Analog beam simulation for wired device testing in CP-OFDM systems

Patent metadata

Field	Value
Publication number	US-10484056-B2
Application number	US-201715666028-A
Country	US
Kind code	B2
Filing date	Aug 1, 2017
Priority date	Aug 1, 2017
Publication date	Nov 19, 2019
Grant date	Nov 19, 2019

Abstract

A test device for simulating analog beams applied to a DUT includes a memory that stores instructions and a processor that executes the instructions. When executed by the processor, the instructions cause the test device to perform a process that includes obtaining, from the memory and based on instructions received for testing the DUT, a predetermined power level for a beam to be simulated for the DUT and a predetermined time delay for the beam to be simulated for the DUT. The process also includes applying the predetermined power level for the beam and the predetermined time delay for the beam to a set of subcarriers and cyclic prefix orthogonal frequency-division multiplexing (CP-OFDM) symbol to obtain simulated characteristics of the beam from the perspective of the DUT. The process also includes sending, over a wired connection, the simulated characteristics of the beam from the processor to the DUT.

First claim

The invention claimed is:

1. A test device for simulating analog beams applied to a device under test (DUT), the test device comprising:
a memory that stores instructions; and
a processor that executes the instructions,
wherein, when executed by the processor, the instructions cause the test device to perform a process comprising:
obtaining, from the memory and based on received instructions for testing the DUT, a first predetermined power level for a first beam to be simulated for the DUT and a first predetermined time delay for the first beam to be simulated for the DUT;
applying the first predetermined power level for the first beam and the first predetermined time delay for the first beam to a first set of subcarriers and cyclic prefix orthogonal frequency-division multiplexing (CP-OFDM) symbol to obtain simulated characteristics of the first beam from a perspective of the DUT; and
sending, over a wired connection, the simulated characteristics of the first beam from the processor to the DUT for testing the DUT using the simulated characteristics of the first beam to simulate wireless communication without over-the-air (OTA) transmission.

2. The test device of claim 1 ,
wherein the test device comprises a network emulator.

3. The test device of claim 1 ,
wherein the simulated characteristics of the first beam are sent over the wired connection directly to an antenna port of the DUT to test the DUT using the simulated characteristics of the first beam when received by the antenna port connected to the DUT.

4. The test device of claim 1 ,
wherein the instructions for testing the DUT comprise a simulated type of antenna of the DUT.

5. The test device of claim 1 ,
wherein the instructions for testing the DUT comprise a simulated relative orientation of an antenna of the DUT and an antenna of the test device.

6. The test device of claim 1 ,
wherein the instructions for testing the DUT comprise a plurality of beams to be simulated in a configurable pattern for testing the DUT.

7. The test device of claim 6 ,
wherein the memory stores a correspondence between each of the plurality of beams and corresponding predetermined power levels and time delays for each of the plurality of beams.

8. The test device of claim 1 ,
wherein the instructions for testing the DUT specify the first beam, and
wherein the memory stores a correspondence between the first beam and the first predetermined power level and the first predetermined time delay for the first beam.

9. The test device of claim 1 ,
wherein, when executed by the processor, the instructions further cause the test device to perform a process comprising:
obtaining, from the memory and based on received instructions for testing the DUT, a second predetermined power level for a second beam to be simulated for the DUT and a second predetermined time delay for the second beam to be simulated for the DUT, and
applying the second predetermined power level for the second beam and the second predetermined time delay for the second beam to a second set of subcarriers and cyclic prefix orthogonal frequency-division multiplexing (CP-OFDM) symbol to obtain simulated characteristics of the second beam from the perspective of the DUT, and
sending, over the wired connection, the simulated characteristics of the second beam from the test device to the DUT for further testing the DUT using the simulated characteristics of the second beam to simulate wireless communication without OTA transmission.

