Optical sensor, manufacturing method thereof, and fluid analysis method using the same

US10488333B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-10488333-B2
Application numberUS-201815935055-A
CountryUS
Kind codeB2
Filing dateMar 26, 2018
Priority dateJul 24, 2017
Publication dateNov 26, 2019
Grant dateNov 26, 2019

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

A method for manufacturing an optical sensor includes forming a reflective metal layer on a substrate, forming an insulator layer on the reflective metal layer, inducing self-assembly of a metal nanostructure layer on the insulator layer, and selectively etching the insulator layer through a reactive ion etching process to form a plurality of pillars and a plurality of spaces defined by the plurality of pillars. The method for manufacturing a plasmonic optical sensor according to this embodiment facilitates the formation of nanostructures difficult to pattern and form on the large scale at a low cost, and provides a plasmonic optical sensor with repeatability.

First claim

Opening claim text (preview).

What is claimed is: 1. A method for manufacturing an optical sensor, comprising: forming a reflective metal layer on a substrate; forming an insulator layer on the reflective metal layer; inducing self-assembly of a metal nanostructure layer including a plurality of nanoislands directly on the insulator layer opposite to the reflective metal layer without etching the metal nanostructure layer; and selectively etching the insulator layer using the self-assembled metal nanostructure layer as a mask to form a plurality of pillars under the plurality of nanoislands and a plurality of spaces defined by the plurality of pillars. 2. The method for manufacturing an optical sensor according to claim 1 , wherein the plurality of pillars includes a hydrophobic material. 3. The method for manufacturing an optical sensor according to claim 2 , wherein the hydrophobic material is amorphous fluoropolymer, and a refractive index of the plurality of pillars and a refractive index of the plurality of spaces are different. 4. The method for manufacturing an optical sensor according to claim 1 , wherein the reflective metal layer is a gold thin film layer, and a metal applied to the self-assembly of the metal nanostructure layer is gold. 5. The method for manufacturing an optical sensor according to claim 1 , wherein the forming of the reflective metal layer and the inducing of the self-assembly of the metal nanostructure layer are performed through a thermal evaporation process, and a thermal evaporation rate of the reflective metal layer is faster than a thermal evaporation rate of the nanostructure layer. 6. The method for manufacturing an optical sensor according to claim 5 , wherein the thermal evaporation rate in inducing the self-assembly of the metal nanostructure layer is 0.3 Å/s. 7. The method for manufacturing an optical sensor according to claim 1 , wherein the metal nanostructure layer is a nanoisland network structure in which the plurality of nanoislands is connected. 8. The method for manufacturing an optical sensor according to claim 1 , wherein selectively etching the insulator layer is performed on portions of the insulator layer where the self-assembled metal nanostructure layer does not overlap.

Assignees

Inventors

Classifications

  • using photo-electric detection (G01N21/31 takes precedence){; circuits for computing concentration (logarithmic circuits G06G7/24; photometric circuits in general G01J)} · CPC title

  • for microworking, e. g. etching of gratings or trimming of electrical components · CPC title

  • Etching microareas · CPC title

  • Electricity · mapped topic

  • Refractometers, e.g. differential · CPC title

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What does patent US10488333B2 cover?
A method for manufacturing an optical sensor includes forming a reflective metal layer on a substrate, forming an insulator layer on the reflective metal layer, inducing self-assembly of a metal nanostructure layer on the insulator layer, and selectively etching the insulator layer through a reactive ion etching process to form a plurality of pillars and a plurality of spaces defined by the plu…
Who is the assignee on this patent?
Korea Inst Sci & Tech
What technology area does this patent fall under?
Primary CPC classification G01N21/4133. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Nov 26 2019 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 2 related publications on this page (citations in our corpus or others sharing the same primary CPC).