Manufacturing method of contact probes for a testing head

Patent metadata

Field	Value
Publication number	US-10401387-B2
Application number	US-201715640159-A
Country	US
Kind code	B2
Filing date	Jun 30, 2017
Priority date	Dec 30, 2014
Publication date	Sep 3, 2019
Grant date	Sep 3, 2019

Abstract

A manufacturing method of contact probes for a testing head comprises the steps of: providing a substrate made of a conductive material; and defining at least one contact probe by laser cutting the substrate. The method further includes at least one post-processing fine definition step of at least one end portion of the contact probe, that follows the step of defining the contact probe by laser cutting, the end portion being a portion including a contact tip or a contact head of the contact probe. The fine definition step does not involve a laser processing and includes geometrically defining the end portion of the contact probe with at least a substantially micrometric precision.

First claim

The invention claimed is:

1. A manufacturing method of contact probes for a testing head comprising the steps of:
providing a substrate made of a conductive material;
laser cutting at least one contact probe in the substrate; and
at least one post-processing fine definition step that defines at least one end portion of the contact probe, following the step of laser cutting the contact probe, the end portion being a portion including a contact tip or a contact head of the contact probe,
the post-processing fine definition step being simultaneously carried out on the plurality of contact probes formed in the substrate by the laser cutting step and not involving a laser processing and geometrically defining the end portion of the contact probe with at least a substantially micrometric precision.

2. The manufacturing method of claim 1 , further comprising:
a step of assembling the plurality of contact probes in a processing frame or in a testing head so as to allow displacement and manipulation thereof as a group.

3. The manufacturing method of claim 1 , wherein the post-processing fine definition step includes a micromechanical definition step of the end portion of the contact probe.

4. The manufacturing method of claim 3 , wherein the micromechanical definition step comprises a pressing contact onto an abrasive cloth of the end portion of the contact probe.

5. The manufacturing method of claim 1 , wherein the post-processing fine definition step comprises a chemical or electrochemical process.

6. The manufacturing method of claim 5 , wherein the chemical or electrochemical process includes an immersion of the end portion of the contact probe in a chemical agent up to a level, the chemical agent being adapted to etch the end portion of the contact probe.

7. The manufacturing method of claim 1 , wherein the post-processing fine definition step comprises a re-shape of the end portion of the contact probe.

8. The manufacturing method of claim 1 , wherein the post-processing fine definition step comprises a cleaning of the end portion of the contact probe.

9. The manufacturing method of claim 1 , wherein the post-processing fine definition step comprises a re-shape and a cleaning of the end portion of the contact probe.

10. The manufacturing method of claim 1 , wherein:
the step of laser cutting realizes each contact probe anchored to the substrate by at least one bridge of material; and the method comprises:
a further step of separation of each contact probe from the substrate by breaking and removing the at least one bridge of material.

11. The manufacturing method of claim 10 , wherein the at least one bridge of material is realized in correspondence of an end portion of the contact probe and the post-processing fine definition step of the end portion of the contact probe eliminates any imperfections due to the breakage and removal of the bridge of material.

12. The manufacturing method of claim 10 , wherein the post-processing fine definition step is simultaneously carried out on a plurality of contact probes anchored to the substrate prior to the further step of separation of each contact probe from the substrate.

13. The manufacturing method of claim 12 , further comprising:
a step of cutting the substrate in portions not belonging to the contact probes and not comprising the at least one bridge of material, the contact probes protruding from the substrate in correspondence of at least one end portion.

14. The manufacturing method of claim 1 , further comprising:
a step of shortening the end portion of the contact probe preceding the post-processing fine definition step.

15. The manufacturing method of claim 1 , wherein the post-processing fine definition step is repeated for a plurality of contact probes assembled in a testing head during the life thereof.

16. The manufacturing method of claim 15 , wherein the post-processing fine definition step is preceded by a step of shortening respective end portions of the contact probes.

17. A planarization method of a testing head provided with at least one upper guide and one lower guide and comprising a plurality of contact probes, the guides having respective upper and lower guide holes, each contact probe sliding therethrough, the planarization method comprising the steps of:
shortening at least one end portion of the contact probes which protrudes with respect to the lower guide in a plane substantially parallel to a plane of a device to be tested by the testing head; and
fine defining the at least one end portion of the contact probes,
the fine defining step being simultaneously carried out on the plurality of contact probes formed in the substrate by the laser cutting step and not involving a laser processing and geometrically defining the end portion of the contact probe with at least a substantially micrometric precision, so obtaining a testing head with contact probes having end portions all of a same length and geometrically defined with at least a substantially micrometric precision.

18. A manufacturing method of contact probes for a testing head comprising the steps of:
providing, a substrate made of a conductive material;
laser cutting a plurality of contact probes in the substrate; and
assembling the plurality of contact probes in a processing frame or in a testing head so as to allow the displacement and manipulation of the contact probes as a group; and
at least one post-processing, fine definition step of at least one end portion of the contact probes, which follows the steps of laser cutting and assembling the contact probes and is simultaneously carried out on the plurality of contact probes,
the at least one end portion being, a portion including a contact tip or a contact head of at least one of the contact probes, and
the post-processing fine definition step being simultaneously carried out onto the plurality of contact probes formed in the substrate by the laser cutting step and not involving a laser processing and further including:
a micromechanical definition step comprising a pressing contact onto an abrasive cloth of the end portion of the contact probes assembled in the processing frame or in the testing head, so geometrically defining the end portion of the contact probe with at least a substantially micrometric precision less than 10 micrometers (μm).

19. The manufacturing method of claim 18 , wherein the post-processing fine definition step comprises a re-shape of the end portion of the contact probe.

20. The manufacturing method of claim 18 , wherein the post-processing fine definition step comprises a cleaning of the end portion of the contact probe.

21. The manufacturing method of claim 18 , wherein the post-processing fine definition step comprises a re-shape and a cleaning of the end portion of the contact probe.

22. The manufacturing method of claim 18 , wherein:
the step of laser cutting realizes each contact probe anchored to the substrate by at least one bridge of material,
the method further comprising
a step of separation of each contact probe from the substrate by breaking and removing the at least one bridge of material.

23. The manufacturing method of claim 22 , wherein:
the at least one bridge of material is realized in correspondence of an end portion of the at least one contact probe, and
the post-processing fine definition step of the end portion eliminates any imperfections due to the breakage and removal of the at least one bridge of ma

Assignees

• Technoprobe Spa

Inventors

• Vallauri Raffaele Ubaldo

Classifications

• G01R1/0408

  Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets (G01R1/067 takes precedence; mass production testing systems G01R31/59; testing of connections G01R31/66; for testing printed circuit boards G01R31/2808) · CPC title

• G01R1/06744 Primary

  Microprobes, i.e. having dimensions as IC details · CPC title

• G01R1/07307

  with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card · CPC title

• G01R1/07371

  using an intermediate card or back card with apertures through which the probes pass · CPC title

• G01R3/00 Primary

  Apparatus or processes specially adapted for the manufacture {or maintenance} of measuring instruments {, e.g. of probe tips} · CPC title