Compact harmonic tuner system with rotating probes

Patent metadata

Field	Value
Publication number	US-10429484-B1
Application number	US-201916386752-A
Country	US
Kind code	B1
Filing date	Apr 17, 2019
Priority date	Jan 13, 2017
Publication date	Oct 1, 2019
Grant date	Oct 1, 2019

Abstract

A compact harmonic tuner system uses a two-carriage harmonic slide-screw impedance tuner employs, single and dual frequency band metallic disc probes travelling along and rotating diametrically inside the same slabline, which therefore is only one half, instead of full, the wavelength long at the minimum frequency of operation. Using disc probes allows probe control operation without high precision vertical axes, as well as high resolution in the area where the gap between center conductor and probe is small (high GAMMA), a smooth increase of proximity between probe and center conductor and the possibility to compensate for the negative phase slope at higher GAMMA, native to traditional slide screw tuners using vertically moving square probes (slugs).

First claim

What I claim as my invention is:

1. A harmonic impedance tuner system comprising
a) an automated two carriage slide screw tuner
b) a system controller, and
c) a calibration method,
wherein
a) the tuner comprises
a slabline between an input port and an output port with two grounded sidewalls and a center conductor;
and two mobile carriages #1 and #2, sharing the same area of the slabline, remotely controlled using stepper-motors, mounted diametrical on top of the sidewalls, straddling the slot and sliding parallel to the axis of the slabline, said carriages controlling associated disc-shaped tuning probes #1 and #2, said probes rotating inside the slot of the slabline,
wherein
the disc tuning probes have a dual approximately elliptical shape,
and wherein
the main axes of the ellipses are approximately perpendicular to each-other;

b) the system controller comprises
a central processor, electronic memory, electronic motor control, communication interface and associated control, communication and data collection software;

c) the calibration method comprises
tuner control, s-parameter acquisition routines and data processing algorithms.

2. The tuner of claim 1 ,
wherein
the disc probes have three modes of insertion into the slabline slot:
a) narrow ellipsis partially or fully inserted;
b) wide ellipsis partially or fully inserted, and
c) both ellipses fully extracted (initialization state).

3. The probes of the tuner of claim 1 having four frequency coverage modes,
a) mode 1, narrow ellipsis creating intermediate reflection in high frequency band,
b) mode 2, wide ellipsis creating intermediate reflection in low frequency band,
c) mode 3 narrow ellipsis creating high reflection in high frequency band, and
d) mode 4, wide ellipsis creating high reflection in low frequency band.

4. The tuner of the system of claim 1 comprising
communication interface, electronic board, electric stepper motors and gear for controlling the rotation angle of the probes and the position of the carriages along the slabline.

5. The tuner of claim 4 ,
wherein
the total length of the slabline is approximately one half of a wavelength at the minimum operation frequency (Fmin);

and wherein
the probes are mounted on the mobile carriages and rotate from opposite sides inside the slot of the slabline, whereby the rotation axis of the probes is perpendicular to the axis of the slabline.

6. The calibration method of the system of claim 1 , comprising the following steps:
a) connecting the tuner to the VNA, which is pre-calibrated at a fundamental frequency Fo and the harmonic frequency 2Fo;
b) initializing the tuner, i.e. moving the carriages to initial horizontal position (X1=X2=Xo) and rotating the disc-probes to initial angle Φ1=Φ2=0°, for which the reflection factor is minimum;
c) measuring s-parameters at frequencies Fo and 2Fo and saving in initialization matrices [S0(Fo)] and [S0(2Fo)];
d) rotating disc-probe #1 progressively into the slot of the slabline at angles Φ1.j, measuring the reflection factor GAMMA1(Φ1.j) at Fo at the test port, at a number N1>2 of angles (1≤j≤N1) and saving in memory;
e) initializing disc-probes #1; rotating disc-probe #2 progressively into the slot of the slabline at angles Φ2.j, measuring the reflection factor GAMMA2(Φ2.j) at Fo at the test port, at a number N2>2 of angles (1≤j≤N2) and saving in memory;
f) initializing disc-probe #2 and measuring tuner two-ports-parameters at Fo and 2Fo, for N1 angular probe positions Φ1.j, as defined in step (d), and a multitude of horizontal carriage #1 positions, X1, between the initial position (X1=Xo) and a distance of at least one half of a wavelength at Fo, and saving in file tuner1;
g) initializing disc-probe #1 and measuring tuner two-port s-parameters at Fo and 2Fo, for N2 angular probe positions Φ2.j, as defined in step (e), and a multitude of horizontal carriage #2 positions, X2, between the initial position (X2=Xo) and a distance of at least one half of a wavelength at Fo, and saving in file tuner2;
h) cascading s-parameters as
follows:
if (X1≤X2) then
the invers s-parameter matrices [S0(Fo)] −1 and [S0(2Fo)] −1 are cascaded with s-parameters of file tuner2 at Fo and 2Fo correspondingly and re-saved in file tuner2;
cascade the permutations of s-parameters comprised in files tuner1 and tuner2, as created in steps (f) and (g) and modified in step (h), and save in overall tuner calibration files tuner-cal-Fo and tuner-cal-2Fo;

if (X1>X2) then
the invers s-parameter matrices [S0(Po)] −1 and [S0(2 Po)] −1 are cascaded with s-parameters of file tuner1 at Fo and 2Fo correspondingly and re-saved in file tuner1;
cascade the permutations of s-parameters comprised in files tuner2 and tuner1, as created in steps (f) and (g) and modified in step (h) and save in overall tuner calibration files tuner-cal-Fo and tuner-cal-2Fo.

Assignees

• Tsironis Christos

Inventors

• Tsironis Christos

Classifications

• G01R35/005 Primary

  Calibrating; Standards or reference devices, e.g. voltage or resistance standards, "golden" references (G01R33/0035, G01R35/002 take precedence) · CPC title

• G01R31/2601

  Apparatus or methods therefor (G01R31/2607, G01R31/2642 take precedence) · CPC title

• G01R27/32

  in circuits having distributed constants {, e.g. having very long conductors or involving high frequencies} · CPC title

• G01R31/2612

  for measuring frequency response characteristics, e.g. cut-off frequency thereof · CPC title

• H03H7/40

  Automatic matching of load impedance to source impedance · CPC title