Method for fabricating a nanostructure

US10511151B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-10511151-B2
Application numberUS-201615759986-A
CountryUS
Kind codeB2
Filing dateSep 14, 2016
Priority dateSep 15, 2015
Publication dateDec 17, 2019
Grant dateDec 17, 2019

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

A method for fabricating a nanostructure comprises the steps of growing a first nanowire on a substrate, forming a dielectric layer on the substrate, the dielectric layer surrounding the first nanowire, wherein a thickness of the dielectric layer is smaller than a length of the first nanowire, and removing the first nanowire from the dielectric layer, thereby exposing an aperture in the dielectric layer.

First claim

Opening claim text (preview).

What is claimed is: 1. A method for fabricating a nanostructure, comprising: growing a first nanowire on a substrate; forming a dielectric layer on said substrate, said dielectric layer surrounding said first nanowire, wherein a thickness of said dielectric layer is smaller than a length of said first nanowire; and removing said first nanowire from said dielectric layer, thereby exposing an aperture in said dielectric layer; and growing a second nanowire in said aperture on said substrate wherein growing said second nanowire comprises growing a support element in said aperture, and extending said support element above said dielectric layer, and growing a body element around at least a portion of said support element that extends above said dielectric layer. 2. The method according to claim 1 , wherein growing said first nanowire on said substrate comprises: forming a mask layer on said substrate; forming an opening in said mask layer, wherein said opening extends to said substrate; and growing said first nanowire on said substrate in said opening. 3. The method according to claim 2 , wherein said mask layer is formed at a thickness no larger than 80 nm. 4. The method according to claim 1 , wherein said dielectric layer is formed on said substrate at a thickness of at least 100 nm. 5. The method according to claim 1 , wherein a diameter of said body element is at least two times larger than a diameter of said support element. 6. The method according to claim 1 , wherein said nanostructure is adapted to emit a laser signal at a wavelength λ, and a diameter of said support element is smaller than λ/(2n), wherein n denotes an index of refraction of said support element. 7. The method according to claim 1 , wherein said nanostructure is adapted to emit a laser signal at a wavelength λ, and a diameter of said body element is no smaller than λ/n, wherein n denotes an index of refraction of said body element. 8. The method according to claim 1 , wherein growing said first nanowire comprises molecular beam epitaxy or metal organic chemical vapor deposition. 9. The method according to claim 1 , wherein said first nanowire is grown in a direction perpendicular to an upper surface of said substrate. 10. The method according claim 1 , wherein said first nanowire is grown at an angle inclined to a surface normal of said substrate. 11. The method according to claim 4 , wherein said thickness of said dielectric layer is at least 150 nm. 12. The method according to claim 10 , wherein said diameter of said body element is at least three times larger than said diameter of said support element. 13. The method according to claim 10 , wherein said angle is at least 20 degrees. 14. A method for fabricating a nanostructure, comprising: growing a first nanowire on a substrate; forming a dielectric layer on said substrate, said dielectric layer surrounding said first nanowire, wherein a thickness of said dielectric layer is smaller than a length of said first nanowire; and removing said first nanowire from said dielectric layer, thereby exposing an aperture in said dielectric layer; wherein said nanostructure is adapted to emit a laser signal at a wavelength λ, wherein a thickness of said dielectric layer is an integer multiple of λ/(2n), wherein n denotes an index of refraction of said dielectric layer. 15. The method according to claim 14 , wherein said dielectric layer is formed on said substrate at a thickness of at least 100 nm. 16. The method according to claim 15 , wherein said thickness of said dielectric layer is at least 150 nm. 17. The method according to claim 14 , further comprising a step of growing a second nanowire in said aperture on said substrate; wherein growing said second nanowire comprises growing a support element in said aperture, and extending said support element above said dielectric layer, and growing a body element around at least a portion of said support element that extends above said dielectric layer. 18. The method according to claim 17 , wherein a diameter of said body element is at least two times larger than a diameter of said support element. 19. The method according to claim 17 , wherein said nanostructure is adapted to emit a laser signal at a wavelength λ, and a diameter of said support element is smaller than λ/(2n), wherein n denotes an index of refraction of said support element. 20. The method according to claim 17 , wherein said nanostructure is adapted to emit a laser signal at a wavelength λ, and a diameter of said body element is no smaller than λ/n, wherein n denotes an index of refraction of said body element.

Assignees

Inventors

Classifications

  • Nanowires · CPC title

  • Arsenides · CPC title

  • characterised by the preparation of substrate for selective deposition · CPC title

  • using physical deposition, e.g. vacuum deposition or sputtering · CPC title

  • Manufacture or treatment of nanostructures · CPC title

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What does patent US10511151B2 cover?
A method for fabricating a nanostructure comprises the steps of growing a first nanowire on a substrate, forming a dielectric layer on the substrate, the dielectric layer surrounding the first nanowire, wherein a thickness of the dielectric layer is smaller than a length of the first nanowire, and removing the first nanowire from the dielectric layer, thereby exposing an aperture in the dielect…
Who is the assignee on this patent?
Univ Muenchen Tech
What technology area does this patent fall under?
Primary CPC classification H10P14/3462. Mapped technology areas include Electricity.
When was this patent published?
Publication date Tue Dec 17 2019 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).