to determine a current position of the second workpiece, wherein the cutting or positioning device is the log turner, and the one or more control signals are config

Assignees

Inventors

Classifications

  • Emulation; Interpretation; Software simulation, e.g. virtualisation or emulation of application or operating system execution engines · CPC title

  • Configuring for program initiating, e.g. using registry, configuration files · CPC title

  • Hypervisor-specific management and integration aspects · CPC title

  • Memory management, e.g. access or allocation · CPC title

  • Monitoring or debugging support · CPC title

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What does patent US10545784B2 cover?
The present disclosure describes methods and systems for virtually calibrating geometric sensors with overlapping fields of view. In some embodiments, a geometric sensor may be virtually calibrated by applying a correction value to profile data obtained by the geometric sensor to generate adjusted profile data. The correction factor may be determined based at least in part on X-Y offsets and/or…
Who is the assignee on this patent?
Usnr Llc
What technology area does this patent fall under?
Primary CPC classification G06F9/45558. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Jan 28 2020 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 3 related publications on this page (citations in our corpus or others sharing the same primary CPC).