Line fault signature analysis

Patent metadata

Field	Value
Publication number	US-10401412-B2
Application number	US-201715844235-A
Country	US
Kind code	B2
Filing date	Dec 15, 2017
Priority date	Dec 16, 2016
Publication date	Sep 3, 2019
Grant date	Sep 3, 2019

Abstract

In described examples, a time-domain analyzer is arranged to generate an indication of a number of high-frequency events of an electrical monitor signal that includes a fundamental periodic frequency. The high-frequency events include frequencies higher than the fundamental periodic frequency. A frequency-domain analyzer is arranged to generate frequency band information in response to frequencies of the electrical monitor signal that are higher than the fundamental periodic frequency. A fault detector is arranged to monitor the indication of the number of high-frequency events and the generated frequency band information, and to generate a fault flag in response to the monitored indication of the number of high-frequency events and the generated frequency band information.

First claim

What is claimed is:

1. An apparatus comprising:
a time-domain analyzer arranged to generate an indication of a number of high-frequency events of an electrical monitor signal that includes a fundamental periodic frequency, wherein the high-frequency events include frequencies higher than the fundamental periodic frequency, and wherein the high-frequency events are correlated with a correlated time period that is less than a half cycle of the fundamental period;
a frequency-domain analyzer arranged to generate frequency band information in response to frequencies of the electrical monitor signal that are higher than the fundamental periodic frequency, and wherein the frequency band information is correlated with the correlated time period; and
a fault detector arranged to monitor the indication of the number of high-frequency events and the generated frequency band information, and to generate a flag in response to the monitored indication of the number of high-frequency events, the generated frequency band information, and the correlated time period.

2. The apparatus of claim 1 , comprising a wave segment determinator arranged to determine zero crossings of the electrical monitor signal and to divide the electrical monitor signal into wave segments, and wherein the correlated time period is associated with at least one of the wave segments.

3. The apparatus of claim 1 , comprising a signature library that includes thresholds of number of high-frequency events and thresholds of frequency band information for identifying fault conditions, and wherein the monitoring the indication of the number of high-frequency events and the generated frequency band information includes comparing the indication of the number of high-frequency events and the generated frequency band information against the respective thresholds of event and frequency band information for identifying fault conditions.

4. The apparatus of claim 1 , wherein the fundamental periodic frequency is a power line frequency of a power line signal, wherein the electrical monitor signal is generated in response to the power line signal.

5. The apparatus of claim 4 , wherein the waveform segment is time-aligned proximate to a zero crossing of the electrical monitor signal.

6. The apparatus of claim 1 , wherein the fault detector is arranged to monitor the indication of the number of high-frequency events and the generated frequency band information, and to generate the flag in less than a half cycle of the fundamental period after the occurrence of the high-frequency events on the electrical monitor signal.

7. The apparatus of claim 1 , wherein a processor of the frequency domain analyzer is arranged to be activated for processing wave segment samples sampled in response to the indication of a number of high-frequency events.

8. The apparatus of claim 7 , wherein the processor of the frequency domain analyzer is arranged to be deactivated during a portion of the fundamental periodic frequency electrical monitor signal.

9. The apparatus of claim 8 , wherein the fault analyzer includes a general processor capable of being deactivated when the processor of the frequency domain analyzer is executing instructions.

10. The apparatus of claim 7 , wherein the processor of the frequency domain analyzer is arranged to FFT the sample set.

11. The apparatus of claim 7 , wherein the processor of the frequency domain analyzer is arranged to bandpass filter the sample set.

12. The apparatus of claim 7 , wherein the fault detector includes a signature library that includes time-domain and frequency-domain signatures for indicating thresholds for fault conditions of a power line monitored by the electrical monitor signal.

13. The apparatus of claim 1 , comprising a sensor arranged to generate the electrical monitor signal in response to fluctuations of a power line signal, wherein the fluctuations of the power signal are generated in response to fault conditions of the power line signal.

14. The apparatus of claim 1 , wherein the frequency-domain analyzer includes a processor, wherein the fault detector includes a processor, and wherein the processor of the frequency-domain analyze and the processor of the fault detector are formed on a single substrate.

15. A system comprising:
a time-domain analyzer including a comparator and counter arranged to generate an indication of a number of high-frequency events of an electrical monitor signal that includes a fundamental periodic frequency, wherein the high-frequency events include frequencies higher than the fundamental periodic frequency, and wherein the high-frequency events are correlated with a correlated time period that is less than a half cycle of the fundamental period;
a frequency-domain analyzer including a first processor that is arranged to generate frequency band information in response to frequencies of the electrical monitor signal that are higher than the fundamental periodic frequency, and wherein the frequency band information is correlated with the correlated time period; and
a fault detector including a second processor that is arranged to monitor the indication of the number of high-frequency events and the generated frequency band information, and to generate a flag in response to the monitored indication of the number of high-frequency events, the generated frequency band information, and the correlated time period.

16. The system of claim 15 , wherein the first and second processors are formed on the same substrate.

17. The apparatus of claim 15 , comprising a wave segment determinator arranged to determine zero crossings of the electrical monitor signal and to divide the electrical monitor signal into wave segments, and wherein the correlated time period is associated with at least one of the wave segments.

18. The apparatus of claim 15 , comprising:
a signature library that includes thresholds of number of high-frequency events and thresholds of frequency band information for identifying fault conditions, and wherein the monitoring the indication of the number of high-frequency events and the generated frequency band information includes comparing the indication of the number of high-frequency events and the generated frequency band information against the respective thresholds of event and frequency band information for identifying fault conditions; and
a trip mechanism arranged to break an electrical connection in response to the generated flag.

19. A method comprising:
generating an indication of a number of high-frequency events of an electrical monitor signal that includes a fundamental periodic frequency, wherein the high-frequency events include frequencies higher than the fundamental periodic frequency, and wherein the high-frequency events are correlated with a correlated time period that is less than a half cycle of the fundamental period;
generating frequency band information in response to frequencies of the electrical monitor signal that are higher than the fundamental periodic frequency, and wherein the frequency band information is correlated with the correlated time period;
monitoring the indication of the number of high-frequency events and the generated frequency band information; and
generating a flag in response to the monitored indication of the number of high-frequency events, the generated frequency band information, and the correlated time period.

20. The method of claim 19 , comprising comparing the indication of the number of high-frequency events and the generated frequency band inform

Assignees

• Texas Instruments Inc

Inventors

• Rajagopal Prasanna U
• Sreenivasa Kallikuppa M
• Kumbasi Amit G

Classifications

• G01R31/08

  Locating faults in cables, transmission lines, or networks · CPC title

• G01R19/2513

  Arrangements for monitoring electric power systems, e.g. power lines or loads; Logging · CPC title

• G01R31/2612

  for measuring frequency response characteristics, e.g. cut-off frequency thereof · CPC title

• G01R31/024

  Physics · mapped topic

• G01R31/022 Primary

  Physics · mapped topic