Organic electronic device having dimension tolerance between encapsulating layer and metal layer less than or equal to 200 microns

US10522786B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-10522786-B2
Application numberUS-201816125244-A
CountryUS
Kind codeB2
Filing dateSep 7, 2018
Priority dateMay 21, 2013
Publication dateDec 31, 2019
Grant dateDec 31, 2019

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  1. Title

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  2. Abstract

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  4. Key dates

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  5. First independent claim

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

Provided are an organic electronic device (OED) and a method of manufacturing the same. The OED may effectively block moisture or oxygen permeating into the OED from an external environment, provide high reliability by increasing a life span and durability of an organic electronic diode, and minimize an align error in a process of attaching a film encapsulating the organic electronic diode to a substrate.

First claim

Opening claim text (preview).

What is claimed is: 1. An organic electronic device (OED), comprising: a substrate; an organic electronic diode formed on the substrate; and an encapsulation film comprising an encapsulating layer which comprises an encapsulating resin and a grinded moisture adsorbent, which encapsulates an entire surface of the organic electronic diode, and a metal-containing layer formed on the encapsulating layer, of which a dimension tolerance (d) between the metal-containing layer and the encapsulating layer of the encapsulation film satisfies Equation 1: | d |≤200 μm  [Equation 1] wherein d is a difference in distance between an arbitrary side surface of the metal-containing layer and a side surface of the encapsulating layer corresponding to the arbitrary side surface of the metal-containing layer, and wherein the grinded moisture adsorbent is a powderized moisture adsorbent. 2. The organic electronic device according to claim 1 , wherein the metal-containing layer has a thermal conductivity of 50 W/mK or more. 3. The organic electronic device according to claim 1 , wherein the metal-containing layer comprises any one of a metal oxide, a metal nitride, a metal carbide, a metal oxynitride, a metal oxyboride, and a mixture thereof. 4. The organic electronic device according to claim 3 , wherein the metal-containing layer comprises any one of silicon oxide, aluminum oxide, titanium oxide, indium oxide, tin oxide, indium tin oxide, tantalum oxide, zirconium oxide, niobium oxide, and a mixture thereof. 5. The organic electronic device according to claim 1 , wherein the metal-containing layer further comprises a base substrate. 6. The organic electronic device according to claim 5 , wherein the base substrate is any one of polyethyleneterephthalate, polytetrafluoroethylene, polyethylene, polypropylene, polybutene, polybutadiene, a vinyl chloride copolymer, polyurethane, ethylene-vinyl acetate, an ethylene-propylene copolymer, an ethylene-ethyl acrylate copolymer, an ethylene-methyl acrylate copolymer, polyimide, nylon, and a combination thereof. 7. The organic electronic device according to claim 1 , wherein the encapsulating layer is a single layer or at least two layers. 8. The organic electronic device according to claim 7 , wherein when the encapsulating layer is formed of at least two layers, at least one layer has a tensile modulus of 0.001 to 500 MPa at room temperature. 9. The organic electronic device according to claim 8 , wherein the encapsulating layer includes a first layer having a tensile modulus of 0.001 to 500 MPa at room temperature, and a second layer having a tensile modulus of 200 to 1000 MPa at room temperature. 10. The organic electronic device according to claim 1 , wherein the encapsulating layer has a tensile modulus of 0.001 to 500 MPa at room temperature. 11. The organic electronic device according to claim 1 , wherein the encapsulating resin is a styrene-based resin, a polyolefin-based resin, a thermoplastic elastomer, a polyoxyalkylene-based resin, a polyester-based resin, a polyvinylchloride-based resin, a polycarbonate-based resin, a polyphenylenesulfide-based resin, a mixture of hydrocarbon, a polyamide-based resin, an acrylate-based resin, an epoxy-based resin, a silicon-based resin, a fluorine-based resin, or a mixture thereof. 12. The organic electronic device according to claim 1 , wherein the encapsulating resin comprises a curable resin. 13. The organic electronic device according to claim 12 , wherein the curable resin comprises at least one curable functional group selected from a glycidyl group, an isocyanate group, a hydroxy group, a carboxyl group, an amide group, an epoxide group, a cyclic ether group, a sulfide group, an acetal group, and a lactone group. 14. The organic electronic device according to claim 12 , wherein the curable resin is an epoxy resin comprising a cyclic structure in a molecular structure. 15. The organic electronic device according to claim 12 , wherein the curable resin is a silane-modified epoxy resin. 16. The organic electronic device according to claim 1 , wherein the organic electronic diode is an organic light emitting diode. 17. A method of manufacturing an organic electronic device, comprising: applying an encapsulation film comprising an encapsulating layer comprising an encapsulating resin and a grinded moisture adsorbent, and a metal-containing layer formed on the encapsulating layer to a substrate on which an organic electronic diode is formed to encapsulate an entire surface of the organic electronic diode; and curing the encapsulating layer of the encapsulation film, wherein a dimension tolerance (d) between the metal-containing layer and the encapsulating layer of the encapsulation film satisfies Equation 1: | d |≤200 μm  [Equation 1] wherein d is a difference in distance between an arbitrary side surface of the metal-containing layer and a side surface of the encapsulating layer corresponding to the arbitrary side surface of the metal-containing layer, and wherein the grinded moisture adsorbent is a powderized moisture adsorbent. 18. The method according to claim 17 , wherein the encapsulating layer of the encapsulation film covers the entire surface of the organic electronic diode.

Assignees

Inventors

Classifications

  • of synthetic resin · CPC title

  • comprising such {particular} substance as the main or only constituent of a layer, {which is} next to another layer of {the same or of} a {different material (next to a glass layer B32B17/06; layered products with at least two ceramic layers composed mainly of ceramic B32B18/00)} · CPC title

  • of synthetic resin · CPC title

  • comprising polyethers · CPC title

  • comprising natural stone or artificial stone · CPC title

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What does patent US10522786B2 cover?
Provided are an organic electronic device (OED) and a method of manufacturing the same. The OED may effectively block moisture or oxygen permeating into the OED from an external environment, provide high reliability by increasing a life span and durability of an organic electronic diode, and minimize an align error in a process of attaching a film encapsulating the organic electronic diode to a…
Who is the assignee on this patent?
Lg Chemical Ltd
What technology area does this patent fall under?
Primary CPC classification H01L51/5253. Mapped technology areas include Electricity.
When was this patent published?
Publication date Tue Dec 31 2019 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 7 related publications on this page (citations in our corpus or others sharing the same primary CPC).