Cell current control through power supply
US-9208895-B1 · Dec 8, 2015 · US
US10490291B1 · US · B1
| Field | Value |
|---|---|
| Publication number | US-10490291-B1 |
| Application number | US-201815961361-A |
| Country | US |
| Kind code | B1 |
| Filing date | Apr 24, 2018 |
| Priority date | Apr 24, 2018 |
| Publication date | Nov 26, 2019 |
| Grant date | Nov 26, 2019 |
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A memory check ASIC for fuzes and safety and arming (S&A) devices. The memory check ASIC may comprise: an ASIC, data line, clock line, shutdown line, and reset line. The ASIC may operatively couple to a microcontroller having a flash-based memory and may comprise: a digital logic for verifying a calculated checksum based on contents of the flash-based memory. A clock signal along with the calculated checksum may be transmitted to the ASIC via the clock line and data line, respectively. A shutdown signal may be transmitted from the ASIC to the microcontroller via the shutdown line in response to the verification of the calculated checksum by the digital logic. A reset signal may synchronize sampling of the calculated checksum and may be latched by flip-flop circuits of the digital logic for a predetermined number of clock cycles.
Opening claim text (preview).
What is claimed as new and desired to be protected by Letters Patent is set forth in the appended claims: 1. A method for verifying contents of a flash-based memory of a microcontroller for fuzes and safety and arming (S&A) devices using a memory check application-specific integrated circuit (ASIC), said memory check ASIC comprising an ASIC operatively coupled to said microcontroller via at least: a data line, a clock line, and a shutdown line, said method comprising: installing a resistor and a capacitor into a resistor terminal and a capacitor terminal of said ASIC, respectively, to configure a predetermined time interval of a timeout period; wherein said resistor has a resistance between approximately 0.5 to 5 megaohms; and wherein said capacitor has a capacitance between approximately 50 to 250 nanofarads; monitoring, by said ASIC, said data line for a serial data in order to obtain a calculated checksum; and transmitting a timeout signal by said ASIC via a timeout line when said microcontroller does not transmit said calculated checksum within said predetermined time interval of said timeout period. 2. A method for verifying contents of a flash-based memory of a microcontroller for fuzes and S&A devices using a memory check ASIC, said memory check ASIC comprising an ASIC operatively coupled to said microcontroller via at least: a data line, a clock line, and a shutdown line, said method comprising: calculating, by said microcontroller, a checksum associated with said contents of said flash-based memory of said microcontroller; communicating a serial data to said ASIC via said data line, said serial data including said calculated checksum; monitoring, by said ASIC, said data line for said serial data in order to obtain said calculated checksum; comparing, by a digital logic of said ASIC, said calculated checksum with a predetermined checksum to determine whether a checksum mismatch occurs, said checksum mismatch indicating invalid contents within said flash-based memory of said microcontroller; and transmitting, by said ASIC via said shutdown line, a shutdown signal to said microcontroller, in response to said determination of said checksum mismatch; wherein said ASIC comprises a reset line configured to receive a reset signal to synchronize sampling of said calculated checksum, said reset signal being latched by one or more flip-flop circuits of said digital logic and having a predetermined number of clock cycles.
wherein the safety or arming action is effected electrically · CPC title
Timing circuits · CPC title
Arrangements for verifying correct programming or erasure · CPC title
Testing or checking of ammunition {(apparatus for measuring the energy of projectiles G01L5/14)} · CPC title
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