Package substrate and semiconductor package including the same
US-2024429153-A1 · Dec 26, 2024 · US
US10483246B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-10483246-B2 |
| Application number | US-201715465561-A |
| Country | US |
| Kind code | B2 |
| Filing date | Mar 21, 2017 |
| Priority date | Oct 15, 2013 |
| Publication date | Nov 19, 2019 |
| Grant date | Nov 19, 2019 |
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A press pack module includes a collector module terminal, an emitter module terminal, a gate module terminal, and an auxiliary module terminal. Each IGBT cassette within the module includes a set of shims, two contact pins, and an IGBT die. The first contact pin provides part of a first electrical connection between the gate module terminal and the IGBT gate pad. The second contact pin provides part of a second electrical connection between the auxiliary module terminal and a shim that in turn contacts the IGBT emitter pad. The electrical connection between the auxiliary emitter terminal and each emitter pad of the many IGBTs is a balanced impedance network. The balanced network is not part of the high current path through the module. By supplying a gate drive signal between the gate and auxiliary emitter terminals, simultaneous IGBT turn off in high speed and high current switching conditions is facilitated.
Opening claim text (preview).
What is claimed is: 1. A method comprising: providing a power semiconductor device die so that the power semiconductor device die is disposed between a pedestal of a disc-shaped bottom plate member and a disc-shaped top plate member, wherein the disc-shaped bottom plate member, the disc-shaped top plate member, and the power semiconductor device die are parts of a press pack semiconductor device module; providing a first conductive path between a first pad on the power semiconductor device die and a first terminal of the press pack semiconductor device module, wherein the first conductive path extends through a first contact pin that contacts the power semiconductor device die, and wherein the first conductive path extends through neither the disc-shaped top plate member nor the disc-shaped bottom plate member; and providing a second conductive path between a second pad on the power semiconductor device die and a second terminal of the press pack semiconductor device module, wherein the second conductive path extends through a second contact pin that contacts the power semiconductor device die, and wherein the second conductive path extends through neither the disc-shaped top plate member nor the disc-shaped bottom plate member. 2. The method of claim 1 , further comprising: providing a four-sided frame so that the four-sided frame is disposed around the pedestal, wherein the four-sided frame has a first channel through which the first contact pin extends, and wherein the four-sided frame has a second channel through which the second contact pin extends. 3. The method of claim 1 , wherein the first terminal of the press pack semiconductor device module is a gate terminal, and wherein the second terminal of the press pack semiconductor device module is an auxiliary emitter terminal. 4. The method of claim 1 , wherein the semiconductor device die is an Insulated Gate Bipolar Transistor (IBGT) device die, wherein the first pad on the IBGT device die is a gate pad, and wherein the second pad on the IBGT device die is an emitter pad. 5. The method of claim 1 , wherein the power semiconductor device module comprises a Printed Circuit Board (PCB), wherein the first conductive path extends through a first metal layer of the PCB, wherein the second conductive path extends through a second metal layer of the PCB, and wherein the first metal layer of the PCB is different from the second metal layer of the PCB. 6. The method of claim 5 , wherein the first conductive path extends through a surface mount resistor. 7. The method of claim 1 , further comprising: providing a third conductive path between a third pad on the power semiconductor device die and a third terminal of the press pack semiconductor device module; and providing a fourth conductive path between a fourth pad on the power semiconductor device die and a fourth terminal of the press pack semiconductor device module. 8. The method of claim 7 , wherein the third terminal of the press pack semiconductor device module is a main collector terminal, and wherein the fourth terminal of the press pack semiconductor device module is a main emitter terminal. 9. The method of claim 7 , wherein the third conductive path extends through the disc-shaped top plate member, and wherein the fourth conductive path extends through the disc-shaped bottom plate member. 10. The method of claim 1 , wherein the first contact pin is a first spring-loaded contact pin, and wherein the second contact pin is a second spring-loaded contact pin. 11. The method of claim 1 , wherein the second conductive path between the second pad and the second terminal extends through a branched and balanced impedance network. 12. The method of claim 11 , wherein a main current path through the press pack semiconductor device module does not extend through the branched and balanced impedance network. 13. The method of claim 1 , further comprising: receiving a control signal between the first terminal of the press pack semiconductor device module and the second terminal of the press pack semiconductor device module.
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