Devices and methods for smart sensor application

Patent metadata

Field	Value
Publication number	US-10466296-B2
Application number	US-201715433862-A
Country	US
Kind code	B2
Filing date	Feb 15, 2017
Priority date	Jan 9, 2017
Publication date	Nov 5, 2019
Grant date	Nov 5, 2019

Abstract

An apparatus comprises a load resistance connectable in series with the electronic sensor to form a series resistance of the load resistance and the internal impedance of the electronic sensor; an excitation circuit configured to apply a predetermined voltage to a circuit element; and a measurement circuit configured to: initiate applying the predetermined voltage to the series resistance and determining the series resistance; initiate applying the predetermined voltage to the load resistance and determining the load resistance; and calculate the internal impedance of the sensor using the determined series resistance and the load resistance, and provide the calculated internal impedance to a user or process.

First claim

What is claimed is:

1. A test circuit comprising:
an adjustable bridge resistance and a calibration resistance for coupling to an electronic sensor;
an excitation circuit configured to apply an excitation signal to the electronic sensor, bridge resistance and calibration resistance; and
a measurement circuit configured to:
apply a first excitation signal to a calibration resistance and measure a calibration current;
apply the first excitation signal to a first bridge resistance and measure a first bridge current;
apply a second excitation signal to the first bridge resistance and measure a second bridge current;
apply the second excitation signal to the sensor and measure a sensor current; and
calculate the internal impedance of the sensor using the calibration resistance, the calibration current, the first bridge current, the second bridge current, and the sensor current.

2. The test circuit of claim 1 , including a multiplexer circuit configured to selectively apply an excitation signal to the calibration resistance, the adjustable bridge resistance, or the sensor.

3. The test circuit of claim 2 , wherein the multiplexer circuit is configured to apply an excitation signal to the calibration resistance, and the measurement circuit is configured to calculate the calibration resistance using the excitation signal.

4. The test circuit of claim 1 , wherein the measurement circuit is configured to set the bridge resistance to a coarse bridge resistance value prior to the applying the excitation signal to the bridge resistance.

5. The test circuit of claim 1 , wherein the measurement circuit is configured to:
apply a third excitation signal to the first bridge resistance and measure a third bridge current, apply the third excitation signal to a second bridge resistance and measure a fourth bridge current, and calculate the internal impedance of the sensor using the calibration resistance, the calibration current, the first bridge current, the second bridge current, the third bridge current, the fourth bridge current, and the sensor current.

6. The test circuit of claim 1 , wherein the electronic sensor is an electrochemical sensor and the impedance of the electrochemical sensor is representative of the remaining useful life of the electrochemical sensor.

7. A method of monitoring an electronic sensor using a test circuit, the method comprising:
applying a first excitation signal to a calibration resistance of the test circuit and measuring a calibration current;
applying the first excitation signal to a first bridge resistance of the test circuit and measuring a first bridge current;
applying a second excitation signal to the first bridge resistance and measuring a second bridge current;
applying the second excitation signal to the electronic sensor and measuring a sensor current; and
calculating the internal impedance of the electronic sensor using the calibration resistance, the calibration current, the first bridge current, the second bridge current, and the sensor current.

8. The method of claim 7 , wherein applying the first excitation signal and the second excitation signal includes selectively applying the first and second excitation signals to the calibration resistance, the adjustable bridge resistance, or the sensor using a multiplexer circuit.

9. The method of claim 7 , including applying the first excitation signal to the calibration resistance, and calculating the calibration resistance using the first excitation signal.

10. The method of claim 7 , including setting the bridge resistance to a coarse bridge resistance value prior to the applying the excitation signal to the bridge resistance.

11. The method of claim 7 , including:
applying a third excitation signal to the first bridge resistance and measuring a third bridge current;
applying the third excitation signal to a second bridge resistance and measuring a fourth bridge current; and
calculating the internal impedance of the sensor using the calibration resistance, the calibration current, the first bridge current, the second bridge current, the third bridge current, the fourth bridge current, and the sensor current.

12. The method of claim 7 , wherein calculating the internal impedance of the electronic sensor includes calculating the internal impedance of an electrochemical sensor.

13. An integrated circuit comprising:
a bridge resistance and a calibration resistance for coupling to an electronic sensor;
an excitation circuit configured to generate excitation signals; and
a measurement circuit configured to:
determine a calibration current in response to a first excitation signal applied to the calibration resistance;
determine a first bridge current in response to the first excitation signal applied to the bridge resistance;
determine a second bridge current in response to a second excitation signal applied to the bridge resistance;
determine a sensor current in response to the second excitation signal applied to the sensor; and
calculate an internal impedance of the electronic sensor using the calibration resistance, the calibration current, the first bridge current, the second bridge current, and the sensor current.

14. The integrated circuit of claim 13 , including a multiplexer circuit coupled to the excitation circuit and configured to selectively apply an excitation signal generated by the excitation circuit to the calibration resistance, the bridge resistance, or the sensor.

15. The integrated circuit of claim 13 , wherein the measurement circuit is configured to calculate a resistance value of the calibration resistance using an excitation signal generated by the excitation circuit and applied to the calibration resistance.

16. The integrated circuit of claim 13 , wherein the bridge resistance is adjustable, and the measurement circuit is configured to set the bridge resistance to a coarse bridge resistance value prior to the applying the excitation signal to the bridge resistance.

17. The integrated circuit of claim 13 , wherein the bridge resistance is adjustable and the measurement circuit is configured to:
apply a third excitation signal to a first bridge resistance value and measure a third bridge current, apply the third excitation signal to a second bridge resistance value and measure a fourth bridge current, and calculate the internal impedance of the sensor using the calibration resistance, the calibration current, the first bridge current, the second bridge current, the third bridge current, the fourth bridge current, and the sensor current.

18. The integrated circuit of claim 13 , wherein the electronic sensor is an electrochemical sensor and the internal impedance of the electronic sensor is representative of the remaining useful life of the electrochemical sensor.

19. The integrated circuit of claim 13 , including the electronic sensor.

20. The integrated circuit of claim 13 , wherein the bridge resistance is adjustable, and the measurement circuit includes a processor configured to set the bridge resistance to a resistance value between the calibration resistance and the internal impedance of the electronic sensor.

Assignees

• Analog Devices Global

Inventors

• Qu GuangYang
• Liu Yincai Tony
• Hao Baotian
• Wang Hanqing
• Mei Hengfang
• Luo Rengui
• Zhao Yimiao
• Ding Junbiao

Classifications

• G01R35/005

  Calibrating; Standards or reference devices, e.g. voltage or resistance standards, "golden" references (G01R33/0035, G01R35/002 take precedence) · CPC title

• G01R27/16

  Measuring impedance of element or network through which a current is passing from another source, e.g. cable, power line · CPC title

• G01R27/02

  Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant (by measuring phase angle only G01R25/00) · CPC title

• G01R31/2829 Primary

  Testing of circuits in sensor or actuator systems (testing of apparatus for measuring electric or magnetic variables G01R35/00; testing of indicating or recording apparatus G01D; in airbag systems B60R21/0173; checking gas analysers G01N33/007; monitoring or fail-safe circuits for electromagnets H01F7/1844) · CPC title

• G01N27/4163

  checking the operation of, or calibrating, the measuring apparatus (G01N27/3274, G01N27/4175 and G01N33/0006 take precedence) · CPC title