Method and apparatus for semiconductor testing at low temperature
US-9224659-B2 · Dec 29, 2015 · US
US10436816B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-10436816-B2 |
| Application number | US-201816192578-A |
| Country | US |
| Kind code | B2 |
| Filing date | Nov 15, 2018 |
| Priority date | May 26, 2016 |
| Publication date | Oct 8, 2019 |
| Grant date | Oct 8, 2019 |
A practical reading order for non-experts. Skip the full description unless you need deep technical detail.
What the patent document calls the invention.
A short plain-language summary of the technical disclosure.
Who owns or filed the patent and who is credited as inventor.
Filing, priority, publication, and grant dates set the timeline.
The legal scope of protection — read this for what is actually claimed.
Technology tags used to group this patent with similar filings.
Prior art links and similar publications in this corpus.
Official abstract text for this publication.
A test coaxial connector has a probe portion with a small height, and prevents breakage of a switch-equipped coaxial connector even when the test coaxial connector is not properly fitted to the switch-equipped coaxial connector. The test coaxial connector includes a housing and a probe housed in the housing. The probe is formed of one continuous structure having elasticity, the structure including a contact at or near an end portion of the structure and including, at or near another end portion of the structure, a connection portion to which a central conductor of a coaxial cable is to be connected.
Opening claim text (preview).
What is claimed is: 1. A test L-shaped coaxial connector which is fitted to a switch-equipped coaxial connector when being used, the test L-shaped coaxial connector comprising: a housing; an insulator attached to the housing; and a probe housed in the housing, wherein the probe is formed of one continuous structure having elasticity, the structure including a contact, at or near an end portion of the probe, a connection portion, at or near another end portion of the probe, to which a central conductor of a coaxial cable is to be connected, the connection portion formed by the probe being bent at least at one location, a bent portion provided between the contact and the connection portion by the probe being bent at least a first bend and a second bend, the first bend being positioned closer to the connection portion, and a flat portion extending the whole length between the connection portion and the first bend of the bent portion, the entire flat portion being in contact with the insulator in a direction opposite to a direction of fitting to the switch-equipped coaxial connector. 2. The test L-shaped coaxial connector according to claim 1 , wherein a zigzag portion is provided between the contact and the connection portion of the probe. 3. The test L-shaped coaxial connector according to claim 1 , wherein the probe includes a portion having a different diameter or thickness, between the contact and the connection portion. 4. The test L-shaped coaxial connector according to claim 1 , wherein the contact of the probe is curled. 5. The test L-shaped coaxial connector according to claim 2 , wherein the probe includes a portion having a different diameter or thickness, between the contact and the connection portion. 6. The test L-shaped coaxial connector according to claim 2 , wherein the contact of the probe is curled. 7. The test L-shaped coaxial connector according to claim 3 , wherein the contact of the probe is curled. 8. The test L-shaped coaxial connector according to claim 5 , wherein the contact of the probe is curled. 9. A test L-shaped coaxial connector which is fitted to a switch-equipped coaxial connector when being used, the test L-shaped coaxial connector comprising: a housing; an insulator attached to the housing; and a probe housed in the housing, wherein the probe is formed of one continuous structure having elasticity, the structure including a contact at or near an end portion thereof and including, at or near another end portion thereof, a connection portion to which a central conductor of a coaxial cable is to be connected, a bent portion is provided between the contact and the connection portion of the probe by the probe being bent at least at two locations, a portion between the connection portion and the bent portion is in contact with the insulator in a direction opposite to a direction of fitting to the switch-equipped coaxial connector, and the connection portion includes a cut into which the central conductor of the coaxial cable is fitted. 10. The test L-shaped coaxial connector according to claim 9 , wherein a zigzag portion is provided between the contact and the connection portion of the probe. 11. The test L-shaped coaxial connector according to claim 9 , wherein the probe includes a portion having a different diameter or thickness, between the contact and the connection portion. 12. The test L-shaped coaxial connector according to claim 9 , wherein the contact of the probe is curled. 13. The test L-shaped coaxial connector according to claim 10 , wherein the probe includes a portion having a different diameter or thickness, between the contact and the connection portion. 14. The test L-shaped coaxial connector according to claim 10 , wherein the contact of the probe is curled. 15. The test L-shaped coaxial connector according to claim 11 , wherein the contact of the probe is curled. 16. The test L-shaped coaxial connector according to claim 13 , wherein the contact of the probe is curled.
Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets (G01R1/067 takes precedence; mass production testing systems G01R31/59; testing of connections G01R31/66; for testing printed circuit boards G01R31/2808) · CPC title
Connectors, terminals (G01R1/0425 and G01R1/0433 take precedence; with measurement function for battery poles G01R31/364) · CPC title
for testing or measuring purposes · CPC title
comprising switches · CPC title
having concentrically or coaxially arranged contacts · CPC title
Related publications grouped by family.
Answers are generated from the same data shown on this page.