Scintillation detector with a high count rate

US10451750B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-10451750-B2
Application numberUS-201515531247-A
CountryUS
Kind codeB2
Filing dateOct 20, 2015
Priority dateNov 28, 2014
Publication dateOct 22, 2019
Grant dateOct 22, 2019

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

The invention concerns a scintillation detector with which high count rates and/or high resolutions are possible. The scintillator of the claimed scintillation detector is formed from pixels ( 2 ), which are separated from each other by interstices ( 4 ). Alternatively or additionally, the surface of the scintillator is divided by grooves into pixels ( 2 ). Such a structure enables not only a particularly high resolution. When multiple detector modules are used, it also allows high count rates in the range of roughly 20 MHz.

First claim

Opening claim text (preview).

The invention claimed is: 1. Scintillation detector having a scintillator, a light readout unit mounted behind it, and evaluation electronics, so that the light readout unit is between the scintillator and the evaluation electronics, wherein the scintillator is formed from pixels formed from scintillation material, which are separated from each other by interstices, or whose surface is pixelated by grooves, wherein the pixels are up to 8 mm long and up to 8 mm wide, wherein the scintillator comprises a carrier for the scintillation material, which generates light flashes in response to incident radiation, and wherein the carrier material has a lower magnitude of a complex index of refraction than the scintillation material. 2. Scintillation detector according to claim 1 , characterized in that at least one of the grooves and interstices are filled with reflection material for the light to be detected. 3. Scintillation detector according to claim 2 , characterized in that the reflection material consists of barium sulfate. 4. Scintillation detector according to claim 1 , characterized in that at least one of the distance between the pixels generated by the interstices amounts to at least 100 μm and the grooves are at least 100 μm wide. 5. Scintillation detector according to claim 1 , characterized in that the pixels are at least one of up to 6 mm, preferably up to 3 mm long and up to 6 mm, preferably up to 3 mm wide and that the pixels are at least one of at least 3 mm long and at least 3 mm wide. 6. Scintillation detector according to claim 1 , characterized in that the pixels contain 6Li. 7. Scintillation detector according to claim 1 , wherein the scintillator comprises a substrate for the scintillation material, which generates light flashes in response to incident radiation, which has a lower index of refraction than the scintillation material. 8. Scintillation detector according to claim 1 , wherein the scintillator comprises a substrate for the scintillation material, which generates light flashes in response to incident radiation, and wherein an adhesive layer that is at least one of light absorbing and light reflecting is installed between the substrate and the scintillation material. 9. Scintillation detector according to claim 1 , characterized in at least one of that pixels of the light readout unit, in particular the anodes of a multi-anode photomultiplier, are at least one of up to 6 mm, preferably up to 3 mm, long and up to 6 mm, preferably up to 3 mm, wide and that the pixels of the light readout unit, in particular the anodes of a multi-anode photomultiplier, are at least one of at least 3 mm long and at least 3 mm wide. 10. Scintillation detector according to claim 1 , characterized in that the base surface of the evaluation electronics does not exceed the size of the front surface of the light readout unit (multi-anode photomultiplier). 11. Scintillation detector according to claim 10 , characterized in that the scintillation detector is formed from a multiplicity of modules. 12. Scintillation detector according to claim 1 , characterized in that the evaluation electronics comprises one or more integrated electronic components, which conduct an amplification and noise filtering of the individual signals of the pixels of a light readout unit (multi-anode photomultiplier). 13. Scintillation detector according to claim 1 , characterized in that the evaluation electronics comprises a programmable logic device with internal storage areas, which takes over a number of tasks, specifically in particular a setting of at least one of the measurement modes and the comparator thresholds of integrated electronic components as well as registration of logic comparator signals that are summed up in a chronological order in internal storage places, just like also of data of an analog-to-digital converter, which are also summed up in internal storages.

Assignees

Inventors

Classifications

  • Optical details, e.g. reflecting or diffusing layers · CPC title

  • G01T3/06Primary

    with scintillation detectors · CPC title

  • with scintillation detectors · CPC title

  • using an array of optically separate scintillation elements permitting direct location of scintillations (G01T1/1645 takes precedence) · CPC title

  • using a combination of a scintillator and photodetector which measures the means radiation intensity · CPC title

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What does patent US10451750B2 cover?
The invention concerns a scintillation detector with which high count rates and/or high resolutions are possible. The scintillator of the claimed scintillation detector is formed from pixels ( 2 ), which are separated from each other by interstices ( 4 ). Alternatively or additionally, the surface of the scintillator is divided by grooves into pixels ( 2 ). Such a structure enables not only a p…
Who is the assignee on this patent?
Integrated Detector Electronics AS, Forschungszentrum Juelich Gmbh, Commissariat A Lenergie Atomique Et Aux Energies Cea, and 1 more
What technology area does this patent fall under?
Primary CPC classification G01T3/06. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Oct 22 2019 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 5 related publications on this page (citations in our corpus or others sharing the same primary CPC).