Filter component tuning using size adjustment

Patent metadata

Field	Value
Publication number	US-10476462-B2
Application number	US-201615351646-A
Country	US
Kind code	B2
Filing date	Nov 15, 2016
Priority date	Aug 3, 2016
Publication date	Nov 12, 2019
Grant date	Nov 12, 2019

Abstract

A method for tuning a filter component using size adjustment includes measuring a first frequency of a first resonant mode of a dielectric resonator component of an RF filter, said dielectric resonator component being a block of dielectric material having a cuboid shape with three pairs of opposite faces. The first resonant mode has an electric-field component oriented in a direction perpendicular to one of the pairs of opposite faces and parallel to the other two pairs of opposite faces. When a measured value of the first frequency of the first resonant mode is less than a desired value, dielectric material is removed uniformly from at least one face of the two pairs of opposite faces parallel to the electric-field component of the first resonant mode to maintain the cuboid shape of the block of dielectric material. The removal of the dielectric material may be by at least one of lapping, grinding, and milling. The first frequency of the first resonant mode is remeasured to check whether a remeasured value therefor is closer or equal to the desired value without exceeding the desired value. The method is also applicable for tuning multiple modes of dielectric resonator component in the form of a block of dielectric material having a cuboid shape, as well as for tuning multiple modes in dielectric resonator components in the form of blocks of dielectric material having cylindrical and spherical shapes.

First claim

What is claimed is:

1. A method comprising:
measuring a first frequency of a first resonant mode of a dielectric resonator component of an RF filter, said dielectric resonator component being a block of dielectric material having a cuboid shape with three pairs of opposite faces, said first resonant mode having an electric-field component oriented in a direction perpendicular to one of said pairs of opposite faces and parallel to the other two pairs of opposite faces;
when a measured value of said first frequency of said first resonant mode is less than a desired value, removing dielectric material uniformly from at least one face of the two pairs of opposite faces parallel to the electric-field component of the first resonant mode to maintain the cuboid shape of the block of dielectric material; and
remeasuring said first frequency of said first resonant mode to check whether a value of the remeasured first frequency is closer or equal to the desired value without exceeding the desired value, and
further comprising:
after measuring said first frequency of said first resonant mode, and before removing dielectric material uniformly from at least one face of the two pairs of opposite faces parallel to the electric-field component of the first resonant mode, measuring a second frequency of a second resonant mode of the dielectric resonator component of the RF filter, said second resonant mode having an electric-field component oriented in a direction perpendicular to the electric-field component of the first resonant mode and parallel to a pair of opposite faces;
when a measured value of said second frequency of said second resonant mode is less than a desired value, and before remeasuring said first frequency of said first resonant mode, removing dielectric material uniformly from at least one face of the two pairs of opposite faces parallel to the electric-field component of the second resonant mode to maintain the cuboid shape of the block of dielectric material; and
remeasuring the second frequency of said second resonant mode to check whether a value of the remeasured second frequency is closer or equal to a desired value for the second frequency without exceeding the desired value of the second frequency.

2. The method as claimed in claim 1 , wherein removing dielectric material uniformly from at least one face of the two pairs of opposite faces parallel to the electric-field component of the first resonant mode is performed by at least one of lapping, grinding, and milling.

3. The method as claimed in claim 1 , wherein removing dielectric material uniformly from at least one face of the two pairs of opposite faces parallel to the electric-field component of the second resonant mode is performed by at least one of lapping, grinding, and milling.

4. A method comprising:
measuring a first frequency of a first resonant mode of a dielectric resonator component of an RF filter, said dielectric resonator component being a block of dielectric material having a cuboid shape with three pairs of opposite faces, said first resonant mode having an electric-field component oriented in a direction perpendicular to one of said pairs of opposite faces and parallel to the other two pairs of opposite faces;
when a measured value of said first frequency of said first resonant mode is less than a desired value, removing dielectric material uniformly from at least one face of the two pairs of opposite faces parallel to the electric-field component of the first resonant mode to maintain the cuboid shape of the block of dielectric material; and
remeasuring said first frequency of said first resonant mode to check whether a value of the remeasured first frequency is closer or equal to the desired value without exceeding the desired value, and
further comprising:
after measuring said first frequency of said first resonant mode, and before removing dielectric material uniformly from at least one face of the two pairs of opposite faces parallel to the electric-field component of the first resonant mode, measuring a second frequency and a third frequency of a second resonant mode and a third resonant mode, respectively, of the dielectric resonator component of the RF filter, said second and third resonant modes having respective electric-field components oriented in directions perpendicular to the electric-field component of the first resonant mode, perpendicular to each other, and parallel to pairs of opposite faces;
when measured values of said second frequency and said third frequency of said second resonant mode and said third resonant mode, respectively, are less than desired values, and before remeasuring said first frequency of said first resonant mode, removing dielectric material uniformly from at least one face of the two pairs of opposite faces parallel to the electric-field component of the second resonant mode and from at least one face of the two pairs of opposite faces parallel to the electric-field component of the third resonant mode to maintain the cuboid shape of the block of dielectric material; and
remeasuring said second frequency and said third frequency of said second resonant mode and said third resonant mode, respectively, to check whether values of the remeasured second frequency and remeasured third frequency are closer or equal to desired values for the second and third frequencies without exceeding the desired values of the second and third frequencies.

5. The method as claimed in claim 4 , removing dielectric material uniformly from at least one face of the two pairs of opposite faces parallel to the electric-field component of the second resonant mode and from at least one face of the two pairs of opposite faces parallel to the electric-field component of the third resonant mode is performed by at least one of lapping, grinding, and milling.

6. The method as claimed in claim 4 , wherein removing dielectric material uniformly from at least one face of the two pairs of opposite faces parallel to the electric-field component of the first resonant mode is performed by at least one of lapping, grinding, and milling.

Assignees

• Nokia Solutions & Networks Oy

Inventors

• Cooper Steven J
• Hendry David R
• Hurley Brian

Classifications

• H01P7/105

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