Semiconductor device

US10396008B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-10396008-B2
Application numberUS-201715855210-A
CountryUS
Kind codeB2
Filing dateDec 27, 2017
Priority dateJan 27, 2017
Publication dateAug 27, 2019
Grant dateAug 27, 2019

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

    Technology tags used to group this patent with similar filings.

  7. Citations and related patents

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Abstract

Official abstract text for this publication.

A semiconductor device includes a first metal plate and a second metal plate which interpose a first semiconductor element therebetween, the first metal plate and the second metal plate being bonded to the first semiconductor element with first soldered portions; and includes a third metal plate and a fourth metal plate which interpose a second semiconductor element therebetween, the third metal plate and the fourth metal plate being bonded to the second semiconductor element with second soldered portions. A first joint provided at an edge of the first metal plate and a second joint provided at an edge of the fourth metal plate are bonded with a third soldered portion. A total sum of thicknesses of the first soldered portions is different from a thickness of the third soldered portion, a solidifying point of the thinner one is higher than a solidifying point of the thicker one.

First claim

Opening claim text (preview).

What is claimed is: 1. A semiconductor device comprising: a first semiconductor element and a second semiconductor element, each of the first semiconductor element and the second semiconductor element comprising electrodes on both surfaces thereof; a first metal plate and a second metal plate which interpose the first semiconductor element therebetween, the first metal plate and the second metal plate respectively being bonded to the electrodes of the first semiconductor element with respective first soldered portions; a third metal plate and a fourth metal plate which interpose the second semiconductor element therebetween, the third metal plate and the fourth metal plate respectively being bonded to the electrodes of the second semiconductor element with respective second soldered portions; and a resin package in which the first semiconductor element and the second semiconductor element are embedded, the first metal plate and the third metal plate being exposed at one surface of the resin package, and the second metal plate and the fourth metal plate being exposed at an opposite surface to the one surface of the resin package, wherein a first joint is provided at an edge of the first metal plate, a second joint is provided at an edge of the fourth metal plate, the first joint overlaps with the second joint as seen along a direction in which the first metal plate and the first semiconductor element are stacked, the first joint and the second joint are bonded with a third soldered portion, a total sum of thicknesses of the first soldered portions between the first metal plate and the second metal plate is different from a thickness of the third soldered portion between the first joint and the second joint, a solidifying point of a thinner one of the first soldered portions and the third soldered portion is higher than a solidifying point of a thicker one of the first soldered portions and the third soldered portion, and a total sum of thicknesses of the second soldered portions between the third metal plate and the fourth metal plate is different from the thickness of the third soldered portion between the first joint and the second joint, a solidifying point of a thinner one of the second soldered portions and the third soldered portion is higher than a solidifying point of a thicker one of the second soldered portions and the third soldered portion. 2. The semiconductor device as in claim 1 , wherein the total sum of the thicknesses of the first soldered portions is thinner than the thickness of the third soldered portion, and the total sum of the thicknesses of the second soldered portions is thinner than the thickness of the third soldered portion.

Assignees

Inventors

Classifications

  • between a chip and a stacked lead frame, conducting package substrate or heat sink · CPC title

  • having another interconnection being formed by a cover plate parallel to the conductive base, e.g. sandwich type · CPC title

  • H10W74/111Primary

    the semiconductor body being completely enclosed · CPC title

  • Multiple chips on leadframes · CPC title

  • Package configurations · CPC title

Patent family

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External sources

Frequently asked questions

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What does patent US10396008B2 cover?
A semiconductor device includes a first metal plate and a second metal plate which interpose a first semiconductor element therebetween, the first metal plate and the second metal plate being bonded to the first semiconductor element with first soldered portions; and includes a third metal plate and a fourth metal plate which interpose a second semiconductor element therebetween, the third meta…
Who is the assignee on this patent?
Toyota Motor Co Ltd
What technology area does this patent fall under?
Primary CPC classification H10W74/111. Mapped technology areas include Electricity.
When was this patent published?
Publication date Tue Aug 27 2019 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 7 related publications on this page (citations in our corpus or others sharing the same primary CPC).