Automatic analyzer for identifying a cause of abnormalities of measurement results

Patent metadata

Field	Value
Publication number	US-10352864-B2
Application number	US-201113808743-A
Country	US
Kind code	B2
Filing date	Jul 4, 2011
Priority date	Jul 14, 2010
Publication date	Jul 16, 2019
Grant date	Jul 16, 2019

Abstract

An automatic analyzer includes sample vessels containing samples to be measured and; reaction vessels in which to mix a sample and a reagent. A sample dispenser 5 dispenses a sample from any of the sample vessels to any of the reaction vessels. A reagent dispenser dispenses a reagent from a reagent vessel to a reaction vessel, and a stirrer stirs the sample-reagent mix contained in the reaction vessel. A photometric measurement unit is provided for obtaining multiple measurement data points during the progress of reaction of a mixed solution. At least one approximation formula is performed and an approximation curve from the measurement data points is generated. A shape descriptor is calculated from the approximation curve and abnormalities based on the shape descriptor are determined. This not only allows abnormalities to be detected accurately from each measurement result, but also allows the causes of the abnormalities to be identified.

First claim

The invention claimed is:

1. An automatic analyzer comprising:
a sample vessel containing a sample to be measured;
a reagent vessel containing a reagent to be reacted with the sample;
a reaction vessel;
a sample dispenser to dispense the sample from the sample vessel into the reaction vessel;
a reagent dispenser to dispense the reagent from the reagent vessel into the reaction vessel;
a stirrer to stir the sample and the reagent contained in the reaction vessel to obtain a mixed solution;
a photometer which obtains a plurality of measurement data points during progress of a reaction of the mixed solution;
a storage device storing one or more approximation formulas to generate an approximation curve from the measurement data points; and
a processor connected to a memory storing instructions that, when executed by the processor, cause the processor to be configured to select one of the one or more approximation formulas, generate an approximation curve from the measurement data points and the selected approximation formula, calculate one or more shape descriptors from the generated approximation curve, and perform an abnormality cause judgment to identify a cause of abnormalities of measurement results based on the one or more shape descriptors;
wherein the calculated one or more shape descriptors include at least one of shape descriptor T and shape descriptor D, and
wherein, a tangent to the generated approximation curve right after a start of the reaction is a first line and a line approaching the generated approximation curve is a second line, the shape descriptor T is a time at which the first line and the second line intersect, and the shape descriptor D is a difference between the first line and the second line at the start of the reaction.

2. The automatic analyzer of claim 1 ,
wherein the calculated one or more shape descriptors include the shape descriptor T, and
wherein the abnormality cause judgment judges a cause of abnormalities of measurement results based on the shape descriptor T.

3. The automatic analyzer of claim 2 ,
wherein the abnormality cause judgment judges that the abnormalities result from substances other than a target substance in the sample based on the shape descriptor T.

4. The automatic analyzer of claim 1 ,
wherein the calculated one or more shape descriptors include the shape descriptor D, and
wherein the abnormality cause judgment judges a cause of abnormalities of measurement results based on the shape descriptor D.

5. The automatic analyzer of claim 4 ,
wherein the abnormality cause judgment judges that the abnormalities are caused by the mixed solution based on the shape descriptor D.

Assignees

• Kamihara Kumiko
• Mitsuyama Satoshi
• Mimura Tomonori
• Manri Chihiro
• Hitachi High Tech Corp

Inventors

• Kamihara Kumiko
• Mitsuyama Satoshi
• Mimura Tomonori
• Manri Chihiro

Classifications

• Y10T436/11

  Automated chemical analysis · CPC title

• G01N2035/00702

  Curve-fitting; Parameter matching; Calibration constants · CPC title

• G01N35/00603

  Reinspection of samples · CPC title

• G01N21/75 Primary

  Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated (systems in which material is burnt in a flame or plasma G01N21/72, G01N21/73) · CPC title

• G16C20/10

  Analysis or design of chemical reactions, syntheses or processes · CPC title