10. The test device of claim 9 , further comprising:
a cyclic prefix orthogonal frequency-division multiplexing transmitter,
wherein the first beam and the second beam are simulated to be originated from the cyclic prefix orthogonal frequency-division multiplexing transmitter.

11. The test device of claim 10 ,
wherein each of the first beam and the second beam corresponds to a different cyclic prefix orthogonal frequency-division multiplexing subcarrier.

12. The test device of claim 10 ,
wherein each of the first beam and the second beam corresponds to a different cyclic prefix orthogonal frequency-divisional multiplexing symbol.

13. The test device of claim 1 ,
wherein the DUT comprises a base station that communicates via analog beamforming.

14. The test device of claim 1 ,
wherein, when executed by the processor, the instructions further cause the test device to perform a process comprising:
applying the first predetermined time delay as a phase rotation that changes based on subcarrier position in a beam model of the first beam; and
performing Inverse Fast Fourier Transform (IFFT) on the beam model to obtain a transformed beam model in which the phase rotation is converted to a cyclic time shift in a time domain.

15. A network emulator for simulating analog beams applied to a device under test (DUT), the network emulator comprising:
a memory that stores instructions;
a processor that executes the instructions; and
a transmitter that sends simulated characteristics of a beam to the DUT over a wired connection,
wherein, when executed by the processor, the instructions cause the network emulator to perform a process comprising:
obtaining, from the memory and based on instructions received for testing the DUT, a predetermined power level for the beam to be simulated for the DUT and a predetermined time delay for the beam to be simulated for the DUT;
applying the predetermined power level for the beam and the predetermined time delay for the beam to a set of subcarriers and cyclic prefix orthogonal frequency-division multiplexing (CP-OFDM) symbol to obtain simulated characteristics of the beam from a perspective of the DUT, and
sending, via the transmitter over the wired connection, the simulated characteristics of the beam from the network emulator to the DUT for testing the DUT using the simulated characteristics of the beam to simulate wireless communication without over-the-air (OTA) transmission.

16. A method for simulating analog beams applied to a device under test (DUT), comprising:
obtaining, from a memory of a test device and based on instructions received for testing the DUT, a first predetermined power level and a first predetermined time delay for a first beam to be simulated for the DUT;
applying the first predetermined power level and the first predetermined time delay for the first beam to a first set of subcarriers and cyclic prefix orthogonal frequency-division multiplexing (CP-OFDM) symbol to obtain simulated characteristics of the first beam from a perspective of the DUT; and
testing the DUT in response to the simulated characteristics of the first beam by sending, over a wired connection, the simulated characteristics of the first beam from the test device to an antenna port of the DUT, simulating wireless communication without over-the-air (OTA) transmission.

17. The method of claim 16 , further comprising:
obtaining, from the memory and based on the instructions received for testing the DUT, a second predetermined power level and a second predetermined time delay for a second beam to be simulated for the DUT;
applying the second predetermined power level and the second predetermined time delay for the second beam to a second set of subcarriers and cyclic prefix orthogonal frequency-division multiplexing (CP-OFDM) symbol to obtain simulated characteristics of the second beam from the perspective of the DUT; and
further testing the DUT in response to the simulated characteristics of the second beam by sending, over the wired connection, the simulated characteristics of the sec

Assignees

• Keysight Technologies Inc

Inventors

• Garcia Javier Campos

Classifications

• H04L27/2636

  with FFT or DFT modulators, e.g. standard single-carrier frequency-division multiple access [SC-FDMA] transmitter or DFT spread orthogonal frequency division multiplexing [DFT-SOFDM] · CPC title

• H04B17/3912

  Simulation models, e.g. distribution of spectral power density or received signal strength indicator [RSSI] for a given geographic region · CPC title

• H04W24/06 Primary

  Testing, {supervising or monitoring} using simulated traffic · CPC title

• H04B7/0617

  for beam forming · CPC title

• H04B7/0417 Primary

  Feedback systems · CPC title