Automatically generated test diagram

Patent metadata

Field	Value
Publication number	US-10429437-B2
Application number	US-201514724347-A
Country	US
Kind code	B2
Filing date	May 28, 2015
Priority date	May 28, 2015
Publication date	Oct 1, 2019
Grant date	Oct 1, 2019

Abstract

A method of operating a data processing system to generate a diagram indicative of an experimental setup includes a device to be tested (DUT) and a plurality of test instruments is disclosed. The method includes detecting a first test instrument that is connected to the data processing system and determining connection points to the first test instrument. A script that specifies tests for the DUT using the plurality of test instruments and includes instructions specifying measurements to be made by the first test instrument is examined. A first connection between the DUT and the first test instrument is determined. An initial diagram on a display controlled by the data processing system is generated. The initial diagram includes a first node representing the first test instrument, a second node representing the DUT and a line representing the first connection between the first and second nodes.

First claim

What is claimed is:

1. A self-documenting instrument test system comprising:
a plurality of test instruments that perform a test specified by a script on a DUT when said DUT is connected to a circuit comprising connections between said DUT and said test instruments, said script specifying sequences of operations to be performed by said test instruments during said test, but not said connections between the test instruments and said DUT;
a data processing system that operates each test instrument to determine any input and output connection points on said test instrument and any signal that can be generated by that test instrument and/or any signals that can be measured by that test instrument,
said data processing system being adapted to examine said script and said information on said test instruments connected to said data processing system and to generate a circuit diagram showing said DUT and said test instruments in said script and connections between said DUT and said test instruments, said data processing system being adapted to display said circuit diagram on a GUI connected to said data processing system.

2. The system of claim 1 wherein said data processing system generates a node representing each of said plurality of test instruments in said diagram on said display.

3. The system of claim 2 wherein one of said plurality of test instruments is not detectable by said data processing system and wherein said data processing system is configured to receive input from a user of said data processing system defining said one of said plurality of test instruments and connections that are available to that one of said plurality of test instruments.

4. The system of claim 2 wherein said data processing system is configured to receive an instruction from a user of said data processing system, said instruction specifying a connection between two of said nodes on said display, said data processing system generating a line between said two of said nodes in said diagram on said display.

5. The system of claim 2 wherein said data processing system is configured to receive user input specifying one of said nodes on said display and wherein said data processing system displays portions of said script that reference said test instrument corresponding to said one of said nodes on said display.

6. The system of claim 2 wherein said data processing system is configured to receive user input specifying a connection to one of said nodes on said display and wherein said data processing system displays portions of said script that reference said connection on said display.

7. The system of claim 2 wherein said data processing system is configured to receive user input specifying a portion of said script that references one of said test instruments and wherein said data processing system highlights said node representing that test instrument in said diagram.

8. The system of claim 2 wherein said data processing system is configured to receive user input specifying a portion of said script that references a connection to one of said test instruments and wherein said data processing system highlights said connection in said diagram.

9. The system of claim 2 wherein said data processing system automatically removes nodes in said diagram that correspond to test instruments that are not referenced in said script.

10. A computer readable medium comprising instructions that cause a data processing system in an instrument test system comprising a plurality of test instruments connected to said data processing system in which said instrument test system performs a test on a DUT under the control of a script that does not provide the connections between said test instruments and said DUT to be converted to a self-documenting test system according to claim 1 .

11. The computer readable medium of claim 10 wherein said data processing system generates a node representing each of said plurality of test instruments in said diagram on said display.

12. The computer readable medium of claim 11 wherein one of said plurality of test instruments is not detectable by said data processing system and wherein said data processing system is configured to receive input from a user of said data processing system defining said one of said plurality of test instruments and connections that are available to that one of said plurality of test instruments.

13. The computer readable medium of claim 11 wherein said data processing system is configured to receive an instruction from a user of said data processing system, said instruction specifying a connection between two of said nodes on said display, said data processing system generating a line between said two of said nodes in said diagram on said display.

14. The computer readable medium of claim 11 wherein said data processing system is configured to receive user input specifying one of said nodes on said display and wherein said data processing system displays portions of said script that reference said test instrument corresponding to said one of said nodes on said display.

15. The computer readable medium of claim 11 wherein said data processing system is configured to receive user input specifying a connection to one of said nodes on said display and wherein said data processing system displays portions of said script that reference said connection on said display.

16. The computer readable medium of claim 11 wherein said data processing system is configured to receive user input specifying a portion of said script that references one of said test instruments wherein said data processing system displays highlights of said node representing that test instrument in said diagram.

Assignees

• Keysight Technologies Inc

Inventors

• Helfman Jonathan

Classifications

• G01R31/2834 Primary

  Automated test systems [ATE]; using microprocessors or computers (G01R31/317 takes precedence; ATE for detection of defective computer hardware G06F11/2736) · CPC title

• G01R35/005

  Calibrating; Standards or reference devices, e.g. voltage or resistance standards, "golden" references (G01R33/0035, G01R35/002 take precedence) · CPC title