Circuit arrangement for reducing power loss in the case of an active electrical current output of a field device
US-9225244-B2 · Dec 29, 2015 · US
US10401815B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-10401815-B2 |
| Application number | US-201715490789-A |
| Country | US |
| Kind code | B2 |
| Filing date | Apr 18, 2017 |
| Priority date | Apr 18, 2017 |
| Publication date | Sep 3, 2019 |
| Grant date | Sep 3, 2019 |
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A method includes determining a scan rate associated with each of a plurality of input/output (I/O) modules. The method also includes transmitting a read request message to at least one expansion controller that controls the plurality of I/O modules, the read request message having an align index field. The method further includes receiving a reply message from the at least one expansion controller for each of the I/O modules for which a value of the align index field of the read request message is an even multiple of the associated scan rate. The method also includes incrementing the value of the align index field. In addition, the method includes repeating the transmitting, receiving, and incrementing until the value of the align index field is greater than a threshold, wherein the threshold is a least common multiple of the scan rates of the plurality of I/O modules.
Opening claim text (preview).
What is claimed is: 1. A method comprising: determining a scan rate associated with each of a plurality of input/output (I/O) modules; transmitting a read request message to at least one expansion controller that controls the plurality of I/O modules, the read request message having an align index field; receiving a reply message from the at least one expansion controller for each of the I/O modules for which a value of the align index field of the read request message is an even multiple of the associated scan rate; incrementing the value of the align index field; and repeating the transmitting, receiving, and incrementing until the value of the align index field is greater than a threshold, wherein the threshold is a least common multiple of the scan rates of the plurality of I/O modules. 2. The method of claim 1 , wherein determining the scan rate associated with each I/O module comprises: determining a task cycle associated with transmission of the read request messages; determining a scan time of each I/O module; and dividing the scan time of each I/O module by the task cycle to determine the scan rate of each I/O module. 3. The method of claim 2 , wherein determining the scan rate associated with each I/O module further comprises: rounding one or more of the scan times to a multiple of the task cycle. 4. The method of claim 1 , further comprising: when the value of the align index field is greater than the threshold, setting the value of the align index field to one and repeating the transmitting, receiving, and incrementing. 5. The method of claim 1 , further comprising: determining the least common multiple of the scan rates of the plurality of I/O modules. 6. The method of claim 1 , wherein: each I/O module is coupled to a field device, and the reply message comprises a measurement value from the field device coupled to the I/O module associated with the reply message. 7. The method of claim 6 , wherein the at least one expansion controller, the plurality of I/O modules, and the field devices form part of an industrial process control and automation system. 8. An apparatus comprising: at least one network interface configured to communicatively connect to at least one expansion controller that controls a plurality of input/output (I/O) modules; and at least one processing device configured to: determine a scan rate associated with each of the I/O modules; transmit a read request message to the at least one expansion controller, the read request message having an align index field; receive a reply message from the at least one expansion controller for each of the I/O modules for which a value of the align index field of the read request message is an even multiple of the associated scan rate; increment the value of the align index field; and repeat the transmitting, receiving, and incrementing until the value of the align index field is greater than a threshold, wherein the threshold is a least common multiple of the scan rates of the plurality of I/O modules. 9. The apparatus of claim 8 , wherein to determine the scan rate associated with each I/O module, the at least one processing device is configured to: determine a task cycle associated with transmission of the read request messages; determine a scan time of each I/O module; and divide the scan time of each I/O module by the task cycle to determine the scan rate of each I/O module. 10. The apparatus of claim 9 , wherein to determine the scan rate associated with each I/O module, the at least one processing device is further configured to: round one or more of the scan times to a multiple of the task cycle. 11. The apparatus of claim 8 , wherein the at least one processing device is further configured to: when the value of the align index field is greater than the threshold, set the value of the align index field to one and repeat the transmitting, receiving, and incrementing. 12. The apparatus of claim 8 , wherein the at least one processing device is further configured to: determine the least common multiple of the scan rates of the plurality of I/O modules. 13. The apparatus of claim 8 , wherein: each I/O module is coupled to a field device, and the reply message comprises a measurement value from the field device coupled to the I/O module associated with the reply message. 14. The apparatus of claim 13 , wherein the apparatus comprises a controller configured for use in an industrial process control and automation system that includes the at least one expansion controller, the plurality of I/O modules, and the field devices. 15. A non-transitory computer readable medium containing instructions that, when executed by at least one processing device, cause the at least one processing device to: determine a scan rate associated with each of a plurality of input/output (I/O) modules; transmit a read request message to at least one expansion controller that controls the plurality of I/O modules, the read request message having an align index field; receive a reply message from the at least one expansion controller for each of the I/O modules for which a value of the align index field of the read request message is an even multiple of the associated scan rate; increment the value of the align index field; and repeat the transmitting, receiving, and incrementing until the value of the align index field is greater than a threshold, wherein the threshold is a least common multiple of the scan rates of the plurality of I/O modules. 16. The non-transitory computer readable medium of claim 15 , wherein the instructions to determine the scan rate associated with each I/O module comprise instructions to: determine a task cycle associated with transmission of the read request messages; determine a scan time of each I/O module; and divide the scan time of each I/O module by the task cycle to determine the scan rate of each I/O module. 17. The non-transitory computer readable medium of claim 16 , wherein the instructions to deter mine the scan rate associated with each I/O module further comprise instructions to: round one or more of the scan times to a multiple of the task cycle. 18. The non-transitory computer readable medium of claim 15 , further containing instructions that, when executed by the at least one processing device, cause the at least one processing device to: when the value of the align index field is greater than the threshold, set the value of the align index field to one and repeat the transmitting, receiving, and incrementing. 19. The non-transitory computer readable medium of claim 15 , further containing instructions that, when executed by the at least one processing device, cause the at least one processing device to: determine the least common multiple of the scan rates of the plurality of I/O modules. 20. The non-transitory computer readable medium of claim 15 , wherein: each I/O module is coupled to a field device, and the reply message comprises a measurement value from the field device coupled to the I/O module associated with the reply message.
Input/output · CPC title
Input/output · CPC title
Synchronize microprocessor with process or I-O · CPC title
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