Frequency measurement device, frequency measurement method and under frequency load shedding device

Patent metadata

Field	Value
Publication number	US-10429418-B2
Application number	US-201715434281-A
Country	US
Kind code	B2
Filing date	Feb 16, 2017
Priority date	Mar 7, 2016
Publication date	Oct 1, 2019
Grant date	Oct 1, 2019

Abstract

A frequency measurement device includes a sampling unit that outputs a voltage sampling value in accordance with a voltage to be sampled and a sampling frequency; an single-cycle DFT angle shift computation unit that computes and outputs a first angle shift in accordance with the voltage sampling value; an multi-cycle DFT angle shift computation unit that computes and outputs a second angle shift in accordance with the voltage sampling value; a selection unit that selects and outputs one of the first and second angle shifts as a selected angle offset; a sampling frequency computation and outputting unit that computes a sampling frequency in accordance with the selected angle offset and outputs the same to the sampling module unit as a new sampling frequency; and a frequency measurement value computation and outputting unit that computes and outputs a frequency measurement value in accordance with the selected angle offset.

First claim

What is claimed is:

1. A frequency measurement device, comprising:
a sampling module unit that outputs a voltage sampling value in accordance with a voltage to be sampled and a sampling frequency input thereto;
an angle shift computation unit based on single-cycle Discrete Fourier Transform DFT that computes and outputs a first angle shift based on the single-cycle DFT, in accordance with the voltage sampling value input from the sampling module unit;
an angle shift computation unit based on multi-cycle DFT that computes and outputs a second angle shift based on the multi-cycle DFT, in accordance with the voltage sampling value input from the sampling module unit;
an angle shift selection unit that selects and outputs one of the first angle shift and second angle shift an absolute value of which is smaller as a selected angle offset, in accordance with the first angle shift and second angle shift input thereto;
a sampling frequency computation and outputting unit that computes a sampling frequency in accordance with the selected angle offset input thereto, and outputs the sampling frequency to the sampling module unit as a new sampling frequency; and
a frequency measurement value computation and outputting unit that computes and outputs a frequency measurement value in accordance with the selected angle offset input thereto.

2. The frequency measurement device according to claim 1 , wherein
the angle shift computation unit based on the single-cycle DFT includes:
a single-cycle DFT unit that performs DFT process on a voltage sampling value of single-cycle input thereto and outputs a first voltage phase angle; and
a first angle shift computation unit that computes and outputs a first angle offset as the first angle shift, in accordance with the first voltage angle phase, and

the angle shift computation unit based on the multi-cycle DFT includes:
a window unit that intercepts and outputs the voltage sampling value of multiple cycles through a window function;
a multi-cycle DFT unit that performs DFT process on the voltage sampling value of the multiple cycles input thereto, and computes and outputs a second voltage phase angle; and
a second angle shift computation unit that computes and outputs a second angle offset as the second angle shift, in accordance with the second voltage angle phase.

3. The frequency measurement device according to claim 2 , wherein
the window function is a hamming window function, and the number of the multiple cycles is from one to ten and can be adjusted depending on application requirements.

4. The frequency measurement device according to claim 1 , wherein
the sampling frequency computation and outputting unit includes:
a frequency shift computation unit;
a first multiplier;
a sampling reference frequency value computation unit; and
a second multiplier,
the frequency shift computation unit computes and outputs a frequency offset in accordance with the selected angle offset input thereto, the first multiplier multiplies the frequency offset by a first coefficient and outputs a first result to the sampling reference frequency value computation unit, the sampling reference frequency value computation unit computes and outputs a sampling reference frequency value in accordance with the first result input thereto, the second multiplier multiplies the sampling reference frequency value by an integer, generates a new sampling frequency and outputs the new sampling frequency to the sampling module unit for adjusting the sampling frequency, and

the frequency measurement value computation and outputting unit includes:
a third multiplier; and
a frequency measurement value computation unit,
the third multiplier multiplies the frequency offset by a second coefficient, and outputs a second result to the frequency measurement value computation unit, and the frequency measurement value computation unit computes and outputs the frequency measurement value in accordance with the second result.

5. The frequency measurement device according to claim 4 , wherein
an iteration process which includes processes from the sampling module unit to the sampling frequency computation and outputting unit and process of outputting the new sampling frequency to the sampling module unit is performed every specified operation interval, and the operation interval is set by a specific application,
the first coefficient is of a value larger than 0 and less than 1, and the second coefficient is 1.

6. An under frequency load shedding device, comprising the frequency measurement device according to claim 1 .

7. A frequency measurement method, comprising:
a sampling step of inputting a voltage to be sampled and a sampling frequency to a sampling module and outputting a voltage sampling value;
an angle shift computing step based on single-cycle Discrete Fourier Transform DFT of computing and outputting a first angle shift based on the single-cycle DFT, in accordance with the voltage sampling value input from the sampling step;
an angle shift computing step based on multi-cycle DFT of computing and outputting a second angle shift based on the multi-cycle DFT, in accordance with the voltage sampling value input from the sampling step;
an angle shift selecting step of selecting and outputting one of the first angle shift and the second angle shift an absolute value of which is smaller as a selected angle offset, in accordance with the first and second angle shifts;
a sampling frequency computing and outputting step of computing a sampling frequency in accordance with the selected angle offset inputted, and outputting the sampling frequency to the sampling module as a new sampling frequency; and

a frequency measurement value computing and outputting step of computing and outputting a frequency measurement value in accordance with the selected angle offset.

8. The frequency measurement method according to claim 7 , wherein
the angle shift computing step based on single-cycle DFT step includes:
a single-cycle DFT step of performing DFT process on the input voltage sampling value of single-cycle and outputting a first voltage phase angle;
a first angle shift computing step of computing and outputting a first angle offset as the first angle shift, in accordance with the first voltage angle phase, and

the angle shift computing step based on multi-cycle DFT step includes:
a windowing step of intercepting and outputting the voltage sampling value of multiple cycles through a window function;
a multi-cycle DFT step of performing DFT process on the input voltage sampling values of the multiple cycles, and computing and outputting a second voltage phase angle;
a second angle shift computing step of computing and outputting a second angle offset as the second angle shift, in accordance with the second voltage phase angle.

9. The frequency measurement method according to claim 8 , wherein
the window function is a hamming window function, and the number of the multiple cycles is from one to ten and can be adjusted depending on application requirements.

10. The frequency measurement method according to claim 7 , wherein
the sampling frequency computing and outputting step includes:
a frequency shift computing step;
a first multiplying step;
a sampling reference frequency value computing step; and
a second multiplying step,
in the frequency shift computing step, a frequency offset is computed and output in accordance with the selected angle offset inputted, in the first multiplying step, the frequency offset is multiplied by a first coefficient and a first result is output to the sampling reference frequency value computing step, in the sampling reference frequency value computing

Assignees

• Schneider Electric Ind Sas

Inventors

• Xing jinlei

Classifications

• G01R23/00

  Arrangements for measuring frequencies; Arrangements for analysing frequency spectra · CPC title

• G01R23/02 Primary

  Arrangements for measuring frequency, e.g. pulse repetition rate; Arrangements for measuring period of current or voltage · CPC title

• G01R19/2513

  Arrangements for monitoring electric power systems, e.g. power lines or loads; Logging · CPC title

• G01R23/12 Primary

  by converting frequency into phase shift · CPC title

• G01R23/16 Primary

  Spectrum analysis; Fourier analysis · CPC title