Solar cell and method of manufacturing the same
US-2015144183-A1 · May 28, 2015 · US
US10505064B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-10505064-B2 |
| Application number | US-201615759672-A |
| Country | US |
| Kind code | B2 |
| Filing date | Aug 30, 2016 |
| Priority date | Sep 14, 2015 |
| Publication date | Dec 10, 2019 |
| Grant date | Dec 10, 2019 |
A practical reading order for non-experts. Skip the full description unless you need deep technical detail.
What the patent document calls the invention.
A short plain-language summary of the technical disclosure.
Who owns or filed the patent and who is credited as inventor.
Filing, priority, publication, and grant dates set the timeline.
The legal scope of protection — read this for what is actually claimed.
Technology tags used to group this patent with similar filings.
Prior art links and similar publications in this corpus.
Official abstract text for this publication.
A photovoltaic device 10 includes: a semiconductor substrate 1; an intrinsic amorphous semiconductor layer 3 provided on the semiconductor substrate 1; n-type amorphous semiconductor strips 4 containing phosphorus as a dopant; and p-type amorphous semiconductor strips 5 containing boron as a dopant, the n- and p-type amorphous semiconductor strips 4 and 5 being provided alternately on the intrinsic amorphous semiconductor layer 3 as viewed along an in-plane direction. Each n-type amorphous semiconductor strip 4 includes a reduced-thickness region TD(n) on a face thereof adjacent to one of the p-type amorphous semiconductor strips 5. Each p-type amorphous semiconductor strip 5 includes a reduced-thickness region TD(p) on a face thereof adjacent to one of the n-type amorphous semiconductor strips 4. The reduced-thickness region TD(p) of the p-type amorphous semiconductor strip 5 has a steeper angle of inclination than does the reduced-thickness region TD(n) of the n-type amorphous semiconductor strip 4.
Opening claim text (preview).
The invention claimed is: 1. A photovoltaic device comprising: a semiconductor substrate: n-type amorphous semiconductor strips containing phosphorus as a dopant; and p-type amorphous semiconductor strips containing boron as a dopant, the n- and p-type amorphous semiconductor strips being provided alternately on the semiconductor substrate as viewed along an in-plane direction of the semiconductor substrate, wherein: each of the n-type amorphous semiconductor strips includes a reduced-thickness region on a face thereof adjacent to one of the p-type amorphous semiconductor strips; each of the p-type amorphous semiconductor strips includes a reduced-thickness region on a face thereof adjacent to one of the n-type amorphous semiconductor strips; the reduced-thickness region of one of the p-type amorphous semiconductor strips has a steeper angle of inclination than does the reduced-thickness region of one of the n-type amorphous semiconductor strips: and the reduced-thickness region of one of the p-type amorphous semiconductor strips has a dopant concentration that is higher than a dopant concentration at a first point, where: the first point is a point at which each of the n-type amorphous semiconductor strips and p-type semiconductor strips formed on the semiconductor substrate has a maximum thickness; a second point is either a point at which a rate of decrease of the thickness of each of the n-type amorphous semiconductor strips and p-type semiconductor strips, as traced along an in-plane direction of each of the n-type amorphous semiconductor strips and p-type semiconductor strips, changes from a first rate of decrease to a second rate of decrease that is larger than the first rate of decrease or a point at which a rate of change of the thickness of each of the n-type amorphous semiconductor strips and p-type semiconductor strips, as traced along the in-plane direction of each of the n-type amorphous semiconductor strips and p-type semiconductor strips, changes sign from negative to positive; and the reduced-thickness region is a region from the first point to the second point as traced along the in-plane direction of each of the n-type amorphous semiconductor strips and p-type semiconductor strips. 2. The photovoltaic device according to claim 1 , wherein each of the n-type amorphous semiconductor strips is separated from each adjacent one of the p-type amorphous semiconductor strips by a distance of from 20 μm inclusive to 100 μm exclusive. 3. The photovoltaic device according to claim 1 , wherein the n- and p-type amorphous semiconductor strips are provided on a textured surface of the semiconductor substrate. 4. The photovoltaic device according to claim 1 , wherein each of the n- and p-type amorphous semiconductor strips is provided in a single stretch in a direction perpendicular to a direction in which the n- and p-type amorphous semiconductor strips tie adjacent to each other. 5. The photovoltaic device according to claim 1 , wherein either the n-type amorphous semiconductor strips or the p-type amorphous semiconductor strips or both are disposed spaced apart in a direction perpendicular to a direction in which the n- and p-type amorphous semiconductor strips lie adjacent to each other. 6. The photovoltaic device according to claim 1 , wherein the n- and p-type amorphous semiconductor strips are disposed alternately as viewed along two intersecting directions on the semiconductor substrate. 7. The photovoltaic device according to claim 1 , further comprising an intrinsic amorphous semiconductor layer provided on and in contact with the semiconductor substrate. 8. The photovoltaic device according to claim 1 , further comprising: first electrodes on the n-type amorphous semiconductor strips; and second electrodes on the p-type amorphous semiconductor strips, wherein: on each of the n-type amorphous semiconductor strips, each first electrode is in contact with at least a part of the reduced-thickness region of that n-type amorphous semiconductor strip; and on each of the p-type amorphous semiconductor strips, each second electrode is in contact with at least a part of the reduced-thickness region of that p-type amorphous semiconductor strip.
Electricity · mapped topic
Electricity · mapped topic
Photovoltaic [PV] energy · CPC title
Electricity · mapped topic
Electricity · mapped topic
Related publications grouped by family.
Answers are generated from the same data shown on this page.