Apparatus for and method of providing measurements of uncertainty in respect of a transfer function

Patent metadata

Field	Value
Publication number	US-10459013-B2
Application number	US-201615185603-A
Country	US
Kind code	B2
Filing date	Jun 17, 2016
Priority date	Jun 17, 2016
Publication date	Oct 29, 2019
Grant date	Oct 29, 2019

Abstract

An apparatus is provided that can estimate a transfer function, for example of current measurement systems, voltage measurement systems and power measurement systems, and also provide an estimate of certainty about the transfer function. This enables customers to have confidence that they are not being overcharged for electricity.

First claim

The invention claimed is:

1. A transfer function measurement circuit for estimating a transfer function of an electronic system, the transfer function measurement circuit comprising:
a measurement circuit coupled to a sensor, wherein the transfer function measurement circuit estimates a value of a measurand or a correction factor associated with the electronic system, the transfer function measurement circuit being configured to:
provide a perturbation signal to the sensor using the measurement circuit,
measure a resulting signal through the sensor;
estimate, at different first and second points in time, respective first and second transfer functions of the electronic system based on the perturbation signal and the resulting signal;
compute a difference between the first and second transfer functions;
determine a level of confidence or uncertainty in at least one of the first and second transfer functions; and
perform an action associated with the electronic system based on the difference and the level of confidence or uncertainty, the action comprising at least one of adjusting operation of the electronic system or flagging a fault condition for attention.

2. A transfer function measurement circuit as claimed in claim 1 in which the difference is computed by calculating a standard deviation of the estimates of the transfer functions.

3. A transfer function measurement circuit as claimed in claim 1 in which the transfer function measurement circuit is further configured to update the first or second transfer functions based on the difference between the first or second transfer functions and a composite value formed as a running sum of weighted estimates of the first and second transfer functions, wherein the difference is weighted according to the level of confidence or uncertainty and then added to the composite value to create a new composite value.

4. A transfer function measurement circuit as claimed in claim 1 in which the level of confidence or uncertainty is used to modify the perturbation signal or to initiate a change in the perturbation signal when the level of confidence or uncertainty changes at a rate greater than a predetermined rate or exceeds a threshold.

5. A transfer function measurement circuit as claimed in claim 4 in which the threshold is a dynamic threshold based on previous estimates of the level of confidence or uncertainty.

6. A transfer function measurement circuit as claimed in claim 4 in which the threshold is a predetermined threshold.

7. A transfer function measurement circuit as claimed in claim 4 in which the change in the perturbation signal comprises changing at least one of a frequency and a magnitude of the perturbation signal.

8. A transfer function measurement circuit as claimed in claim 7 in which the frequency of the perturbation signal is changed to a frequency with reduced noise or harmonic energy.

9. A transfer function measurement circuit as claimed in claim 1 , in which the transfer functions are analyzed by a processor to perform at least one of calibration checking, fault diagnosis and tamper detection.

10. A transfer function measurement circuit as claimed in claim 1 , in which the transfer functions are transmitted to a remote entity for analysis to perform at least one of calibration checking, fault diagnosis and tamper detection.

11. A transfer function measurement circuit as claimed in claim 1 , in which the level of confidence or uncertainty is used to control at least one of: a modification or update of the transfer functions; the uses that the transfer functions can be validly used for; a modification or update of the correction factor, and whether the estimate of the transfer functions is replaced by a default value.

12. A transfer function measurement circuit as claimed in claim 11 in which updating of the transfer functions or the correction factor is inhibited if the level of confidence or uncertainty exceeds a threshold value.

13. A transfer function measurement circuit as claimed in claim 1 further comprising an extraction circuit that provides a measurement of the perturbation signal, the extraction circuit comprising a band pass filter that filters around a frequency of the perturbation signal.

14. A transfer function measurement apparatus as claimed in claim 1 wherein the transfer function measurement circuit is further configured to determine at least one of a magnitude of changes in the perturbation signal and a relative power of the perturbation signal to other signals to estimate a lower limit of uncertainty in the level of confidence or uncertainty.

15. The transfer function measurement circuit of claim 1 , wherein the first transfer function is determined when the electronic measurement system is manufactured.

16. The transfer function measurement circuit of claim 1 , wherein the first and second functions are computed during use of the electronic measurement system.

17. The transfer function measurement circuit of claim 1 , wherein the at least one of the first or second transfer function estimates is performed based on a plurality of transfer function estimations, and wherein the confidence or uncertainty is further determined based on the plurality of transfer function estimations.

18. The transfer function measurement circuit of claim 1 , wherein the electronic system is a power meter, wherein the sensor is a resistor, and wherein the perturbation signal is provided to the resistor using a current measurement circuit.

19. The transfer function measurement circuit of claim 18 , wherein the resulting signal is measured using a voltage measurement circuit.

20. A method of estimating a transfer function of an electronic system, the method comprising:
estimating, using a transfer function measurement circuit comprising a measurement circuit coupled to a sensor, a value of a measurand or a correction factor associated with the electronic system;
providing a perturbation signal to the sensor using the measurement circuit;
measuring a resulting signal through the sensor using the measurement circuit;
estimating, at different first and second points in time, respective first and second transfer functions of the electronic system based on the perturbation signal and the resulting signal;
computing a difference between the first and second transfer functions;
determining a level of confidence or uncertainty in at least one of the first and second transfer functions; and
performing an action associated with the electronic system based on the difference and the level of confidence or uncertainty, the action comprising at least one of adjusting operation of the electronic system or flagging a fault condition for attention.

21. A method as claimed in claim 20 , in which computing the difference comprises using one of a standard deviation and a t-test of the estimates of the transfer functions to estimate the certainty of the estimated transfer functions.

22. A method as claimed in claim 20 , further comprising changing a parameter of the perturbation signal if the confidence value is not within an acceptable range of values.

23. A method as claimed in claim 22 , in which the parameter of the perturbation signal is at least one of a frequency of the perturbation signal and an amplitude of the perturbation signal.

24. A method as claimed in claim 20 in which the confidence value is used for at least one of the following: controlling an update of the transfer func

Assignees

• Analog Devices Global

Inventors

• Hurwitz Jonathan Ephraim David
• Danesh Seyed Amir Ali
• Holland William Michael James
• Stuart John

Classifications

• G01R35/00

  Testing or calibrating of apparatus covered by the other groups of this subclass · CPC title

• G01R19/25 Primary

  using digital measurement techniques · CPC title

• G01D3/02 Primary

  with provision for altering or correcting the law of variation · CPC title

• G01R21/133

  by using digital technique · CPC title

• G01R27/28 Primary

  Measuring attenuation, gain, phase shift or derived characteristics of electric four pole networks, i.e. two-port networks; Measuring transient response (in line transmission systems H04B3/46) · CPC title