LED driver with comprehensive fault protections

Patent metadata

Field	Value
Publication number	US-10448480-B2
Application number	US-201815976177-A
Country	US
Kind code	B2
Filing date	May 10, 2018
Priority date	Jun 19, 2013
Publication date	Oct 15, 2019
Grant date	Oct 15, 2019

Abstract

The embodiments disclosed herein describe a set of fault detection circuits for LED circuits in an LED channel. A first fault detection circuit is configured to detect a short fault across one or more LEDs. A second fault detection circuit is configured to detect an open fault across an LED. A third fault detection circuit is configured to detect a short across an LED channel transistor. A fourth fault detection circuit is configured to detect an LED channel sense resistor open fault. A fifth fault detection circuit is configured to detect if the LED channel is being intentionally unused. These fault detect circuits can be implemented in a fault detection integrated circuit coupled to the LED channel.

First claim

What is claimed is:

1. An LED fault detection circuit configured to detect one or more faults of an LED channel comprising one or more LEDs coupled to a drain node of a transistor and a resistor coupled to a source node of the transistor, the circuit comprising:
a first fault detection circuit coupled to the source node of the transistor and configured to:
when the LED fault detection circuit is operating in an operating mode, detect an open fault within the one or more LEDs; and
when the LED fault detection circuit is operating in a calibration mode, detect a short fault across the resistor, wherein the LED fault detection circuit is configured to operate in the calibration mode before being configured to operate in the operating mode; and

a second fault detection circuit comprising a comparator, a second transistor, and a current source coupled to a drain node of the second transistor, the second fault detected circuit coupled to the source node of the transistor and configured to detect an open fault across the resistor by, when the second transistor is configured to operate as a closed switch, comparing the voltage at the source node of the transistor to a reference voltage and outputting a fault signal indicating a presence or absence of the open fault across the resistor based on the comparison.

2. The LED fault detection circuit of claim 1 , further comprising a third fault detection circuit configured to detect a short fault across one or more of the LEDs, the third fault detection circuit coupled to the drain node of the transistor.

3. The LED fault detection circuit of claim 2 , wherein the third fault detection circuit comprises a voltage divider coupled to the drain node of the transistor, the voltage divider comprising a first resistor and a second resistor coupled at a first node, the third fault detection circuit further comprising a comparator coupled to the first node.

4. The LED fault detection circuit of claim 3 , wherein the comparator is configured to compare a voltage at the first node to a reference voltage and to output a fault signal indicating the presence or absence of a short fault across one or more of the LEDs based on the comparison.

5. The LED fault detection circuit of claim 1 , wherein the first fault detection circuit comprises a comparator coupled to the source node of the transistor.

6. The LED fault detection circuit of claim 5 , wherein the comparator is configured to, when the LED fault detection circuit is operating in an operating mode, compare a voltage at the source node of the transistor to a reference voltage and to output a fault signal indicating the presence or absence of an open fault within the one or more LEDs based on the comparison.

7. The LED fault detection circuit of claim 1 , further comprising a third fault detection circuit configured to detect a short fault across the drain node and the source node of the transistor, the third fault detection circuit coupled to the gate node of the transistor.

8. The LED fault detection circuit of claim 7 , wherein the third fault detection circuit comprises a comparator coupled to the gate node of the transistor.

9. The LED fault detection circuit of claim 7 , wherein the comparator is configured to compare a voltage at the gate node of the transistor to a reference voltage and to output a fault signal indicating the presence or absence of a short fault across the drain node and the source node of the transistor based on the comparison.

10. The LED fault detection circuit of claim 1 , further comprising:
a fourth fault detection circuit configured to detect an unused LED channel, the fourth fault detection coupled to the source node of the transistor.

11. The LED fault detection circuit of claim 10 , the fourth fault detection circuit comprising:
a second comparator coupled to the source node of the transistor, wherein the second comparator is configured to, when the transistor is configured to operate as an open switch and when the second transistor is configured to operate and when the second transistor is configured to operate as a closed switch, compare the voltage at the source node of the transistor to a second reference voltage greater than a reference voltage, and to output a second fault signal indicating that the LED channel is used or unused.

12. The LED fault detection circuit of claim 11 , further comprising:
a decoder coupled to the comparator and to the second comparator and configured to receive the fault signal and the second fault signal, and to output a status signal indicative of a state of the LED channel.

13. An LED fault detection integrated circuit configured to detect faults of an LED channel, the integrated circuit comprising:
a first set of fault detection circuits coupled to a source node of an LED channel transistor and configured to detect one or more LED channel faults when the integrated circuit is configured in a calibration mode; and
a second set of fault detection circuits configured to detect one or more LED channel faults when the integrated circuit is configured in an operating mode, wherein the integrated circuit is configured to operate in the calibration mode before being configured to operate in the operating mode;
wherein a fault detection circuit is included in the first set of fault detection circuits and the second set of fault detection circuits, and wherein the fault detection circuit is configured to detect a sense resistor short circuit fault when the integrated circuit is configured in the operating mode and to detect an LED open circuit fault when the integrated circuit is configured in the calibration mode; and
wherein the second set of fault detection circuits comprises a comparator coupled to the gate node of the LED channel transistor, the comparator configured to compare a voltage at the gate node of the LED channel transistor to a reference voltage and to output a fault signal indicating the presence or absence of a short fault across the drain node and the source node of the LED channel transistor based on the comparison.

14. The LED fault detection integrated circuit of claim 13 , the first set of fault detection circuits comprising:
a second fault detection circuit configured to detect an open fault at the source node of the LED channel transistor, the second fault detection circuit comprising:
a second transistor, the source node of the second transistor coupled to the source node of the LED channel transistor;
a current source coupled to a drain node of the second transistor; and
a second comparator coupled to a source node of the LED channel transistor, the second comparator configured to compare a voltage at the source node of the LED channel transistor to a reference voltage and to output a second fault signal indicating the presence or absence of an open fault at the source node of the LED channel transistor.

15. The LED fault detection integrated circuit of claim 13 , the first set of fault detection circuits further comprising:
a second fault detection circuit configured to detect an unused LED channel, the second fault detection circuit comprising:
a second comparator coupled to the source node of the LED channel transistor, the second comparator configured to compare the voltage at the source node of the LED channel transistor to a reference voltage and to output a second fault signal indicating that the LED channel is used or unused.

16. The LED fault detection integrated circuit of claim 13 , further comprising:
a decoder coupled to the first set of fault detection circuits and configured to output a status signal in

Assignees

• Dialog Semiconductor Inc

Inventors

• Liang Enzhu
• Wang Yuwen
• Gu Ming

Classifications

• G01R31/44

  Testing lamps · CPC title

• Y02B20/341

  Cross-Sectional Technologies · mapped topic

• H05B33/089 Primary

  Electricity · mapped topic

• H05B45/54 Primary

  in a series array of LEDs · CPC title

• Y02B20/30

  Semiconductor lamps, e.g. solid state lamps [SSL] light emitting diodes [LED] or organic LED [OLED] · CPC title