Systems and Methods for Performing Radio-Frequency Testing on Near-Field Communications Circuitry
US-2016037286-A1 · Feb 4, 2016 · US
US10466291B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-10466291-B2 |
| Application number | US-201615394247-A |
| Country | US |
| Kind code | B2 |
| Filing date | Dec 29, 2016 |
| Priority date | Dec 29, 2016 |
| Publication date | Nov 5, 2019 |
| Grant date | Nov 5, 2019 |
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A signal processing unit for testing an electronic device under test includes a test chamber for accommodating the device under test, the test chamber including first electrical contacts, and a main housing including a receiving portion for receiving the test chamber, and including second electrical contacts that contact the first electrical contacts of the test chamber in an inserted stated of the test chamber.
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The invention claimed is: 1. A signal processing unit for testing an electronic device under test, the signal processing unit comprising: a test chamber for accommodating the device under test, the test chamber comprising first electrical contacts, and a main housing comprising a receiving portion for receiving the test chamber, and comprising second electrical contacts that contact the first electrical contacts of the test chamber in an inserted state of the test chamber, the receiving portion comprising one or more springs to secure the test chamber in the inserted state, wherein the test chamber is detachably coupled to the receiving portion, and wherein the main housing comprises a locking device for locking the test chamber in position, wherein the test chamber comprises a shielded housing with a removable cover, the shielded housing forming a compartment for receiving the device under test, and the shielded housing shields the inside of the shielded housing from electromagnetic waves. 2. The signal processing unit of claim 1 , wherein the test chamber is permanently coupled to the receiving portion. 3. The signal processing unit of claim 1 , wherein the test chamber is detachably coupled to the receiving portion. 4. The signal processing unit of claim 3 , wherein the main housing comprises a locking device for locking the test chamber in position. 5. The signal processing unit of claim 1 , wherein the test chamber comprises a transparent section. 6. The signal processing unit of claim 5 , wherein the transparent section comprises a shielding, especially a metallic shielding. 7. The signal processing unit of claim 1 , wherein the test chamber comprises on the inside one or more wired test connectors for contacting the device under test, wherein the wired test connectors are coupled to respective ones of the first electrical contacts. 8. The signal processing unit of claim 1 , wherein the test chamber comprises on the inside antennas that are connected to respective ones of the first electrical contacts. 9. The signal processing unit of claim 1 , wherein the test chamber comprises a number of cameras for recording the device under test. 10. The signal processing unit of claim 1 , wherein the receiving portion comprises a number of RF shield contacts configured to contact the test chamber via a low impedance connection. 11. The signal processing unit of claim 1 , comprising signal processing means for providing signals to the test chamber via the second electrical contacts and/or for receiving signals from the test chamber via the second electrical contacts. 12. The signal processing unit of claim 1 , wherein the main housing comprises a user interface and/or a data interface. 13. A signal processing method for testing an electronic device under test, the signal processing method comprising: providing a test chamber for accommodating the device under test, the test chamber comprising first electrical contacts, the test chamber comprising a shielded housing with a removable cover, the shielded housing forming a compartment for receiving the device under test, and the shielded housing shields the inside of the shielded housing from electromagnetic waves, providing a main housing comprising a receiving portion for receiving the test chamber, and comprising second electrical contacts, the receiving portion comprising one or more springs to secure the test chamber in the inserted state, wherein the test chamber is detachably coupled to the receiving portion, and wherein the main housing comprises a locking device for locking the test chamber in position, and contacting the first electrical contacts of the test chamber in an inserted state of the test chamber with the second electrical contacts. 14. The signal processing method of claim 13 , comprising coupling the test chamber permanently to the receiving portion. 15. The signal processing method of claim 13 , comprising coupling the test chamber detachably to the receiving portion. 16. The signal processing method of claim 15 , comprising locking the test chamber in position with a locking device in the main housing. 17. The signal processing method of claim 13 , comprising providing the test chamber with a transparent section in the housing, especially wherein the transparent section comprises a metallic shielding. 18. The signal processing method of claim 13 , comprising contacting the device under test with at least one wired test connector on the inside of the test chamber, wherein the wired test connectors are coupled to respective ones of the first electrical contacts, and/or comprising transmitting signals to the device under test or receiving signals from the device under test via antennas on the inside of the test chamber that are connected to respective ones of the first electrical contacts. 19. The signal processing method of claim 13 , comprising providing a number of cameras in the test chamber for recording the device under test. 20. The signal processing method of claim 13 , comprising contacting the test chamber via a low impedance connection via a number of RF shield contacts of the receiving portion. 21. The signal processing method of claim 13 , comprising providing signals to the test chamber via the second electrical contacts and/or receiving signals from the test chamber via the second electrical contacts with signal processing means in the main housing. 22. The signal processing method of claim 13 , providing a user interface and/or a data interface in the main housing.
Screening arrangements against electric or magnetic fields, e.g. against earth's field · CPC title
where the device under test is an electronic circuit · CPC title
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