System and method for reading x-ray-fluorescence marking

Patent metadata

Field	Value
Publication number	US-10539521-B2
Application number	US-201615563756-A
Country	US
Kind code	B2
Filing date	Mar 31, 2016
Priority date	Apr 2, 2015
Publication date	Jan 21, 2020
Grant date	Jan 21, 2020

Abstract

In a method and a system for authenticating an object marked with XRF marking, a wavelength spectral profile is provided of a detected portion of an X-Ray signal arriving from an object in response to X-Ray or Gamma-Ray radiation applied to the object and the wavelength spectral profile is filtered to suppress trend and periodic components from the wavelength spectral profile to obtain a filtered profile with improved signal to noise or signal to clutter ratio. The object can be authenticated by processing the filtered profile and identifying one or more peaks therein, which satisfy a predetermined condition, whereby the wavelengths of the identified peaks are indicative of the signatures of materials included in the object.

First claim

The invention claimed is:

1. An X-Ray Fluorescence (XRF) device comprising:
a radiation detector for detecting X-Ray signals arriving from an object in response to irradiation of the object by X-Ray or Gamma-Ray radiation, and providing data indicative of the detected X-Ray signals; and
a signal reading processor in communication with said detector, the processor being adapted for receiving and processing the detected X-Ray signals to identify signatures of materials included in said object;
wherein said processor comprises: a spectral data provider configured for determining data indicative of a wavelength spectral profile of at least a portion of the detected X-Ray signals; and a filtration module adapted for filtering said data indicative of the wavelength spectral profile and obtaining a filtered profile, said filtering being configured to suppress trend components and periodic components from said wavelength spectral profile to obtain said filtered profile, wherein said trend components and periodic components are associated with at least one of noise and clutter in the X-Ray signal portion detected by said radiation detector; said filtered profile thereby having improved signal to noise ratio (SNR) or improved signal to clutter ratio (SCR), enabling identification of spectral peaks associated with signatures of materials included in said object with improved accuracy and reliability,
wherein said filtration module comprises a stationarity filter operative for suppressing said trend component, said stationary being adapted to carry out the following:
a. applying moving average processing to said wavelength spectral profile or to said suppressed periodicity wavelength spectral profile to obtain a stationary profile indicative of said trend component, and
b. differencing between the said wavelength spectral profile or said suppressed periodicity wavelength spectral profile and the stationarity profile to obtain a wavelength spectral profile with said trend component suppressed.

2. The XRF device according to claim 1 comprising an identification module configured and operable for processing said filtered profile to identify therein one or more peaks satisfying a predetermined condition and associated with XRF signatures of materials included in said object; and
a data storage storing association data associating information indicative of a plurality of objects with marking data indicative of a plurality of XRF markers used for marking the respective objects, whereby the marking data of each respective object is indicative of XRF signatures of one or more materials of a respective XRF marker marking the object; and
wherein said identification module identifies said object by associating the marking data of the XRF marker marking the object with the XRF signatures of materials included in the object data obtained for said object.

3. The XRF device according to claim 1 configured as a handheld XRF detection device; the XRF device comprises a communication module configured to communicate data indicative of said filtered profile to a remote processing center and to obtain from the processing center, in response, object data indicative of said object; and wherein one or more of the following:
i. the XRF device further comprises a position locator configured to identify the position of the XRF device, and wherein said communication module is capable of communicating data indicative of said position to said processing center together with said data of the filtered profile;
ii. the XRF device further comprises an optical reader configured to read an optical code associated with said object and wherein said communication module is capable of communicating data indicative of said optical code to said processing center together with said data of the filtered profile;
iii. the XRF device further comprises a memory storing an identification code unique to the XRF device, and wherein the XRF device is configured to transmit the identification code to a central computer via the communication module.

4. The XRF device according to claim 1 wherein said processor is adapted for carrying out the following:
operating said filtration module to apply said filtering to filter a plurality of wavelength spectral profiles of a plurality of portions of the X-Ray signal arriving from the object in a plurality of time frames, to suppress trend components and periodic components from said plurality of wavelength spectral profiles; and
computing said filtered profile from data indicative of said plurality of the wavelength spectral profiles being filtered.

5. The XRF device according to claim 4 wherein computing said filtered profile comprises calculating an average profile of said plurality of the wavelength spectral profiles being filtered.

6. The XRF device according to claim 1 wherein said filtration module is adapted to apply a time series technique to the wavelength spectral profile to suppress said trend component and said periodic components and to obtain said filtered profile having improved SNR or SCR.

7. The XRF device according to claim 1 wherein said filtration module is adapted to utilize a predetermined Auto-Regressive (AR) model for carrying out said filtering.

8. The XRF device according to claim 7 wherein said predetermined Auto-Regressive (AR) model is an Auto-Regressive-Integrated-Moving-Average (ARIMA) model.

9. The XRF device according to claim 1 wherein said filtration module is adapted to utilize at least one of: Box-Jenkins processing and Seasonal-Decomposition processing, in filtering said portion of the detected X-Ray signal.

10. The XRF device according to claim 1 wherein said filtration module comprises a seasonality filter operative for suppressing said periodic component; said seasonality filter being adapted to carry out the following:
a. applying moving average to said wavelength spectral profile obtained to obtain a smoothed wavelength spectral profile;
b. differencing between said wavelength spectral profile and said smoothed wavelength spectral profile to thereby obtain a seasonality profile indicative of said periodic component, and smoothing said seasonality profile by computing a moving medial average thereof; and
c. differencing between said wavelength spectral profile and said seasonality profile thereby obtaining a suppressed periodicity wavelength spectral profile with said periodic component suppressed.

11. The XRF device according to claim 1 wherein the radiation detector enables detection of an XRF marker material marking said object and having concentration in the order of 100s of ppb, and more preferably enables detection of XRF marker material and having concentration in the order of 1 ppm.

12. An X-Ray Fluorescence (XRF) device comprising a processor adapted for obtaining data indicative of a wavelength spectral profile of the X-Ray signal portion arriving from an object in response to irradiation of said object by X-Ray or Gamma-Ray radiation and detected by a radiation detector, and processing said wavelength spectral profile to identify signatures of materials included in said object;
wherein said processor comprises a filtration module adapted for filtering said wavelength spectral profile to suppress trend components and periodic components from said wavelength spectral profile, wherein said trend components and periodic components are associated with at least one of noise and clutter in the X-Ray signal portion detected by said radiation detector; and wherein said filtration module is adapted to carrying out said filtering by utilizing one or more of the following:
(i) a seasonality filter operative for suppressing said periodic comp

Assignees

• Soreq Nuclear Res Ct
• Security Matters Ltd

Inventors

• Grof Yair

Classifications

• G01N23/223 Primary

  by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence · CPC title

• G01N33/42

  Road-making materials (G01N33/38 takes precedence) · CPC title

• G01N2223/652

  impurities, foreign matter, trace amounts · CPC title

• G01N2223/076

  X-ray fluorescence · CPC title

• G01N23/2202

  Preparing specimens therefor · CPC title