Signal processing unit and signal processing method

US10466291B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-10466291-B2
Application numberUS-201615394247-A
CountryUS
Kind codeB2
Filing dateDec 29, 2016
Priority dateDec 29, 2016
Publication dateNov 5, 2019
Grant dateNov 5, 2019

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

A signal processing unit for testing an electronic device under test includes a test chamber for accommodating the device under test, the test chamber including first electrical contacts, and a main housing including a receiving portion for receiving the test chamber, and including second electrical contacts that contact the first electrical contacts of the test chamber in an inserted stated of the test chamber.

First claim

Opening claim text (preview).

The invention claimed is: 1. A signal processing unit for testing an electronic device under test, the signal processing unit comprising: a test chamber for accommodating the device under test, the test chamber comprising first electrical contacts, and a main housing comprising a receiving portion for receiving the test chamber, and comprising second electrical contacts that contact the first electrical contacts of the test chamber in an inserted state of the test chamber, the receiving portion comprising one or more springs to secure the test chamber in the inserted state, wherein the test chamber is detachably coupled to the receiving portion, and wherein the main housing comprises a locking device for locking the test chamber in position, wherein the test chamber comprises a shielded housing with a removable cover, the shielded housing forming a compartment for receiving the device under test, and the shielded housing shields the inside of the shielded housing from electromagnetic waves. 2. The signal processing unit of claim 1 , wherein the test chamber is permanently coupled to the receiving portion. 3. The signal processing unit of claim 1 , wherein the test chamber is detachably coupled to the receiving portion. 4. The signal processing unit of claim 3 , wherein the main housing comprises a locking device for locking the test chamber in position. 5. The signal processing unit of claim 1 , wherein the test chamber comprises a transparent section. 6. The signal processing unit of claim 5 , wherein the transparent section comprises a shielding, especially a metallic shielding. 7. The signal processing unit of claim 1 , wherein the test chamber comprises on the inside one or more wired test connectors for contacting the device under test, wherein the wired test connectors are coupled to respective ones of the first electrical contacts. 8. The signal processing unit of claim 1 , wherein the test chamber comprises on the inside antennas that are connected to respective ones of the first electrical contacts. 9. The signal processing unit of claim 1 , wherein the test chamber comprises a number of cameras for recording the device under test. 10. The signal processing unit of claim 1 , wherein the receiving portion comprises a number of RF shield contacts configured to contact the test chamber via a low impedance connection. 11. The signal processing unit of claim 1 , comprising signal processing means for providing signals to the test chamber via the second electrical contacts and/or for receiving signals from the test chamber via the second electrical contacts. 12. The signal processing unit of claim 1 , wherein the main housing comprises a user interface and/or a data interface. 13. A signal processing method for testing an electronic device under test, the signal processing method comprising: providing a test chamber for accommodating the device under test, the test chamber comprising first electrical contacts, the test chamber comprising a shielded housing with a removable cover, the shielded housing forming a compartment for receiving the device under test, and the shielded housing shields the inside of the shielded housing from electromagnetic waves, providing a main housing comprising a receiving portion for receiving the test chamber, and comprising second electrical contacts, the receiving portion comprising one or more springs to secure the test chamber in the inserted state, wherein the test chamber is detachably coupled to the receiving portion, and wherein the main housing comprises a locking device for locking the test chamber in position, and contacting the first electrical contacts of the test chamber in an inserted state of the test chamber with the second electrical contacts. 14. The signal processing method of claim 13 , comprising coupling the test chamber permanently to the receiving portion. 15. The signal processing method of claim 13 , comprising coupling the test chamber detachably to the receiving portion. 16. The signal processing method of claim 15 , comprising locking the test chamber in position with a locking device in the main housing. 17. The signal processing method of claim 13 , comprising providing the test chamber with a transparent section in the housing, especially wherein the transparent section comprises a metallic shielding. 18. The signal processing method of claim 13 , comprising contacting the device under test with at least one wired test connector on the inside of the test chamber, wherein the wired test connectors are coupled to respective ones of the first electrical contacts, and/or comprising transmitting signals to the device under test or receiving signals from the device under test via antennas on the inside of the test chamber that are connected to respective ones of the first electrical contacts. 19. The signal processing method of claim 13 , comprising providing a number of cameras in the test chamber for recording the device under test. 20. The signal processing method of claim 13 , comprising contacting the test chamber via a low impedance connection via a number of RF shield contacts of the receiving portion. 21. The signal processing method of claim 13 , comprising providing signals to the test chamber via the second electrical contacts and/or receiving signals from the test chamber via the second electrical contacts with signal processing means in the main housing. 22. The signal processing method of claim 13 , providing a user interface and/or a data interface in the main housing.

Assignees

Inventors

Classifications

  • Screening arrangements against electric or magnetic fields, e.g. against earth's field · CPC title

  • G01R31/002Primary

    where the device under test is an electronic circuit · CPC title

Patent family

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Frequently asked questions

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What does patent US10466291B2 cover?
A signal processing unit for testing an electronic device under test includes a test chamber for accommodating the device under test, the test chamber including first electrical contacts, and a main housing including a receiving portion for receiving the test chamber, and including second electrical contacts that contact the first electrical contacts of the test chamber in an inserted stated of…
Who is the assignee on this patent?
Rohde & Schwarz
What technology area does this patent fall under?
Primary CPC classification G01R31/002. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Nov 05 2019 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 1 related publication on this page (citations in our corpus or others sharing the same primary CPC).