Image scanning apparatus and methods of operating an image scanning apparatus

Patent metadata

Field	Value
Publication number	US-10462322-B2
Application number	US-201816004237-A
Country	US
Kind code	B2
Filing date	Jun 8, 2018
Priority date	Dec 9, 2015
Publication date	Oct 29, 2019
Grant date	Oct 29, 2019

Abstract

Image scanning apparatus and method of operating an image scanning apparatus, the image scanning apparatus including a line scan detector and being configured to image a surface of an object mounted in the image scanning apparatus in a plurality of swathes, wherein each swathe is formed by a group of scan lines, each scan line being acquired using the scan line detector from a respective elongate region of the surface of the object extending in a scan width direction, wherein each group of scan lines is acquired whilst the object is moved relative to the scan line detector in a scan length direction.

First claim

The invention claimed is:

1. A method of operating an image scanning apparatus;
wherein the image scanning apparatus includes a line scan detector and is configured to image a surface of an object mounted in the image scanning apparatus in a plurality of swathes, wherein each swathe is formed by a group of scan lines, each scan line being acquired using the scan line detector from a respective elongate region of the surface of the object extending in a scan width direction, wherein each group of scan lines is acquired whilst the object is moved relative to the scan line detector in a scan length direction;
wherein the method includes:
using at least one scan line, acquired from a surface of a first object mounted in the image scanning apparatus using the scan line detector, to obtain at least one measure indicating that the surface of the first object is uneven or tilted in the scan width direction relative to an imaging plane of the image scanning apparatus,
setting a swathe width value for use in acquiring at least one swathe from a surface of a second object mounted in the image scanning apparatus, wherein the swathe width value is set based on the at least one measure and configured so as to keep each swathe acquired from the surface of the second object substantially in focus across its width in the scan width direction, and
acquiring at least one swathe from the surface of the second object using the scan line detector, wherein the at least one swathe acquired from the surface of the second object has a width in the scan width direction that corresponds to the swathe width value set based on the at least one measure.

2. The method of claim 1 , wherein the second object is the same object as the first object.

3. The method of claim 1 , wherein the at least one measure is calculated using the output of a focus merit function as calculated, for at least one scan line, at two or more positions offset from each other in the scan width direction.

4. The method of claim 1 , wherein the at least one measure includes at least one differential focus indicating a distance between (i) an in focus level at a first position on the surface of the first object; and (ii) an in focus level at a second position on the surface of the first object; wherein the first position and second position are offset from each other in the scan width direction.

5. The method of claim 4 , wherein the at least one differential focus is calculated using the output of a focus merit function as calculated, for at least one scan line, at two or more positions offset from each other in the scan width direction.

6. The method of claim 4 , wherein the at least one measure includes multiple differential focuses, and the multiple differential focuses are combined to provide a combined differential focus, with the swathe width value being set based on the combined differential focus.

7. The method of claim 1 , wherein the second object is the same object as the first object, and the method includes identifying one or more areas on the surface of the object suitable for acquiring the at least one scan line, and then subsequently acquiring at least one scan line from the one or more identified areas on the surface of the object.

8. The method of claim 1 , wherein a plurality of scan lines, from which the at least one measure is obtained, is acquired from a single elongate region of the surface of the first object extending in the scan width direction, with the image scanning apparatus having a different focus setting whilst each scan line is acquired.

9. The method of claim 1 , wherein a plurality of scan lines, from which the at least one measure is obtained, is a group of scan lines forming a swathe, with each scan line being acquired from a respective elongate region of the surface of the first object extending in the scan width direction whilst the first object is moved relative to the scan line detector in the scan length direction.

10. The method of claim 1 , wherein the second object is the same object as the first object, wherein a plurality of scan lines, from which the at least one measure is obtained, is a group of scan lines forming a swathe, the swathe having been acquired from the surface of the object using a dynamic focus tracking method in which the focus setting of the image scanning apparatus was adjusted whilst the swathe was acquired.

11. The method of claim 10 , wherein each time a new swathe is acquired from the surface of the object, scan lines forming the new swathe are used to obtain the at least one measure, with the swathe width value being set based on the at least one measure so that the swathe width value is set each time a new swathe is acquired.

12. The method of claim 1 , wherein if a swathe width value set based on a new swathe acquired from the surface of the object is smaller than a previously set swathe width value that was in use during the acquisition of the new swathe, then the width of the new swathe is reduced based on the smaller swathe width value that has been set based on the new swathe.

13. The method of claim 1 , wherein if a swathe width value set based on a new swathe acquired from the surface of the object is larger than a previously set swathe width value that was in use during the acquisition of the new swathe, then the width of the new swathe is increased based on the larger swathe width value that has been set based on the new swathe.

14. The method of claim 1 , wherein the at least one measure includes the output of a focus merit function as calculated, for at least one scan line, at two or more positions offset from each other in the scan width direction.

15. The method of claim 1 , wherein the scan line detector includes a linear array of photodetectors.

16. The method of claim 1 , wherein the swathe width value is set based on the at least one measure and a depth of focus of the image scanning apparatus, wherein the at least one measure and the depth of focus are used to set a swathe width value that is deemed to be a maximum useable swathe width for maximising the width of swathe acquired whilst keeping each swathe acquired from the surface of the second object substantially in focus across its width in the scan width direction.

17. The method of claim 1 , wherein the second object is a slide having a sample thereon, wherein the sample is a biological specimen.

18. The method of claim 1 , wherein the first object is a different object from the second object, and the first object is a target mounted in the image scanning apparatus.

19. An image scanning apparatus comprising a line scan detector and configured to:
image a surface of an object mounted in the image scanning apparatus in a plurality of swathes, wherein each swathe is formed by a group of scan lines, each scan line being acquired using the scan line detector from a respective elongate region of the surface of the object extending in a scan width direction, wherein each group of scan lines is acquired whilst the object is moved relative to the scan line detector in a scan length direction;
use at least one scan line, acquired from a surface of a first object mounted in the image scanning apparatus using the scan line detector, to obtain at least one measure indicating that the surface of the first object is uneven in the scan width direction relative to an imaging plane of the image scanning apparatus;
set a swathe width value for use in acquiring at least one swathe from a surface of a second object mounted in the image scanning apparatus, wherein the swathe width valu

Assignees

• Ventana Med Syst Inc

Inventors

• Gouch Martin Philip
• Hawes William Roland
• Schmid Joachim Helmut

Classifications

• G02B26/128

  Focus control · CPC title

• G02B26/123

  Multibeam scanners, e.g. using multiple light sources or beam splitters · CPC title

• H04N1/02409 Primary

  Focusing, i.e. adjusting the focus of the scanning head · CPC title

• H04N1/1043

  of a sensor array · CPC title