Method for correcting measured values of a sensor element

US10533980B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-10533980-B2
Application numberUS-201214350963-A
CountryUS
Kind codeB2
Filing dateSep 13, 2012
Priority dateNov 11, 2011
Publication dateJan 14, 2020
Grant dateJan 14, 2020

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

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  7. Citations and related patents

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Abstract

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A measured value of a sensor element is obtained during repeatedly executed measuring periods for performing different measurements and for setting different operating states, the sensor element being electrically connected in a periodically alternating manner, in consecutive switching positions, in a predefined order, where at least one measurement for determining the measured value is performed repeatedly within a measuring period for determining individual values at predefined switching positions, the measured value being determined from the individual values. Using the switching position within the measuring period, the operating state of the sensor element preceding the individual measurement, and therefore, the influence of the preceding circuit configuration on the individual measured value, is known, and the individual values are correspondingly corrected. By correcting the individual values, the measured value determined from the individual values is also corrected.

First claim

Opening claim text (preview).

What is claimed is: 1. A method for correcting individual measured values of a sensor element obtained over repeatedly executed measuring periods for performing different measurements and for setting different operating states, the sensor element is electrically connected by a circuit arrangement in a periodically alternating electrical manner, in consecutive switching positions, in a predefined order, the method comprising: performing a measurement repeatedly within a measuring period, at predefined switching positions, the individual values thereby being determined at the predefined switching positions; and correcting, by processing circuitry, the individual values as a function of the respective switching positions associated with respective ones of the individual values. 2. The method of claim 1 , wherein the correcting includes: in a first phase, ascertaining an approximate value for the measured value; in a learning phase: determining deviations of the individual values from the approximate value and correlating the deviations to the respective switching positions associated with the respective individual values for which the respective deviations are determined; and determining respective correction values for correcting the individual values for respective ones of the different switching positions; and in an application phase, correcting the individual values using the respective correction values assigned to the respective switching positions of the respective individual values to be corrected. 3. The method of claim 2 , wherein, in the first phase, the approximate value is calculated as an average value of the individual values determined during one or more measuring periods. 4. The method of claim 2 , wherein the correction values used in the application phase for the respective switching positions are calculated as average values or as moving averages of the correction values determined for the respective switching positions in a plurality of measuring periods. 5. The method of claim 2 , wherein the first phase, the learning phase, and the application phase are executed simultaneously. 6. The method of claim 2 , wherein: the sensor element is a wide-range lambda probe that includes a pump cell and a Nernst cell; the measured value is a pump current for the pump cell of the wide-range lambda probe; and in the first phase, the approximate value is calculated as an average value of the individual values calculated for switching positions where no polarization of the Nernst cell is to be expected in a preceding switching position. 7. A method for determining a combustion air ratio lambda in exhaust gas of an internal combustion engine, the method comprising: obtaining a measured value of a pump current of a wide-range lambda probe; and determining the combustion air ratio lambda based on the measured value; wherein: the wide-range lambda probe is electrically connected by a circuit arrangement in a periodically alternating electrical manner, in consecutive switching positions, in a predefined order; and the obtaining of the measured value includes, during repeatedly executed measuring periods for performing different measurements and for setting different operating state, performing the following: performing a pump current measurement repeatedly within a measuring period, at predefined switching positions, individual values thereby being determined at the predefined switching positions; and correcting, by processing circuitry, the individual values as a function of the respective switching positions associated with respective ones of the individual values.

Assignees

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Classifications

  • Electrical control of exhaust gas treating apparatus (monitoring or diagnostic devices for exhaust-gas treatment apparatus F01N11/00; conjoint electrical control of two or more combustion engine functions F02D43/00) · CPC title

  • for measuring or detecting O2, e.g. lambda sensors · CPC title

  • Calibrating gas analysers · CPC title

  • Exhaust gas composition · CPC title

  • Arrangements to check the analyser (calibrating gas analysers G01N33/0006) · CPC title

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What does patent US10533980B2 cover?
A measured value of a sensor element is obtained during repeatedly executed measuring periods for performing different measurements and for setting different operating states, the sensor element being electrically connected in a periodically alternating manner, in consecutive switching positions, in a predefined order, where at least one measurement for determining the measured value is perform…
Who is the assignee on this patent?
Ledermann Bernhard, Belzner Ulrich, Steinert Thomas, and 1 more
What technology area does this patent fall under?
Primary CPC classification G01N33/0006. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Jan 14 2020 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).