Nondestructive inspection using continuous ultrasonic wave generation

US10444202B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-10444202-B2
Application numberUS-201514688854-A
CountryUS
Kind codeB2
Filing dateApr 16, 2015
Priority dateApr 16, 2014
Publication dateOct 15, 2019
Grant dateOct 15, 2019

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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Abstract

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Methods and apparatus are disclosed for analyzing structures by applying a continuous ultrasonic excitation and measuring steady state response of the structures using laser Doppler vibrometery, or other techniques. In one example, a method comprises applying a continuous signal having one or more periodic tones to the structure, generating measurements of wave response to the signal at each of a plurality of inspection points of the structure, and, for each of the periodic tones, estimating wavenumbers for a number of the inspection points of the structure based on the wave response measurements and the frequency of the periodic tones. The estimated wavenumbers can be used to determine properties of the structure, including defects, damage, or variation in thickness.

First claim

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We claim: 1. A method for analyzing a structure, the method comprising: applying a continuous signal having one or more periodic tones to the structure, causing the structure to reach a steady vibration state; generating measurements of wave response of the structure to the signal at each of a plurality of inspection points of the structure; and for each of the periodic tones, estimating a wavenumber for a number of the inspection points of the structure, by calculating amplitudes of spatial frequency domain data based on the wave response measurements. 2. The method of claim 1 , wherein the continuous signal is applied by using a piezoelectric transducer in physical communication with the structure. 3. A method, comprising: projecting a laser light onto a surface of a structure, causing the structure to reach a steady vibration state; generating measurements of wave response of the structure to the laser light at each of a plurality of inspection points of the structure; and estimating a wavenumber for a number of the inspection points of the structure, by calculating amplitudes of spatial frequency domain data based on the wave response measurements. 4. The method of claim 1 , wherein the periodic tones have frequencies in a range of 30-500 kHz. 5. A method for analyzing a structure, the method comprising: applying a continuous signal having one or more periodic tones to the structure, causing the structure to reach a steady vibration state; using a laser Doppler vibrometer, generating measurements of wave response of the structure to the signal at each of a plurality of inspection points of the structure; and for each of the periodic tones, estimating a wavenumber for a number of the inspection points of the structure, by calculating amplitudes of spatial frequency domain data based on the wave response measurements. 6. The method of claim 1 , wherein the method further comprises identifying a defect in the structure, and wherein the structure comprises a planar metallic or composite material. 7. The method of claim 1 , wherein the method further comprises composing the wavenumber into a map of properties of the structure, and wherein the mapped properties include at least one or more of the following: thickness, density, material composition, elasticity, or temperature. 8. The method of claim 1 , wherein the wave response measurements are time domain data, and wherein the estimating the wavenumber comprises transforming at least a portion of the wave response measurements into spatial frequency domain data. 9. The method of claim 1 , further comprising generating an image or map of at least a portion of the inspection points. 10. The method of claim 1 , further comprising: determining one or more properties of the structure based on the estimated wavenumber; and separating foreground inspection targets from background objects using a mask formed by thresholding vibration responses based on the determined properties. 11. At least one non-transitory computer-readable storage medium storing computer-readable instructions that when executed by a computer, cause the computer to perform the method of claim 1 . 12. The method of claim 3 , wherein the method further comprises identifying a defect in the structure, and wherein the structure comprises a planar metallic or composite material. 13. The method of claim 3 , wherein the method further comprises composing the wavenumber into a map of properties of the structure, and wherein the mapped properties include at least one or more of the following: thickness, density, material composition, elasticity, or temperature. 14. The method of claim 3 , wherein the wave response measurements are time domain data, and wherein the estimating the wavenumber comprises transforming at least a portion of the wave response measurements into spatial frequency domain data. 15. The method of claim 3 , further comprising generating an image or map of at least a portion of the inspection points. 16. The method of claim 3 , further comprising: determining one or more properties of the structure based on the estimated wavenumber; and separating foreground inspection targets from background objects using a mask formed by thresholding vibration responses based on the determined properties. 17. At least one non-transitory computer-readable storage medium storing computer-readable instructions that when executed by a computer, cause the computer to perform the method of claim 3 . 18. The method of claim 5 , wherein the periodic tones have frequencies in a range of 30-500 kHz. 19. The method of claim 5 , wherein the method further comprises identifying a defect in the structure, and wherein the structure comprises a planar metallic or composite material. 20. The method of claim 5 , wherein the method further comprises composing the wavenumber into a map of properties of the structure, and wherein the mapped properties include at least one or more of the following: thickness, density, material composition, elasticity, or temperature. 21. The method of claim 5 , wherein the wave response measurements are time domain data, and wherein the estimating the wavenumber comprises transforming at least a portion of the wave response measurements into spatial frequency domain data. 22. The method of claim 5 , further comprising generating an image or map of at least a portion of the inspection points. 23. The method of claim 5 , further comprising: determining one or more properties of the structure based on the estimated wavenumber; and separating foreground inspection targets from background objects using a mask formed by thresholding vibration responses based on the determined properties. 24. At least one non-transitory computer-readable storage medium storing computer-readable instructions that when executed by a computer, cause the computer to perform the method of claim 5 .

Assignees

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Classifications

  • Temperature · CPC title

  • using optoacoustic interaction with the material, e.g. laser radiation, photoacoustics (photoacoustic cells G01N21/1702; measuring characteristics of vibrations by using radiation-sensitive means G01H9/00; acousto-optical conversion techniques for short-range imaging G01S15/8965; sound-producing devices using laser bundle G10K15/046) · CPC title

  • Piezoelectric probes · CPC title

  • Elastic parameters, strength or force · CPC title

  • Length, thickness · CPC title

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What does patent US10444202B2 cover?
Methods and apparatus are disclosed for analyzing structures by applying a continuous ultrasonic excitation and measuring steady state response of the structures using laser Doppler vibrometery, or other techniques. In one example, a method comprises applying a continuous signal having one or more periodic tones to the structure, generating measurements of wave response to the signal at each of…
Who is the assignee on this patent?
Los Alamos Nat Security Llc, Triad Nat Security Llc
What technology area does this patent fall under?
Primary CPC classification G01N29/46. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Oct 15 2019 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).