Method and system for monitoring electrical isolation

Patent metadata

Field	Value
Publication number	US-10371735-B2
Application number	US-201514941740-A
Country	US
Kind code	B2
Filing date	Nov 16, 2015
Priority date	Nov 16, 2015
Publication date	Aug 6, 2019
Grant date	Aug 6, 2019

Abstract

A first voltage sensor measures a primary voltage between a first terminal of a tested device and electrical ground when a first switch and a second switch are in various on states or off states. In a test state either the first switch or the second switch is in an on state and in reference state both the first switch and the second switch are in on states. An observed leakage resistance is estimated based on the measured primary and secondary voltages of the test state. A reference leakage resistance is based on the measured primary and secondary voltages of the reference state. A test circuit has failed if the observed leakage resistance differs from the reference leakage resistance by more than a threshold amount.

First claim

The following is claimed:

1. A method for monitoring electrical isolation of a tested device by a test circuit, the method comprising:
activating a first switch of a test circuit, a second switch of the test circuit, or both to provide an on state or an off state for each one of the switches for a plurality of time intervals;
in a first state while the first switch is in the on state and the second switch is in the off state, during a separate time interval among the time intervals, measuring a primary voltage between a first terminal to electrical ground;
in a second state while the second switch is the on state and the first switch is in the off state, during a discrete time interval of the time intervals, measuring a secondary voltage between a second terminal to the electrical ground;
in a third state while the first switch and the second switch are in on states, during a compound time interval of the time intervals, measuring the primary voltage and the secondary voltage;
estimating an observed leakage resistance based on the measured primary voltages and secondary voltages of the first state and the second state;
estimating a reference leakage resistance based on the measured primary voltages and the measured secondary voltages of the third state; and
determining that the test circuit has failed if the observed leakage resistance differs from the reference leakage resistance by more than a threshold amount, where the observed leakage resistance is based on voltage measurements during the separate and distinct time intervals and where the reference leakage resistance is based on voltage measurements during at least the compound time interval that does not temporally overlap with the separate and distinct time intervals.

2. The method according to claim 1 wherein estimating an observed leakage resistance comprises:
measuring the secondary voltage in the first state during the separate time interval;
measuring the primary voltage in the second state during the discrete time interval; and
estimating an observed first leakage resistance between the first terminal and the electrical ground based on the measured primary voltages and measured secondary voltages in the first state during the separate time interval and in the second state during the discrete time interval.

3. The method according to claim 2 wherein estimating a reference leakage resistance comprises:
estimating a reference first leakage resistance between the first terminal and the electrical ground based on the measured primary voltages and measured secondary voltages in the third state during the compound time interval and in the second state during the discrete time interval.

4. The method according to claim 3 wherein determining that the test circuit has failed comprises:
determining that the test circuit has failed if the observed first leakage resistance differs from the reference first leakage resistance by more than a threshold amount.

5. The method according to claim 1 wherein estimating an observed leakage resistance comprises:
measuring the secondary voltage in the first state during the separate time interval;
measuring the primary voltage in the second state during the discrete time interval; and
estimating an observed second leakage resistance between the second terminal and the electrical ground based on the measured primary voltages and measured secondary voltages in the first state during the separate time interval and in the second state during the discrete time interval.

6. The method according to claim 5 wherein estimating a reference leakage resistance comprises:
estimating a reference second leakage resistance between the second terminal and the electrical ground based on the measured primary voltages and measured secondary voltages in the third state during the compound time interval and in the second state during the discrete time interval.

7. The method according to claim 6 wherein determining that the test circuit has failed comprises:
determining that the test circuit has failed if the observed second leakage resistance differs from the reference second leakage resistance by more than a threshold amount.

8. The method according to claim 1 wherein the separate time interval, the discrete time interval, and the compound interval occur in any order or permutation with respect to each other.

9. The method according to claim 1 wherein the threshold amount is approximately fifty-percent of the reference leakage resistance.

10. A method for monitoring electrical isolation of a tested device by a test circuit, the method comprising:
activating a first switch of a test circuit, a second switch of the test circuit, or both to provide an on state or an off state for each one of the switches for a plurality of time intervals;
in a first state while the first switch is in the on state and the second switch is in the off state, during a separate time interval among the time intervals, measuring a primary voltage between a first terminal to electrical ground;
in a second state while the second switch is the on state and the first switch is in the off state, during a discrete time interval of the time intervals, measuring a secondary voltage between a second terminal to the electrical ground;
in a third state while the first switch and the second switch are in on states, during a compound time interval of the time intervals, measuring the primary voltage and the secondary voltage;
in a fourth state while the first switch and the second switch are in off states, during a supplemental time interval of the time intervals, measuring the primary voltage and the secondary voltage;
estimating an observed leakage resistance based on the measured primary voltages and secondary voltages of the first state and the second state;
estimating a reference leakage resistance based on the measured primary voltages and secondary voltages of the third state; and
determining that the test circuit has failed if the observed leakage resistance differs from the reference leakage resistance by more than a threshold amount, where the observed leakage resistance is based on voltage measurements during the separate and distinct time intervals and where the reference leakage resistance is based on voltage measurements during at least the compound time interval that does not temporally overlap with the separate and distinct time intervals.

11. The method according to claim 10 wherein estimating an observed leakage resistance comprises:
measuring the secondary voltage in the first state during the separate time interval; and
measuring the primary voltage in the second state during the discrete time interval;
estimating an observed first leakage resistance between the first terminal and the electrical ground based on the measured primary voltages and measured secondary voltages in the first state during the separate time interval and in the second state during the discrete time interval.

12. The method according to claim 11 wherein estimating a reference leakage resistance comprises:
estimating a reference first leakage resistance between the first terminal and the electrical ground based on the measured primary voltages and measured secondary voltages in the third state during the compound time interval and in the fourth state during the supplemental time interval.

13. The method according to claim 12 wherein determining that the test circuit has failed comprises:
determining that the test circuit has failed if the observed first leakage resistance differs from the reference first leakage resistance by more than a threshold amount.

14. The metho

Assignees

• Deere & Co

Inventors

• Rodrigues Olsen A
• Clements Neal D
• Wanner Kent D

Classifications

• G01R27/025 Primary

  Measuring very high resistances, e.g. isolation resistances, i.e. megohm-meters · CPC title

• G01R27/18 Primary

  Measuring resistance to earth {, i.e. line to ground} · CPC title

• B60L3/0069

  relating to the isolation, e.g. ground fault or leak current · CPC title

• G01R31/025 Primary

  Physics · mapped topic

• G01R31/52

  Testing for short-circuits, leakage current or ground faults · CPC title