Scintillator, scintillator panel, radiation detector and method of manufacturing scintillator

US10386505B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-10386505-B2
Application numberUS-201715643909-A
CountryUS
Kind codeB2
Filing dateJul 7, 2017
Priority dateJul 8, 2016
Publication dateAug 20, 2019
Grant dateAug 20, 2019

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

According to one embodiment, a scintillator includes a first layer provided on a surface of a substrate and including thallium activated cesium iodide; and a second layer provided on the first layer and including thallium activated cesium iodide. The second layer includes crystals having a [001] orientation partially diverted from a direction perpendicular to the surface of the substrate. Half width at half maximum of a frequency distribution curve of an angle between the direction perpendicular to the surface of the substrate and the [001] orientation, which is obtained by measuring the angle using EBSD method, is 2.4 degree or less.

First claim

Opening claim text (preview).

What is claimed is: 1. A scintillator, comprising: a first layer provided on a surface of a substrate and including thallium activated cesium iodide; and a second layer provided on the first layer and including thallium activated cesium iodide, the second layer including crystals having a [001] orientation partially diverted from a direction perpendicular to the surface of the substrate, wherein half width at half maximum of a frequency distribution curve of an angle between the direction perpendicular to the surface of the substrate and the [001] orientation, which is obtained by measuring the angle using EBSD method, is 2.4 degree or less. 2. The scintillator according to claim 1 , wherein a thallium concentration in the first layer is higher than a thallium concentration in the second layer. 3. The scintillator according to claim 1 , wherein a thallium concentration in the first layer is 3 wt % or less. 4. The scintillator according to claim 1 , wherein a thallium concentration in the first layer is 2 wt % or less. 5. The scintillator according to claim 1 , wherein a thallium concentration in the first layer is 1.5 wt % or less. 6. The scintillator according to claim 1 , wherein the first layer has a thickness of 3 μm or less. 7. The scintillator according to claim 1 , wherein the second layer includes a plurality of columnar crystals. 8. A scintillator panel, comprising: a substrate being transmissive for radiation; and a scintillator provided on the substrate, wherein: the scintillator comprises: a first layer provided on a surface of the substrate and including thallium activated cesium iodide, and a second layer provided on the first layer and including thallium activated cesium iodide, the second layer including crystals having a [001] orientation partially diverted from a direction perpendicular to the surface of the substrate; and half width at half maximum of a frequency distribution curve of an angle between the direction perpendicular to the surface of the substrate and the [001] orientation, which is obtained by measuring the angle using EBSD method, is 2.4 degree or less. 9. The scintillator panel according to claim 8 , wherein a thallium concentration in the first layer is higher than a thallium concentration in the second layer. 10. The scintillator panel according to claim 8 , wherein a thallium concentration in the first layer is 3 wt % or less. 11. The scintillator panel according to claim 8 , wherein a thallium concentration in the first layer is 2 wt % or less. 12. The scintillator panel according to claim 8 , wherein a thallium concentration in the first layer is 1.5 wt % or less. 13. The scintillator panel according to claim 8 , wherein the first layer has a thickness of 3 μm or less. 14. A radiation detector, comprising: a substrate including a plurality of photoelectric conversion elements; and the scintillator according to claim 1 , the scintillator being provided on a region of the substrate, and the plurality of photoelectric conversion elements being provided in the region. 15. A radiation detector, comprising: a substrate including a plurality of photoelectric conversion elements; and the scintillator panel according to claim 8 , the scintillator panel being provided on a region of the substrate, and the plurality of photoelectric conversion elements being provided in the region.

Assignees

Inventors

Classifications

  • Optical details, e.g. reflecting or diffusing layers · CPC title

  • Halides · CPC title

  • Circuits specially adapted for scintillation detectors, e.g. for the photo-multiplier section · CPC title

  • Products containing multiple oriented crystallites, e.g. columnar crystallites · CPC title

  • G01T1/2023Primary

    Selection of materials · CPC title

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What does patent US10386505B2 cover?
According to one embodiment, a scintillator includes a first layer provided on a surface of a substrate and including thallium activated cesium iodide; and a second layer provided on the first layer and including thallium activated cesium iodide. The second layer includes crystals having a [001] orientation partially diverted from a direction perpendicular to the surface of the substrate. Half …
Who is the assignee on this patent?
Toshiba Electron Tubes & Devic, Canon Electron Tubes & Devices Co Ltd
What technology area does this patent fall under?
Primary CPC classification G01T1/2023. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Aug 20 2019 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).