Devices, systems, and methods for anomaly detection

US10410084B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-10410084-B2
Application numberUS-201715793759-A
CountryUS
Kind codeB2
Filing dateOct 25, 2017
Priority dateOct 26, 2016
Publication dateSep 10, 2019
Grant dateSep 10, 2019

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  1. Title

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  2. Abstract

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  5. First independent claim

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Abstract

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Devices, systems, and methods obtain a first image, obtain a second image, calculate respective distances between a histogram from a patch in the first image to respective histograms from patches in the second image, and identify a patch in the second image that is most similar to the patch in the first image based on the respective distances.

First claim

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The invention claimed is: 1. A device comprising: one or more processors; and one or more computer-readable media that are coupled to the one or more processors and that include instructions for obtaining a first image, obtaining a second image, and calculating respective distances between a histogram from a patch in the first image and respective histograms from patches in the second image, wherein calculating the respective distances is based in part on a no-cost shift, and wherein the no-cost shift indicates a shift that is applied to each bin in either the histogram from the patch in the first image or at least one of the respective histograms from the patches in the second image and that does not count toward the distance between the histogram from the patch in the first image and the at least one of the respective histograms from the patches in the second image. 2. The device of claim 1 , wherein the patches in the second image include a central patch and other patches that are offset from the central patch. 3. The device of claim 2 , wherein the central patch has an x, y position in the second image that is identical to an x, y position of the patch in the first image. 4. The device of claim 1 , wherein the patches in the second image partially overlap each other. 5. The device of claim 4 , wherein each patch in the first image and the second image is composed of two or more respective feature patches. 6. The device of claim 5 , wherein each feature patch partially overlaps another feature patch. 7. The device of claim 1 , wherein the no-cost shift is based on a number of surplus pixels and on a total number of pixels. 8. The device of claim 1 , wherein calculating each of the respective distances includes calculating a difference between a number of pixels in a bin at index i in one histogram and a number of pixels in a bin at index i+s in another histogram, where s is the no-cost shift. 9. The device of claim 1 , wherein the one or more computer-readable media further include instructions for identifying a patch in the second image that is most similar to the patch in the first image based on the respective distances. 10. A method comprising: obtaining a first image; obtaining a second image; and calculating respective dissimilarity scores between a histogram from a patch in the first image and respective histograms from patches in the second image, wherein calculating the respective dissimilarity score between the histogram from the patch in the first image and at least one of the respective histograms from the patches in the second image is based in part on a no-cost shift, and wherein the no-cost shift indicates a shift that is applied to a plurality of bins in either the histogram from the patch in the first image or the at least one of the respective histograms from the patches in the second image and that does not count toward the dissimilarity score between the histogram from the patch in the first image and the at least one of the respective histograms from the patches in the second image. 11. The method of claim 10 , wherein the dissimilarity score is an Earth Mover's Distance. 12. The method of claim 11 , wherein the Earth Mover's Distance is a shift-invariant Earth Mover's Distance. 13. The method of 10 , wherein the patches in the second image partially overlap each other. 14. The method of claim 10 , further comprising: identifying a patch in the second image that is most similar to the patch in the first image based on the respective dissimilarity scores. 15. The method of claim 14 , further comprising: adding the dissimilarity score of the patch in the second image that is most similar to the patch in the first image to an image-similarity map. 16. The method of claim 10 , wherein calculating each of the respective dissimilarity scores includes calculating a difference between a number of pixels in a bin at index i in one histogram and a number of pixels in a bin at index i+s in another histogram, where s is the no-cost shift. 17. One or more computer-readable media storing computer-executable instructions that, when executed by one or more computing devices, cause the one or more computing devices to perform operations comprising: obtaining a first image; obtaining a second image; and calculating respective dissimilarity scores between a histogram from a first patch in the first image and respective histograms from patches in the second image, wherein calculating the respective dissimilarity score between the histogram from the first patch in the first image and at least one of the respective histograms from the patches in the second image is based in part on a no-cost shift, and wherein the no-cost shift indicates a shift that is applied to a plurality of bins in either the histogram from the first patch in the first image or the at least one of the respective histograms from the patches in the second image and that does not count toward the dissimilarity score between the histogram from the first patch in the first image and the at least one of the respective histograms from the patches in the second image. 18. The one or more computer-readable media of claim 17 , further comprising: dividing the first image into a plurality of patches, wherein the plurality of patches includes the first patch, wherein each patch of the plurality of patches includes two or more feature patches, and wherein each of the two or more feature patches overlaps another feature patch. 19. The one or more computer-readable media of claim 17 , wherein calculating the respective dissimilarity scores between the histogram from the first patch in the first image and the respective histograms from the patches in the second image includes calculating a difference between a number of pixels in a bin at index i in one histogram and a number of pixels in a bin at index i+s in another histogram, where s is the no-cost shift. 20. The one or more computer-readable media of claim 17 , wherein the no-cost shift is based on a number of surplus pixels and on a total number of pixels.

Assignees

Inventors

Classifications

  • G06T7/0002Primary

    Inspection of images, e.g. flaw detection · CPC title

  • Detection or correction of errors, e.g. by rescanning the pattern or by human intervention; Evaluation of the quality of the acquired patterns · CPC title

  • by performing operations within image blocks; by using histograms, e.g. histogram of oriented gradients [HoG]; by summing image-intensity values; Projection analysis · CPC title

  • Feature extraction · CPC title

  • Involving statistics of pixels or of feature values, e.g. histogram matching · CPC title

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What does patent US10410084B2 cover?
Devices, systems, and methods obtain a first image, obtain a second image, calculate respective distances between a histogram from a patch in the first image to respective histograms from patches in the second image, and identify a patch in the second image that is most similar to the patch in the first image based on the respective distances.
Who is the assignee on this patent?
Canon Virginia Inc
What technology area does this patent fall under?
Primary CPC classification G06T7/0002. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Sep 10 2019 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 10 related publications on this page (citations in our corpus or others sharing the same primary CPC).