Sar-type analog-digital converter using residue integration
US-2019097648-A1 · Mar 28, 2019 · US
US10404270B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-10404270-B2 |
| Application number | US-201816013985-A |
| Country | US |
| Kind code | B2 |
| Filing date | Jun 21, 2018 |
| Priority date | Dec 6, 2017 |
| Publication date | Sep 3, 2019 |
| Grant date | Sep 3, 2019 |
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A semiconductor device includes; a loop filter that receives a differential analog signal and generates a residue signal indicating an error between an analog input signal and an feedback signal, a first ADC that receives the residue signal and generates a first digital representation, a second ADC that receives the analog input signal and generates a second digital representation corresponding to the analog input signal, and a digital to analog converter (DAC) that receives a sum of the first digital representation and the second digital representation and generates the analog feedback signal. At least the first ADC is a multi-bit Successive Approximation Register ADC.
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What is claimed is: 1. A semiconductor device comprising: a loop filter that receives a differential analog signal and generates a residue signal indicating an error between an analog input signal and an feedback signal; a first analog to digital converter (ADC) that receives the residue signal and generates a first digital representation; a second ADC that receives the analog input signal and generates a second digital representation corresponding to the analog input signal; and a digital to analog converter (DAC) that receives a sum of the first digital representation and the second digital representation and generates the analog feedback signal, wherein the first ADC is a multi-bit Successive Approximation Register ADC using a first step voltage. 2. The semiconductor device of claim 1 , wherein the second ADC is a multi-bit SAR ADC using a second step voltage less than or equal to the first step voltage. 3. The semiconductor device of claim 1 , further comprising: a first node that performs a subtraction operation between the analog input signal and the feedback signal to generate the differential analog signal. 4. The semiconductor device of claim 3 , wherein the loop filter further comprises: a gain block that receives the differential analog signal and performs a scaling operation on the differential analog signal to generate a scaled result; a first integrator that receives the scaled result and performs a first integral operation on the scaled result to generate a first integrated result; a first filter and a second filter that commonly receive the first integrated result, and respectively perform a first filter operation and a second filter operation; first sub-node that adds an output of the first filter to an output of the second filter to generate a summation result; and a second integrator which receives an output of the second node, performs a second integral operation to generate a second integrated result, and provides the second integrated result to the first ADC. 5. The semiconductor device of claim 4 , wherein the loop filter further comprises: a second sub-node that performs a subtraction operation between the second integrated result and the first digital representation provided by the first ADC; and a third filter that receives an output signal of the second sub-node and performs a third filter operation, wherein the first sub-node performs a subtraction operation between an output of the third filter and the summation result. 6. The semiconductor device of claim 1 , further comprising: a Signal Transfer Function (STF) block that receives the second digital representation from the second ADC and performs a preset digital signal processing. 7. The semiconductor device of claim 6 , further comprising: a third node that adds an output of the STF block to the first digital representation from the first ADC. 8. The semiconductor device of claim 7 , further comprising: a decimator that receives an output of the third node to generates a final digital output having N-bits, where ‘N’ is a natural number. 9. The semiconductor device of claim 1 , wherein the second ADC is a coarse ADC, and the first ADC is a fine ADC. 10. A semiconductor device comprising: a first node that performs a subtract operation between an analog input signal and a feedback signal to generate a differential analog signal; a second node that performs an addition operation on a first digital representation and a second digital representation; a digital to analog converter (DAC) that generates the feedback signal from an output of the second node; a gain block that performs an amplification operation on the differential analog signal; a first integrator that performs a first integral operation on the amplified differential analog signal to generate a first integrated result; a first filter that performs a first filter operation on the first integrated result, and a second filter that performs a second filter operation on the first integrated result; a first sub-node node that performs an addition operation on an output of the first filter and an output of the second filter; a second integrator that performs a second integral operation of an output of the first sub-node to generate a second integrated result; and a fine analog to digital converter (ADC) that generates the first digital representation from the second integral result. 11. The semiconductor device of claim 10 , further comprising: a coarse ADC that that generates the second digital representation from the analog input signal; a Signal Transfer Function (STF) block that receives the second digital representation and performs a preset digital signal processing; a third node performs an addition operation on an output of the STF block and the first digital representation; and a decimator that receives an output of the third node to generates a final digital output having N-bits, where ‘N’ is a natural number. 12. A method of operating a semiconductor device, the method comprising: generating a residue signal indicating an error between an analog input signal and a feedback signal using a loop filter that receives a differential analog signal; generating a first digital representation from the residue signal using a first analog to digital converter (ADC); generating a second digital representation from the analog input signal using a second ADC; and generating the feedback signal using a digital to analog converter (DAC) that receives a sum of the first digital representation and the second digital representation, wherein the first ADC is a multi-bit Successive Approximation Register ADC using a first step voltage. 13. The method of claim 12 , wherein the second ADC is a multi-bit SAR ADC using a second step voltage less than or equal to the first step voltage. 14. The method of claim 12 , further comprising: performing a subtraction operation at a first node between the analog input signal and the feedback signal to generate the differential analog signal. 15. The method of claim 14 , further comprising: performing a scaling operation on the differential analog signal using a gain block to generate a scaled result; performing a first integral operation on the scaled result to generate a first integrated result using a first integrator; performing a first filtering operation on the first integrated result using a first filter; performing a second filtering operation on the first integrated result using a second filter; adding an output of the first filter to an output of the second filter at a first sub-node to generate a summation result. 16. The method of claim 15 , further comprising: performing a subtraction operation between the second integrated result and the first digital representation at a second sub-node; performing a third filter operation on an output of the second sub-node using a third filter; and performing a subtraction operation between a result of the third filter operation and the summation result. 17. The method of claim 12 , further comprising: performing a preset digital signal processing on the second digital representation using a Signal Transfer Function (STF) block. 18. The method of claim 17 , further comprising: adding an output of the STF block to the first digital representation at a third node. 19. The method of claim 18 , further comprising: generating a final digital output having N-bits, where ‘N’ is a natural number, from an output of the third node using a decimator.
Details of the control circuitry, e.g. of the successive approximation register · CPC title
the quantiser being a multiple bit one · CPC title
with digital/analogue converter for supplying reference values to converter · CPC title
sequentially only, e.g. successive approximation type (converting more than one bit per step H03M1/14) · CPC title
the steps being performed sequentially in series-connected stages (H03M1/141, H03M1/143, H03M1/16 take precedence) · CPC title
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