Laser processing system having function of cleaning laser optical path

US10456864B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-10456864-B2
Application numberUS-201615266259-A
CountryUS
Kind codeB2
Filing dateSep 15, 2016
Priority dateSep 17, 2015
Publication dateOct 29, 2019
Grant dateOct 29, 2019

How to read this patent

A practical reading order for non-experts. Skip the full description unless you need deep technical detail.

  1. Title

    What the patent document calls the invention.

  2. Abstract

    A short plain-language summary of the technical disclosure.

  3. Assignees and inventors

    Who owns or filed the patent and who is credited as inventor.

  4. Key dates

    Filing, priority, publication, and grant dates set the timeline.

  5. First independent claim

    The legal scope of protection — read this for what is actually claimed.

  6. CPC / IPC classifications

    Technology tags used to group this patent with similar filings.

  7. Citations and related patents

    Prior art links and similar publications in this corpus.

Abstract

Official abstract text for this publication.

A laser processing system herein includes a laser oscillator, a laser optical path that guides laser beam from a laser beam emission port of the laser oscillator to a workpiece, an impure gas absorbent for absorbing impure gases that influence the propagation of the laser beam, and a shutter that exposes the impure gas absorbent in the laser optical path.

First claim

Opening claim text (preview).

The invention claimed is: 1. A laser processing system comprising: a laser oscillator configured to oscillate a laser beam; a laser optical path comprising at least one of a pipe or bellows connecting the laser oscillator to a laser processing head, the at least one of the pipe or the bellows of the laser optical path guides the laser beam from the laser oscillator through a laser gas medium contained in the at least one of the pipe or the bellows of the optical path to the laser processing head for emission-towards an object to be processed; an impure gas absorbent integrated into the at least one of the pipe or the bellows of the laser optical path, the impure gas absorbent including material for absorbing an impure gas present in the at least one of the pipe or the bellows of the laser optical path, the impure gas influences propagation of the laser beam in the at least one of the pipe or the bellows of the laser optical path; and a shutter that is configured to expose the impure gas absorbent in the at least one of the pipe or the bellows of the laser optical path to absorb the impure gas in the at least one of the pipe or the bellows of the laser optical path a numerical value calculator configured to control the shutter to open and close. 2. The laser processing system according to claim 1 , further comprising a purge gas supply line for supplying a purge gas into the laser optical path. 3. The laser processing system according to claim 1 , further comprising an impure gas mixing detection device that is configured to detect that the impure gas was mixed in the laser optical path. 4. The laser processing system according to claim 3 , wherein the exposure function part is configured to expose the impure gas absorbent in the laser optical path when the impure gas mixing detection device detected that the impure gas was mixed in the laser optical path. 5. The laser processing system according to claim 3 , wherein the impure gas mixing detection device includes at least one gas sensor that detects the impure gas. 6. The laser processing system according to claim 3 , wherein the impure gas mixing detection device includes a microphone that detects that the impure gas was mixed in the laser optical path by collecting a sound when the laser beam propagates in the laser optical path. 7. The laser processing system according to claim 3 , wherein the impure gas mixing detection device includes a plate having an opening portion and a laser beam detector positioned in the opening portion to detect that the impure gas was mixed in the laser optical path by detecting spreading of the laser beam in the laser optical path. 8. The laser processing system according to claim 3 , wherein the impure gas mixing detection device includes a beam power measuring device that detects that the impure gas was mixed in the laser optical path by detecting decreasing of a power of the laser beam in the laser optical path.

Assignees

Inventors

Classifications

  • B23K26/128Primary

    Laser beam path enclosures · CPC title

  • B23K26/00Primary

    Working by laser beam, e.g. welding, cutting or boring · CPC title

  • Beam measuring devices · CPC title

  • Auxiliary operations or equipment · CPC title

  • using a fluid stream, e.g. a jet of gas, in conjunction with the laser beam; Nozzles therefor (B23K26/12 takes precedence) · CPC title

Patent family

Related publications grouped by family.

External sources

Frequently asked questions

Answers are generated from the same data shown on this page.

What does patent US10456864B2 cover?
A laser processing system herein includes a laser oscillator, a laser optical path that guides laser beam from a laser beam emission port of the laser oscillator to a workpiece, an impure gas absorbent for absorbing impure gases that influence the propagation of the laser beam, and a shutter that exposes the impure gas absorbent in the laser optical path.
Who is the assignee on this patent?
Fanuc Corp
What technology area does this patent fall under?
Primary CPC classification B23K26/128. Mapped technology areas include Operations & Transport.
When was this patent published?
Publication date Tue Oct 29 2019 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).