Jig for sample for solar photovoltaic device and solar simulator including the same

Patent metadata

Field	Value
Publication number	US-10465868-B2
Application number	US-201715788049-A
Country	US
Kind code	B2
Filing date	Oct 19, 2017
Priority date	Oct 19, 2016
Publication date	Nov 5, 2019
Grant date	Nov 5, 2019

Abstract

A jig for a sample for a solar photovoltaic device is disclosed. The jig includes a cradle unit supporting the sample and a contact unit including at least one probe pin coming into contact with a busbar of the sample located in the cradle unit. The contact unit includes a coupling plate coupled with the cradle unit and at least one contact bar including a PCB and connected to the coupling plate, the contact bar having at least one probe pin aligned with the busbar of the sample with interposition of a probe pin connecting block. the jig includes a rotation support unit coupled with the cradle unit by a rotation shaft to allow the cradle unit to be rotated at an angle of 180° or greater so that upper and lower surfaces of the sample supported by the cradle unit are reversed.

First claim

The invention claimed is:

1. A jig for a sample for a solar photovoltaic device, the jig comprising:
a cradle unit supporting the sample for the solar photovoltaic device; and
a contact unit including at least one probe pin coming into contact with a busbar of the sample located at the cradle unit,
wherein the contact unit includes:
a coupling plate coupled with the cradle unit; and
at least one contact bar composed of a PCB (Printed Circuit Board) and being connected to the coupling plate, the contact bar having the at least one probe pin arranged and fixed at the contact bar to be aligned with the busbar of the sample with interposition of at least one probe pin connecting block,

the jig further comprising:
a rotation support unit coupled with the cradle unit by a rotation shaft so as to allow the cradle unit to be rotated at an angle equal to or greater than 180% so that upper and lower surfaces of the sample supported by the cradle unit are reversed.

2. The jig of claim 1 , wherein the probe pin connecting block is provided with a hole at one end thereof to allow the probe pin to be inserted into the hole, and a connection part at an opposite end thereof to be electrically connected with the contact bar.

3. The jig of claim 2 , wherein, at the contact bar, at least one electric signal transmitting pad is installed to transmit a signal from the probe pin to a circuit of the contact bar, and the connection part of the probe pin connecting block is connected to a desired location of the electric signal transmitting pad by soldering in order to adjust a position of the probe pin on the contact bar.

4. The jig of claim 3 , wherein, at a front surface of the contact bar, at least one first electric signal transmitting pad is provided and at a back surface thereof, at least one second electric signal transmitting pad is provided,
wherein the first electric signal transmitting pad receives a first signal of the sample output from the probe pin connected thereto and transmits the first signal to a circuit of the front surface, and
the second electric signal transmitting pad receives a second signal which is output from the probe pin connected thereto and is an electric signal different from the first signal, and transmits the second signal to a circuit of the back surface.

5. The jig of claim 4 , wherein the first signal and the second signal each are a current signal or a voltage signal.

6. The jig of claim 1 , wherein the cradle unit includes a cradle plate being provided with an installation space for the sample and being configured to be replaced depending on type and structure of the sample.

7. The jig of claim 1 , wherein the cradle unit includes a cradle plate being provided with an installation space for the sample, the cradle plate being coupled with the sample by a structure which can be modified or replaced depending on type and structure of the sample.

8. The jig of claim 1 , wherein the sample is a bifacial light receiving type sample, and the contact unit includes an upper contact portion contacting with an upper busbar of the bifacial light receiving type sample and a lower contact portion contacting with a lower busbar of the bifacial light receiving type sample.

9. The jig of claim 1 , wherein the rotation support unit includes an angle adjusting device that regulates an angle of the cradle unit coupled thereto by the rotation shaft.

10. The jig of claim 1 , wherein the contact bar is provided at the coupling plate to be controlled depending on the number and location of the busbar formed at the sample supported by the cradle unit.

11. The jig of claim 1 , wherein the cradle unit is made of an aluminum material of which a surface is treated through black anodizing.

12. The jig of claim 1 , wherein surfaces of the cradle unit, the contact unit and the rotation support unit are surface-treated or painted in one of black, green, and white.

13. A solar simulator, the simulator comprising:
a light source simulating sun light;
a sample jig cradling a sample for a solar photovoltaic device; and
a measuring device measuring characteristics of the sample,
wherein the sample jig is the jig of claim 1 .

Assignees

• Korea Inst Energy Res

Inventors

• Ahn Seung-Kyu
• Cho Jun-Sik
• Yun Jae-Ho
• Ahn Se-Jin
• Gwak Jihye
• Yoo Jin-Su
• Park Joo-Hyung
• Eo Young-Joo
• Cho Ara
• Kim Kihwan

Classifications

• F21S8/006 Primary

  Solar simulators, e.g. for testing photovoltaic panels · CPC title

• H02S50/10

  Testing of PV devices, e.g. of PV modules or single PV cells (testing of semiconductor devices during manufacturing {H10P74/00}) · CPC title

• G01R1/07307

  with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card · CPC title

• G01R1/0416

  Connectors, terminals (G01R1/0425 and G01R1/0433 take precedence; with measurement function for battery poles G01R31/364) · CPC title

• Y02E10/50

  Photovoltaic [PV] energy · CPC title