Sigma-delta analog-to-digital converter with multiple counters

Patent metadata

Field	Value
Publication number	US-10461771-B2
Application number	US-201816054877-A
Country	US
Kind code	B2
Filing date	Aug 3, 2018
Priority date	Mar 20, 2018
Publication date	Oct 29, 2019
Grant date	Oct 29, 2019

Abstract

In some examples, a sigma-delta analog-to-digital converter (ADC), comprises a first set of switches configured to receive a first voltage signal; a second set of switches coupled to the first set of switches at a first node and a second node, the second set of switches configured to receive a second voltage signal; an integrator including a first input sampling capacitor coupled to the first node and a second input sampling capacitor coupled to the second node, wherein the integrator configured to generate a first output signal. The sigma-delta ADC further comprises a comparator coupled to the integrator and configured to generate a second output signal based on the first output signal; and a controller unit having a first counter, a second counter, and a processor, the controller unit coupled to the first and second sets of switches, the integrator, and the comparator.

First claim

What is claimed is:

1. A sigma-delta analog-to-digital converter (ADC), comprising:
a first set of switches coupled to a first node and a second node, the first set of switches configured to receive a first voltage signal;
a second set of switches coupled to the first node and the second node, the second set of switches configured to receive a second voltage signal;
an integrator including a first input sampling capacitor coupled to the first node and a second input sampling capacitor coupled to the second node, wherein the integrator configured to generate a first output signal;
a comparator coupled to the integrator and configured to generate a second output signal based on the first output signal; and
a controller unit having a first counter, a second counter, and a processor, the controller unit coupled to the first and second sets of switches, the integrator, and the comparator,
wherein the processor is configured to increment a first counter value of the first counter based on the second output signal and a second counter value of the second counter based on the second output signal,
wherein the processor is configured to compute a value based on the first and second counter values;
wherein the controller unit is configured to change the first output signal based on the second output signal;
wherein if the second output signal is 1, the controller unit is configured to subtract the first output signal by the second voltage signal, wherein if the second output signal is 0, the controller unit is configured to add the first output signal with first voltage signal.

2. A sigma-delta analog-to-digital converter (ADC), comprising:
an integrator including a pair of input sampling capacitors that are coupled to a first node and second node, wherein the first and second nodes are configured to receive a first input voltage signal;
a digital-to-analog converter (DAC) coupled to the first and second nodes, wherein the DAC is configured to receive a feedback digital signal, and to generate a second input voltage signal, wherein the first and second nodes are configured to receive the second input voltage signal, wherein the integrator is configured to generate a first output signal based on either the first or second input voltage signal;
a comparator coupled to the integrator and configured to generate a second output signal based on the first output signal; and
a controller coupled to the comparator, integrator, and the DAC, wherein the controller is configured to compute a value based on the second output signal;
wherein the controller is configured to subtract the first output signal by the second input voltage signal when the second output signal is 1,
wherein the controller is configured to add the first output signal with first voltage signal when the second output signal is 0.

3. The sigma-delta ADC of claim 2 , wherein the value is indicative of a temperature value.

4. The sigma-delta ADC of claim 2 , wherein the sigma-delta ADC is configured to perform a pre-defined number of integration cycles M.

5. The sigma-delta ADC of claim 4 , wherein, after performing the pre-defined number of integration cycles M, the controller is configured to perform an additional number of integration cycles until the second output signal is 1.

Assignees

• Texas Instruments Inc

Inventors

• Doorenbos Jerry Lee
• Sanborn Keith Eric
• Vellore Avadhanam Ramamurthy Srikanth
• Nashed Mina Raymond Naguib
• Griffin Dwight David

Classifications

• H03M3/494 Primary

  Sampling or signal conditioning arrangements specially adapted for delta-sigma type analogue/digital conversion systems · CPC title

• G01K2219/00

  Thermometers with dedicated analog to digital converters · CPC title

• H03M3/464

  Details of the digital/analogue conversion in the feedback path · CPC title

• H03M3/38 Primary

  Calibration · CPC title

• H03M3/466

  Multiplexed conversion systems · CPC title