Coordinate measuring machine and coordinate correction method

Patent metadata

Field	Value
Publication number	US-10429166-B2
Application number	US-201715680653-A
Country	US
Kind code	B2
Filing date	Aug 18, 2017
Priority date	Aug 26, 2016
Publication date	Oct 1, 2019
Grant date	Oct 1, 2019

Abstract

A processing device includes: a coordinate acquisition unit that acquires a moving amount of a measuring probe and a probe output; a matrix generation unit that generates a correction matrix including linear correction elements and non-linear correction elements; and a probe output correction unit that corrects the probe output with the correction matrix. The coordinate acquisition unit acquires the moving amount and the probe output of the measuring probe in each of measurement points in a quantity larger than or equal to the sum of the number of the linear correction elements and the number of the non-linear correction elements. Consequently, a non-linear error of the probe output supplied from the measuring probe can be corrected, and thus shape coordinates of an object to be measured can be obtained with high accuracy.

First claim

The invention claimed is:

1. A coordinate measuring machine comprising:
a measuring probe that movably supports a stylus having a measurement tip to be brought into contact with an object to be measured, and that provides a probe output according to a displacement of the measurement tip;
a driver that moves the measuring probe relative to the object to be measured;
a processor that computes shape coordinates of the object to be measured on a basis of the probe output and a moving amount of the measuring probe by the driver; and
a restrainer that restrains a translational displacement of the measurement tip, wherein:
the processor comprises, as a configuration when the processor executes instructions stored in a memory:
a coordinate acquisition processor that acquires the moving amount and the probe output of the measuring probe when the measuring probe is moved by the driver in a state where the measurement tip is restrained by the restrainer;
a matrix generator that generates a correction matrix including linear correction elements and non-linear correction elements for respectively correcting linear coordinate components and non-linear coordinate components of the probe output with respect to the moving amount of the measuring probe on a basis of an output of the coordinate acquisition processor; and
a probe output corrector that corrects the probe output with the correction matrix, and

the coordinate acquisition processor acquires the moving amount and the probe output of the measuring probe in each of measurement points in a quantity larger than or equal to a sum of a number of the linear correction elements and a number of the non-linear correction elements.

2. The coordinate measuring machine according to claim 1 , wherein the coordinate acquisition processor acquires the moving amount and the probe output at the time of the movement of the measuring probe from a reference position where the probe output is 0 to each of the measurement points in a state where the measurement tip is restrained by the restrainer at the reference position.

3. The coordinate measuring machine according to claim 2 , wherein the restrainer is further configured to not restrain rotational displacement of a center of the measurement tip as a center of rotation.

4. The coordinate measuring machine according to claim 3 , wherein the restrainer includes contact surfaces configured to be in contact with the measurement tip at positions of four vertices of a regular tetrahedron inscribed in the measurement tip.

5. The coordinate measuring machine according to claim 4 , wherein:
the restrainer includes two presses, configured to oppose each other with the measurement tip sandwiched therebetween, and to press the measurement tip,
the two presses each include two parallel columns having an axis in a direction perpendicular to a direction along which the two presses oppose each other on a side of each of the two presses closer to the measurement tip,
a direction of the axis of the columns in one of the presses and a direction of the axis of the columns in the other one of the presses are arranged perpendicular to each other, and
the columns are each provided with the contact surface.

6. The coordinate measuring machine according to claim 5 , wherein the columns are each formed in a circular cylinder and configured to be rotatable about the axis thereof.

7. The coordinate measuring machine according to claim 4 , wherein:
the restrainer includes four presses that press the measurement tip toward the center of the measurement tip, and
the presses each include a sphere having the contact surface, and a support that rotatably supports the sphere.

8. A coordinate correction method of a coordinate measuring machine, the coordinate measuring machine including: a measuring probe for movably supporting a stylus having a measurement tip to be brought into contact with an object to be measured and for providing a probe output according to a displacement of the measurement tip; a drive mechanism for moving the measuring probe relative to the object to be measured; and a processing device for computing shape coordinates of the object to be measured on a basis of the probe output and a moving amount of the measuring probe by the drive mechanism, the coordinate correction method comprising:
restraining a translational displacement of the measurement tip;
acquiring the moving amount and the probe output of the measuring probe when the measuring probe is moved by the drive mechanism;
generating a correction matrix including linear correction elements and non-linear correction elements for respectively correcting linear coordinate components and non-linear coordinate components of the probe output with respect to the moving amount of the measuring probe with the moving amount and the probe output of the measuring probe acquired in each of measurement points in a quantity larger than or equal to a sum of a number of the linear correction elements and a number of the non-linear correction elements; and
correcting the probe output with the correction matrix.

9. The coordinate correction method according to claim 8 , wherein the restraining of a translational displacement of the measurement tip is performed at a reference position where the probe output is 0.

10. The coordinate correction method according to claim 9 , wherein the restraining of a translational displacement of the measurement tip further includes not restraining rotational displacement of a center of the measurement tip as a center of rotation.

Assignees

• Mitutoyo Corp

Inventors

• Nakagawa Hideyuki
• Ishikawa Nobuhiro

Classifications

• G01B3/22 Primary

  Feeler-pin gauges, e.g. dial gauges (for measuring contours or curvatures G01B5/20) · CPC title

• G01B5/008

  using coordinate measuring machines · CPC title

• G01B21/00 Primary

  Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant · CPC title

• G01B21/045

  Correction of measurements (G01B9/02055 takes precedence) · CPC title

• G01B21/042 Primary

  Calibration or calibration artifacts (G01B3/30, G01B9/02072 take precedence) · CPC title