Methods for recovering metals from electronic waste, and related systems
US-2017362681-A1 · Dec 21, 2017 · US
US10358731B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-10358731-B2 |
| Application number | US-201615360991-A |
| Country | US |
| Kind code | B2 |
| Filing date | Nov 23, 2016 |
| Priority date | Apr 3, 2013 |
| Publication date | Jul 23, 2019 |
| Grant date | Jul 23, 2019 |
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This invention relates to a metal catalyst, a manufacturing method of the metal catalyst, and an electrochemical reduction method. The metal catalyst is manufactured by a method comprising providing a conductor to one side of an insulator, providing a fluid including a metal ion and an electron mediator to the other side of the insulator and providing a voltage to the conductor. The electrochemical reduction method comprises providing a conductor to one side of an insulator, providing a fluid including reduction material and an electron mediator to the other side of the insulator and providing a voltage to the conductor.
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What is claimed is: 1. A method, comprising: providing a conductor to one side of an insulator; providing a fluid including reduction material and an electron mediator to the other side of the insulator; providing a voltage to the conductor; and wherein the electron mediator moves into the insulator by the voltage. 2. The method of claim 1 , wherein the electron mediator receives electrons from the conductor and provides the electrons to the reduction material. 3. The method of claim 1 , wherein the electron mediator is selected from the group consisting of one or more of a hydrogen ion, a hydrogen atom and a hydrogen molecule. 4. The method of claim 1 , wherein the fluid comprises a solution or a gas, the solution comprises an aqueous solution or an organic solution, and the gas comprises hydrogen gas. 5. The method of claim 4 , wherein an electric current flows in the insulator by the voltage, and the size of the electric current is adjusted by a pH of the solution. 6. The method of claim 1 , wherein the conductor comprises a semiconductor or a metal doped by an n-type dopant or a p-type dopant. 7. The method of claim 1 , wherein the insulator is a dielectric layer, and the insulator comprises a semiconductor oxide, a metal oxide, a semiconductor nitride, a metal nitride or a polymer. 8. The method of claim 1 , wherein the insulator has a thickness of about 0.5 nm to about 100 μm.
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