Ship data consolidated management method and device
US-2018141618-A1 · May 24, 2018 · US
US10355920B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-10355920-B2 |
| Application number | US-201615209463-A |
| Country | US |
| Kind code | B2 |
| Filing date | Jul 13, 2016 |
| Priority date | Jul 13, 2016 |
| Publication date | Jul 16, 2019 |
| Grant date | Jul 16, 2019 |
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A machine monitoring system uses generically defined collection definitions, acquisition definitions, and measurement definitions to define machine data to be collected by machine monitoring devices and other data sources in a unified and device/source independent manner. Configuration software of the machine monitoring system defines data to be collected for a particular machine in such a manner that multiple different types of monitoring devices or data sources can each interpret the data definitions and provide the same type of data back to the software system. Thus, the data to be collected is defined once by the configuration software, and the data definition is interpreted internally by each monitoring device or data source. This greatly simplifies the monitoring system and provides the advantage that new monitoring devices can be added to the system to collect data without impacting the software configuration of the data required.
Opening claim text (preview).
What is claimed is: 1. A machine monitoring system for monitoring operational characteristics of one or more machine assets, the machine monitoring system comprising: a plurality of machine monitoring devices disposed in one or more measurement locations associated with the one or more machine assets, the plurality of machine monitoring devices comprising multiple different types of machine monitoring devices, each type of machine monitoring device having a data acquisition process that is different from data acquisition processes of other types of machine monitoring devices, wherein the data acquisition processes configure the machine monitoring devices to collect certain types of machine data according to certain measurement parameters; a computer for sending device-independent configuration settings to and receiving machine data from the plurality of machine monitoring devices, the computer operable to generate the configuration settings for use in the data acquisition processes of each of the multiple different types of machine monitoring devices, wherein the configuration settings are structured according to a hierarchal format that can be interpreted by all of the different types of machine monitoring devices for use in their data acquisition processes; and a database for storing the configuration settings for the plurality of machine monitoring devices. 2. The machine monitoring system of claim 1 wherein the plurality of machine monitoring devices include one or more devices selected from the group consisting of online machine monitoring devices, wired transmitters, wireless vibration transmitters, and portable vibration analyzers. 3. The machine monitoring system of claim 1 wherein the hierarchal format of the configuration settings includes a plurality of hierarchal levels comprising: one or more machine identification levels; one or more a measurement location levels; one or more collection definition levels; one or more acquisition definition levels; and one or more measurement definition levels. 4. The machine monitoring system of claim 3 wherein the hierarchal levels in the configuration settings are ordered as listed in claim 3 . 5. The machine monitoring system of claim 1 wherein the configuration settings include one or more collection definitions that include one or more collection definition identification values, one or more collection definition states, and one or more collection definition descriptors. 6. The machine monitoring system of claim 1 wherein the configuration settings include one or more acquisition definitions that include one or more acquisition definition identification values and one or more acquisition type descriptors. 7. The machine monitoring system of claim 1 wherein the configuration settings include one or more measurement definitions that include one or more measurement type identification values and one or more measurement type descriptors. 8. The machine monitoring system of claim 1 further comprising a machine historian database for storing the machine data received from the plurality of machine monitoring devices. 9. A method for monitoring operational characteristics of one or more machine assets using a machine monitoring system comprising multiple machine monitoring devices disposed in one or more measurement locations associated with the one or more machine assets and a computer for sending device-independent configuration settings to and receiving machine data from the machine monitoring devices, wherein the machine monitoring devices comprise multiple different types of machine monitoring devices, each type having a data acquisition process that is different from data acquisition processes of other types of machine monitoring devices, wherein the data acquisition processes configure the machine monitoring devices to collect specific types of machine data according to specified measurement parameters, the method comprising: (a) inputting information at the computer to identify the one or more machine assets and the one or more measurement locations on the one or more machine assets; (b) inputting information at the computer to define machine data to be collected at the one or more measurement locations; (c) generating the device-independent configuration settings at the computer that are generically consumable by each of the multiple different types of machine monitoring devices, wherein the device-independent configuration settings are structured according to a hierarchal format that can be interpreted by all of the different types of machine monitoring devices to set up their data acquisition processes; (d) the computer sending the device-independent configuration settings to the machine monitoring devices; (e) the machine monitoring devices interpreting the device-independent configuration settings structured according to the hierarchal format to set up the machine monitoring devices to collect specified types of machine data according to specified measurement parameters; (f) the machine monitoring devices collecting the machine data; (g) the machine monitoring devices sending the collected machine data to the computer; and (h) the computer receiving and storing the collected machine data. 10. The method of claim 9 wherein the machine monitoring devices include one or more devices selected from the group consisting of online machine monitoring devices, wired transmitters, wireless vibration transmitters, and portable vibration analyzers. 11. The method of claim 9 wherein step (c) comprises generating the device-independent configuration settings according to the hierarchal format that includes multiple hierarchal levels comprising: one or more machine identification levels; one or more a measurement location levels; one or more collection definition levels; one or more acquisition definition levels; and one or more measurement definition levels. 12. The method of claim 11 wherein the hierarchal levels in the device-independent configuration settings are ordered as listed in claim 11 . 13. The method of claim 9 wherein step (c) includes generating the device-independent configuration settings to include one or more collection definitions that include one or more collection definition identification values, one or more collection definition states, and one or more collection definition descriptors. 14. The method of claim 9 wherein step (c) includes generating the device-independent configuration settings to include one or more acquisition definitions that include one or more acquisition definition identification values and one or more acquisition type descriptors. 15. The method of claim 9 wherein step (c) includes generating the device-independent configuration settings to include one or more measurement definitions that include one or more measurement type identification values and one or more measurement type descriptors.
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