Systems and methods for reducing temperature sensor reading variation due to device mismatch

Patent metadata

Field	Value
Publication number	US-10352775-B2
Application number	US-201514866371-A
Country	US
Kind code	B2
Filing date	Sep 25, 2015
Priority date	Sep 25, 2015
Publication date	Jul 16, 2019
Grant date	Jul 16, 2019

Abstract

A temperature sensor is disclosed. The temperature sensor includes an analog core having at least first and second circuit nodes and configured to provide a temperature dependent output, a multiplexer coupled to the first and second circuit nodes and configured for at least first and second states in each of which the first circuit node couples to a different circuit element and in each of which the second circuit node couples to a different circuit element, and a controller coupled to the analog core and configured to provide a temperature measurement that is an average of at least first and second readings of the temperature dependent output of the analog core, the first reading taken while the multiplexer is in the first state, and the second reading taken while the multiplexer is in the second state.

First claim

The invention claimed is:

1. A temperature sensor, comprising:
an analog core configured to provide a temperature dependent output, wherein the analog core includes:
a first current block coupled to the temperature dependent output and configured to provide a first current that is directly proportional to temperature, wherein the first current block includes a first circuit node, a second circuit node, and an amplifier configured as a feedback element; and
a second current block coupled to the temperature dependent output and configured to provide a second current that is inversely proportional to temperature;

a multiplexer coupled to the first circuit node, the second circuit node, and to the amplifier, wherein, while in a first state, the multiplexer is configured to couple the first circuit node to an inverting input of the amplifier and to couple the second circuit node to a non-inverting input of the amplifier, wherein, while in a second state, the multiplexer is configured to couple the first circuit node to the non-inverting input of the amplifier and to couple the second circuit node to the inverting input of the amplifier; and
a controller coupled to the analog core and configured to provide a temperature measurement that is an average of a first reading of the temperature dependent output of the analog core taken while the multiplexer is in the first state and a second reading of the temperature dependent output of the analog core taken while the multiplexer is in the second state, wherein the first reading and the second reading of the temperature dependent output of the analog core are based on a comparison between the first current and a sum of the first current and the second current.

2. A temperature sensor, comprising:
an analog core configured to provide a temperature dependent output, wherein the analog core includes:
a first current block coupled to the temperature dependent output and configured to provide a first current that is directly proportional to temperature; and
a second current block coupled to the temperature dependent output and configured to provide a second current that is inversely proportional to temperature, wherein the second current block includes a first circuit node, a second circuit node, and

an amplifier configured as a feedback element;
a multiplexer coupled to the first circuit node, the second circuit node, and to the amplifier, wherein, while in a first state, the multiplexer is configured to couple
the first circuit node to an inverting input of the amplifier and to couple
the second circuit node to a non-inverting input of the amplifier, wherein, while in a second state, the multiplexer is configured to couple the first circuit node to the non- inverting input of the amplifier and to couple the second circuit node to the inverting input of the amplifier; and
a controller coupled to the analog core and configured to provide a temperature measurement that is an average of a first reading of the temperature dependent output of the analog core taken while the multiplexer is in the first state and a second reading of the temperature dependent output of the analog core taken while the multiplexer is in the second state, wherein the first reading and the second reading of the temperature dependent output of the analog core are based on a comparison between the first current and a sum of the first current and the second current.

3. A temperature sensor, comprising:
an analog core having a first circuit node and a second circuit node, wherein the analog core is configured to provide a temperature dependent output wherein the analog core includes:
a first current block coupled to the temperature dependent output and configured to provide a first current that is directly proportional to temperature; and
a second current block coupled to the temperature dependent output and configured to provide a second current that is inversely proportional to temperature;

a multiplexer coupled to the first circuit node and to the second circuit node, wherein, while in a first state, the multiplexer is configured to couple the first circuit node to first circuit element and to couple the second circuit node to a second circuit element, wherein, while in a second state, the multiplexer is configured to couple the first circuit node to the second circuit element and to couple the second circuit node to the first circuit element;
a first switch coupled between a voltage sense node of the analog core and the first current block;
a second switch coupled between the voltage sense node and an output of the second current block; and
an analog-to-digital converter coupled to the voltage sense node and to the first switch and the second switch, wherein, the analog-to-digital to converter is configured to sense a voltage of the voltage sense node, wherein,
in response to the voltage of the voltage sense node being less than a reference voltage, the analog-to-digital converter is configured to cause the first switch to open and the second switch to close such that the voltage of the voltage sense node is pulled-up by the first current, wherein, in response to the voltage of the voltage sense node being greater
than the reference voltage, the analog-to-digital converter is configured to cause the first switch to close and the second switch to open such that the voltage of the voltage sense node is pulled-down by the second current; and
a controller coupled to the analog core and configured to provide a temperature measurement that is an average of a first reading of the temperature dependent output of the analog core taken while the multiplexer is in the first state and a second reading of the temperature dependent output of the analog core taken while the multiplexer is in the second state, wherein the first reading and the second reading of the temperature dependent output of the analog core are based on a comparison between the first current and a sum of the first current and the second current, wherein
the first reading and the second reading of the temperature dependent output of the analog core include a digital code corresponding to a number of times during a predetermined interval in which the first switch is open.

4. The temperature sensor of claim 3 , wherein the first switch is coupled to the multiplexer, wherein the first current block includes the first circuit node and the second circuit node, and further includes:
an amplifier configured as a feedback element; wherein
the first circuit node is coupled to an inverting input of the amplifier and
the second circuit node is coupled to a non-inverting input of the amplifier; and
a group of four transistors coupled to the multiplexer, wherein a first transistor of the group of four transistors is the first circuit element and a second transistor of the group of four transistors is the second circuit element, wherein, while in the first state, the multiplexer is further configured to couple the first switch to a third transistor of the group of four transistors, and while in the second state, the multiplexer is further configured to couple the first switch to a fourth transistor of the group of four transistors.

5. The temperature sensor of claim 3 , wherein the second current block includes the first circuit node and the second circuit node, and further includes:
an amplifier configured as a feedback element, wherein the first circuit node is coupled to a non-inverting input of the amplifier;
a first current sinking transistor configured to provide the second current to the second switch through a second current sinking transistor arranged as a current mirror, wherein the second circuit node is coupled to the first current sinking transistor; and
a group of two transistors, wherein the first circuit element is a first t

Assignees

• Micron Technology Inc

Inventors

• Pan Dong

Classifications

• G01K3/06

  in respect of space · CPC title

• G01K7/01 Primary

  using semiconducting elements having PN junctions (G01K7/02, G01K7/16, G01K7/30 take precedence) · CPC title