Mass spectrometer

Patent metadata

Field	Value
Publication number	US-10388500-B2
Application number	US-201715619726-A
Country	US
Kind code	B2
Filing date	Jun 12, 2017
Priority date	Jul 21, 2005
Publication date	Aug 20, 2019
Grant date	Aug 20, 2019

Abstract

A mass spectrometer is disclosed comprising a mass selective ion trap and a quadrupole rod set mass filter arranged downstream of the mass selective ion trap. Ions are mass selectively ejected from the ion trap in a substantially synchronized manner with the scanning of the mass filter in order to increase the duty cycle of the mass filter.

First claim

The invention claimed is:

1. A method of performing mass spectrometry including:
sequentially and selectively ejecting ions from a mass selective ion trap or ion guide according to the mass to charge ratio of the ions;
directing the ejected ions to a mass scanning mass spectrometer; and
scanning the mass of the ions transmitted by the mass scanning mass spectrometer;
in which the ejection of the ions from the ion trap or ion guide and the scanning of the mass scanning mass spectrometer are synchronised so that the mass of at least some of the ions directed into the mass scanning mass spectrometer corresponds to the mass of the ions transmitted by the mass scanning mass spectrometer,
wherein the mass or mass to charge ratio resolution of said first mass filter/analyser or mass spectrometer is greater than the mass or mass to charge ratio resolution of said ion trap or ion guide.

2. A mass spectrometer comprising:
a mass or mass to charge ratio selective ion trap or ion guide comprising a plurality of electrodes;
a first mass filter/analyser or mass spectrometer arranged downstream of said mass or mass to charge ratio selective ion trap or ion guide;
control means arranged and adapted:
(i) to cause ions to be selectively ejected or released from said ion trap or ion guide according to their mass or mass to charge ratio; and
(ii) to scan said first mass filter/analyser or mass spectrometer in a substantially synchronised manner with the selective ejection or release of ions from said ion trap or ion guide; and
means arranged and adapted to apply one or more DC voltages or one or more DC voltage waveforms to said plurality of electrodes in order to urge ions along the length of said ion trap or ion guide,
wherein the mass or mass to charge ratio resolution of said first mass filter/analyser or mass spectrometer is greater than the mass or mass to charge ratio resolution of said ion trap or ion guide.

3. A mass spectrometer as claimed in claim 2 , wherein said first mass filter/analyser or mass spectrometer comprises a quadrupole rod set mass filter/analyser or mass spectrometer.

4. A mass spectrometer as claimed in claim 2 , wherein said control means is arranged and adapted to cause ions to be sequentially or progressively ejected or released from said ion trap or ion guide according to their mass or mass to charge ratio.

5. A mass spectrometer as claimed in claim 2 , wherein said control means is arranged and adapted to synchronise the selective ejection or release of ions from said ion trap or ion guide with the scanning of a mass or mass to charge ratio transmission window of said first mass filter/analyser or mass spectrometer.

6. A mass spectrometer as claimed in claim 2 , wherein said ion trap or ion guide comprises a plurality of electrodes having apertures wherein ions are transmitted, in use, through said apertures.

7. A mass spectrometer as claimed in claim 2 , further comprising AC or RF voltage means arranged and adapted to apply an AC or RF voltage to at least some of said plurality of electrodes.

8. A mass spectrometer as claimed in claim 2 , wherein said ion trap or ion guide comprises means for confining ions radially within said ion trap.

9. A mass spectrometer as claimed in claim 2 , wherein said ion trap or ion guide comprises means for generating a plurality of axial pseudo-potential wells having a periodicity.

10. A mass spectrometer as claimed in claim 9 , wherein the amplitude of said axial pseudo-potential wells is dependent upon the mass to charge ratio of an ion.

11. A mass spectrometer as claimed in claim 2 , wherein said ion trap or ion guide comprises first means arranged and adapted to maintain one or more DC, real or static potential wells or a substantially static inhomogeneous electric field along at least a portion of the axial length of said ion trap or ion guide in a first mode of operation.

12. A mass spectrometer as claimed in claim 11 , wherein said ion trap or ion guide comprises second means arranged and adapted to maintain a time varying substantially homogeneous axial electric field along at least a portion of the axial length of said ion trap or ion guide in said first mode of operation.

13. A mass spectrometer as claimed in claim 2 , further comprising ejection means arranged and adapted to mass or mass to charge ratio selectively eject ions from said ion trap or ion guide.

14. A mass spectrometer as claimed in claim 13 , wherein said ejection means is arranged and adapted in a first mode of operation to eject ions substantially axially from said ion trap or ion guide.

15. A mass spectrometer as claimed in claim 2 , further comprising means arranged and adapted to apply one or more transient DC voltages or one or more transient DC voltage waveforms to said plurality of electrodes.

16. A mass spectrometer as claimed in claim 2 , further comprising means arranged and adapted to apply one or more transient DC voltages or one or more transient DC voltage waveforms to said plurality of electrodes initially at a first axial position, wherein said one or more transient DC voltages or one or more transient DC voltage waveforms are then subsequently provided at second, then third different axial positions along said ion trap or ion guide.

17. A mass spectrometer as claimed in claim 2 , further comprising means arranged to apply one or more trapping electrostatic potentials along the axial length of said ion trap or ion guide.

18. A mass spectrometer as claimed in claim 2 , wherein ions are urged along the length of the ion trap or ion guide by maintaining a constant or static DC voltage gradient along the length of the ion trap or ion guide.

19. A method of mass spectrometry comprising:
providing a mass or mass to charge ratio selective ion trap or ion guide;
providing a first mass filter/analyser or mass spectrometer downstream of said mass or mass to charge ratio selective ion trap or ion guide;
causing ions to be selectively ejected or released from said ion trap or ion guide according to their mass or mass to charge ratio;
scanning said first mass filter/analyser or mass spectrometer in a substantially synchronised manner with the selective ejection or release of ions from said ion trap or ion guide; and
applying one or more DC voltages or one or more DC voltage waveforms to said plurality of electrodes in order to urge ions along the length of said ion trap or ion guide,
wherein the mass or mass to charge ratio resolution of said first mass filter/analyser or mass spectrometer is greater than the mass or mass to charge ratio resolution of said ion trap or ion guide.

Assignees

• Micromass Ltd

Inventors

• Hoyes John

Classifications

• H01J49/422

  Two-dimensional RF ion traps (ion guides without mass selection H01J49/062) · CPC title

• H01J49/429

  Scanning an electric parameter, e.g. voltage amplitude or frequency · CPC title

• H01J49/004 Primary

  Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn · CPC title

• H01J49/4215

  Quadrupole mass filters (H01J49/4225 takes precedence) · CPC title

• C08L23/04

  Homopolymers or copolymers of ethene · CPC title