Semiconductor structure with gate-all-around devices and stacked finfet devices
US-2024186187-A1 · Jun 6, 2024 · US
US10511151B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-10511151-B2 |
| Application number | US-201615759986-A |
| Country | US |
| Kind code | B2 |
| Filing date | Sep 14, 2016 |
| Priority date | Sep 15, 2015 |
| Publication date | Dec 17, 2019 |
| Grant date | Dec 17, 2019 |
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A method for fabricating a nanostructure comprises the steps of growing a first nanowire on a substrate, forming a dielectric layer on the substrate, the dielectric layer surrounding the first nanowire, wherein a thickness of the dielectric layer is smaller than a length of the first nanowire, and removing the first nanowire from the dielectric layer, thereby exposing an aperture in the dielectric layer.
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What is claimed is: 1. A method for fabricating a nanostructure, comprising: growing a first nanowire on a substrate; forming a dielectric layer on said substrate, said dielectric layer surrounding said first nanowire, wherein a thickness of said dielectric layer is smaller than a length of said first nanowire; and removing said first nanowire from said dielectric layer, thereby exposing an aperture in said dielectric layer; and growing a second nanowire in said aperture on said substrate wherein growing said second nanowire comprises growing a support element in said aperture, and extending said support element above said dielectric layer, and growing a body element around at least a portion of said support element that extends above said dielectric layer. 2. The method according to claim 1 , wherein growing said first nanowire on said substrate comprises: forming a mask layer on said substrate; forming an opening in said mask layer, wherein said opening extends to said substrate; and growing said first nanowire on said substrate in said opening. 3. The method according to claim 2 , wherein said mask layer is formed at a thickness no larger than 80 nm. 4. The method according to claim 1 , wherein said dielectric layer is formed on said substrate at a thickness of at least 100 nm. 5. The method according to claim 1 , wherein a diameter of said body element is at least two times larger than a diameter of said support element. 6. The method according to claim 1 , wherein said nanostructure is adapted to emit a laser signal at a wavelength λ, and a diameter of said support element is smaller than λ/(2n), wherein n denotes an index of refraction of said support element. 7. The method according to claim 1 , wherein said nanostructure is adapted to emit a laser signal at a wavelength λ, and a diameter of said body element is no smaller than λ/n, wherein n denotes an index of refraction of said body element. 8. The method according to claim 1 , wherein growing said first nanowire comprises molecular beam epitaxy or metal organic chemical vapor deposition. 9. The method according to claim 1 , wherein said first nanowire is grown in a direction perpendicular to an upper surface of said substrate. 10. The method according claim 1 , wherein said first nanowire is grown at an angle inclined to a surface normal of said substrate. 11. The method according to claim 4 , wherein said thickness of said dielectric layer is at least 150 nm. 12. The method according to claim 10 , wherein said diameter of said body element is at least three times larger than said diameter of said support element. 13. The method according to claim 10 , wherein said angle is at least 20 degrees. 14. A method for fabricating a nanostructure, comprising: growing a first nanowire on a substrate; forming a dielectric layer on said substrate, said dielectric layer surrounding said first nanowire, wherein a thickness of said dielectric layer is smaller than a length of said first nanowire; and removing said first nanowire from said dielectric layer, thereby exposing an aperture in said dielectric layer; wherein said nanostructure is adapted to emit a laser signal at a wavelength λ, wherein a thickness of said dielectric layer is an integer multiple of λ/(2n), wherein n denotes an index of refraction of said dielectric layer. 15. The method according to claim 14 , wherein said dielectric layer is formed on said substrate at a thickness of at least 100 nm. 16. The method according to claim 15 , wherein said thickness of said dielectric layer is at least 150 nm. 17. The method according to claim 14 , further comprising a step of growing a second nanowire in said aperture on said substrate; wherein growing said second nanowire comprises growing a support element in said aperture, and extending said support element above said dielectric layer, and growing a body element around at least a portion of said support element that extends above said dielectric layer. 18. The method according to claim 17 , wherein a diameter of said body element is at least two times larger than a diameter of said support element. 19. The method according to claim 17 , wherein said nanostructure is adapted to emit a laser signal at a wavelength λ, and a diameter of said support element is smaller than λ/(2n), wherein n denotes an index of refraction of said support element. 20. The method according to claim 17 , wherein said nanostructure is adapted to emit a laser signal at a wavelength λ, and a diameter of said body element is no smaller than λ/n, wherein n denotes an index of refraction of said body element.
Nanowires · CPC title
Arsenides · CPC title
characterised by the preparation of substrate for selective deposition · CPC title
using physical deposition, e.g. vacuum deposition or sputtering · CPC title
Manufacture or treatment of nanostructures · CPC title
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