Atomic layer deposition of high performance anti reflection coatings on delta-doped CCDs
US-9123622-B2 · Sep 1, 2015 · US
US10347783B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-10347783-B2 |
| Application number | US-201414914751-A |
| Country | US |
| Kind code | B2 |
| Filing date | Aug 27, 2014 |
| Priority date | Aug 27, 2013 |
| Publication date | Jul 9, 2019 |
| Grant date | Jul 9, 2019 |
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Various examples are provided for hot carrier spectral photodetectors that can be tuned. In one example, among others, a hot-carrier photodetector includes a graded barrier; an absorber disposed on the graded barrier; and a second barrier disposed on the absorber. For example, the absorber can include p-type doped GaAs. The graded barrier is disposed between the absorber and an injector, which can include p-type doped GaAs. In some implementations, the hot-carrier detector can include multiple barriers and absorbers. The hot-carrier photodetector can include an optical source (e.g., a LED) to trigger the VLWIR response in the photodetector.
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Therefore, at least the following is claimed: 1. A hot-carrier photodetector, comprising: a graded barrier having a composition that linearly varies over a thickness of the graded barrier from top to bottom; an absorber disposed on the graded barrier; and a second barrier disposed on the absorber opposite the graded barrier, where a barrier offset (δE v ) is provided between a higher barrier height of the graded barrier and a lower barrier height of the second barrier on opposite sides of the absorber, and hot holes injected into the absorber over the higher barrier height of the graded barrier excite cold holes in the absorber to higher energy states thereby extending a photoresponse of the hot-carrier photodetector. 2. The hot-carrier photodetector of claim 1 , wherein the absorber comprises p-type doped GaAs. 3. The hot-carrier photodetector of claim 1 , wherein the graded barrier is disposed between the absorber and an injector. 4. The hot-carrier photodetector of claim 3 , wherein the injector comprises p-type doped GaAs. 5. The hot-carrier photodetector of claim 1 , wherein the second barrier is disposed between the absorber and a collector. 6. The hot-carrier photodetector of claim 5 , wherein the collector comprises p-type doped GaAs. 7. The hot-carrier photodetector of claim 1 , wherein the second barrier is a constant barrier. 8. The hot-carrier photodetector of claim 7 , wherein the constant barrier comprises Al x Ga 1−x As, where 0 <x <1. 9. The hot-carrier photodetector of claim 1 , wherein the second barrier is a graded barrier. 10. The hot-carrier photodetector of claim 9 , wherein the graded barrier comprises Al x Ga 1−x As, where x varies from x2 to x1, where 0<x1<x2<1. 11. The hot-carrier photodetector of claim 1 , wherein the graded barrier comprises Al x Ga 1−x As, where x varies from x2 to x1, where 0<x1<x2<1. 12. The hot-carrier photodetector of claim 1 , wherein the hot-carrier photodetector is reverse biased. 13. The hot-carrier photodetector of claim 1 , further comprising: a second absorber disposed on the second barrier; and a third barrier disposed on the second absorber. 14. The hot-carrier photodetector of claim 13 , wherein the third barrier is a graded barrier. 15. The hot-carrier photodetector of claim 13 , wherein the third barrier is disposed between the second absorber and a collector. 16. The hot-carrier photodetector of claim 1 , wherein the second barrier is disposed between the absorber and a third absorber. 17. The hot-carrier photodetector of claim 1 , wherein extension of the photoresponse is based upon a reverse bias applied to the hot-carrier photodetector. 18. The hot-carrier photodetector of claim 17 , wherein increasing the reverse bias increases the hot holes injected into the absorber. 19. The hot-carrier photodetector of claim 1 , wherein the cold holes in the absorber that are excited to the higher energy states are responsive to very long-wavelength infrared (VLWIR) radiation. 20. The hot-carrier photodetector of claim 1 , wherein the photoresponse of the hot-carrier photodetector is extended beyond a wavelength limit (λ c ) of the hot-carrier photodetector.
Electricity · mapped topic
Electricity · mapped topic
Electricity · mapped topic
Electricity · mapped topic
having three or more elements, e.g. GaAlAs, InGaAs or InGaAsP · CPC title
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