Dual-energy detection apparatus, system and method

Patent metadata

Field	Value
Publication number	US-10401308-B2
Application number	US-201615278470-A
Country	US
Kind code	B2
Filing date	Sep 28, 2016
Priority date	Dec 29, 2015
Publication date	Sep 3, 2019
Grant date	Sep 3, 2019

Abstract

The present application relates to a dual-energy detection method, system and apparatus. The apparatus includes: a first pixel detector array proximal to a ray source, configured to detect ray source photons having relatively low energy; and a second pixel detector array distal from the ray source, configured to detect ray source photons having relatively high energy; wherein the first pixel detector array includes a plurality of rows of first pixel detectors, the first pixel detector including a first sensitive medium, a first photosensitive device, a first incidence plane, and a first window; the second pixel detector array includes a single row of second pixel detectors, the second pixel detector including a second sensitive medium, a second photosensitive device, a second incidence plane, and a second window; and each of the second pixel detectors has the same pixel area as corresponding plurality of first pixel detectors thereof.

First claim

The invention claimed is:

1. A dual-energy detection apparatus, comprising:
a first pixel detector array proximal to a ray source, configured to detect ray source photons having relatively low energy; and
a second pixel detector array distal from the ray source, configured to detect the ray source photons having relatively high energy which have passed through the first pixel detector array;
wherein the first pixel detector array comprises a plurality of rows of first pixel detectors, an amount of the first pixel detectors in each row is identical and the first pixel detectors at corresponding positions are aligned, the first pixel detector comprising a first sensitive medium, a first photosensitive device, a first incidence plane for incidence of the ray source, and a first window coupled to the first photosensitive device, the first incidence plane facing towards the ray source;
wherein the second pixel detector array comprises a single row of second pixel detectors, the second pixel detector comprising a second sensitive medium, a second photosensitive device, a second incidence plane for incidence of the ray source, and a second window coupled to the second photosensitive device;
wherein each of the second pixel detectors has the same pixel area as corresponding plurality of first pixel detectors thereof;
wherein the first sensitive medium is a first scintillator; each of the first pixel detectors comprises the first scintillator having a rectangular shape and a first reflection layer coating the first scintillator, the first reflection layer exposing the first window; and one side of each of the first pixel detectors opposite to the first window is the first incidence plane; and
wherein the first pixel detector array and the second pixel detector array are configured to detect megavolt-level ray source photons, and lateral sizes and secondary electron ranges of the first pixel detectors are identical.

2. The apparatus according to claim 1 , wherein the second sensitive medium is a second scintillator; and each of the second pixel detectors comprises the second scintillator having a rectangular shape and a second reflection layer coating the second scintillator, the second reflection layer exposing the second window.

3. The apparatus according to claim 1 , wherein the first pixel detector further comprises a first data collection board.

4. The apparatus according to claim 1 , wherein the second pixel detector further comprises a second data collection board.

5. The apparatus according to claim 1 , wherein the ray source comprises an X-ray source and an isotopic source.

6. The apparatus according to claim 1 , wherein a mass thickness of the first pixel detector is determined based on any one or any combination of the type of the ray source, the type of the first sensitive medium and the size of the pixel.

7. The apparatus according to claim 6 , wherein a mass thickness of the second pixel detector is selected such that the second pixel detector array is capable of effectively detecting the ray source photons having relatively high energy, and the mass thickness of the second pixel detector is greater than the mass thickness of the first pixel detector.

8. A dual-energy detection system, comprising:
a ray source located on one side of a to-be-detected object; and
a dual-energy detection apparatus located on the other side of the to-be-detected object;
wherein the dual-energy detection apparatus comprises:
a first pixel detector array proximal to the ray source, configured to detect ray source photons having relatively low energy; and
a second pixel detector array distal from the ray source, configured to detect the ray source photons having relatively high energy which have passed through the first pixel detector array;
wherein the first pixel detector array comprises a plurality of rows of first pixel detectors, an amount of the first pixel detectors in each row is identical and the first pixel detectors at corresponding positions are aligned, the first pixel detector comprising a first sensitive medium, a first photosensitive device, a first incidence plane for incidence of the ray source, and a first window coupled to the first photosensitive device, the first incidence plane facing towards the ray source;
the second pixel detector array comprises a single row of second pixel detectors, the second pixel detector comprising a second sensitive medium, a second photosensitive device, a second incidence plane for incidence of the ray source, and a second window coupled to the second photosensitive device; and

each of the second pixel detectors has the same pixel area as corresponding plurality of first pixel detectors thereof,
wherein the first sensitive medium is a first scintillator; each of the first pixel detectors comprises the first scintillator having a rectangular shape and a first reflection layer coating the first scintillator, the first reflection layer exposing the first window; and one side of each of the first pixel detectors opposite to the first window is the first incidence plane, and
wherein the first pixel detector array and the second pixel detector array are configured to detect megavolt-level ray source photons, and lateral sizes and secondary electron ranges of the first pixel detectors are identical.

9. The system according to claim 8 , wherein the first pixel detector further comprises a first data collection board.

10. The system according to claim 9 , wherein the second pixel detector further comprises a second data collection board.

11. The system according to claim 10 , further comprising a processing apparatus, wherein the processing apparatus is respectively connected to the first data collection board and the second data collection board, reads output signals of the first pixel detector array and the second pixel detector array, and acquires effective atomic number information of the to-be-detected object based on the output signals.

12. The system according to claim 8 , wherein the ray source comprises an X-ray source and an isotopic source.

13. A dual-energy detection method, comprising:
arranging a first pixel detector array proximal to a ray source, which is configured to detect ray source photons having relatively low energy, wherein the first pixel detector array comprises a plurality of rows of first pixel detectors, an amount of the first pixel detectors in each row is identical and the first pixel detectors at corresponding positions are aligned, the first pixel detector comprising a first scintillator, a first photosensitive device, a first incidence plane for incidence of the ray source, and a first window coupled to the first photosensitive device, the first incidence plane facing towards the ray source;
arranging a second pixel detector array distal from the ray source, which is configured to detect the ray source photons having relatively high energy which have passed through the first pixel detector array, wherein the second pixel detector array comprises a single row of second pixel detectors, the second pixel detector comprising a second scintillator, a second photosensitive device, a second incidence plane for incidence of the ray source, and a second window coupled to the second photosensitive device, each of the second pixel detectors having the same pixel area as corresponding plurality of first pixel detectors thereof; and
irradiating the first pixel detector array from the first incidence plane by using the ray source,
wherein the first sensitive medium is a first scintillator; each of the first pixel detectors comprises the first scintillator having a rectangular shape and a first reflectio

Assignees

• Nuctech Co Ltd

Inventors

• Zhang Qingjun
• Li Yuanjing
• Li Shuwei
• Zhao Ziran
• Zhu Weibin
• Wang Junxiao
• Li Jianhua

Classifications

• G01T1/2008

  using a combination of different types of scintillation detectors, e.g. phoswich · CPC title

• G01N23/087 Primary

  using polyenergetic X-rays · CPC title

• G01N2223/505

  scintillation · CPC title

• G01N2223/202

  isotopes · CPC title

• G01N23/046

  using tomography, e.g. computed tomography [CT] · CPC title